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    • 9. 发明授权
    • Vertical semiconductor device
    • 垂直半导体器件
    • US08653556B2
    • 2014-02-18
    • US12437375
    • 2009-05-07
    • Franz Josef NiedernostheideHans-Joachim Schulze
    • Franz Josef NiedernostheideHans-Joachim Schulze
    • H01L29/739
    • H01L29/7802H01L29/0878H01L29/7395H01L29/861
    • A vertical semiconductor device includes a semiconductor body, and first and second contacts on opposite sides of the semiconductor body. A plurality of regions are formed in the semiconductor body including, in a direction from the first contact to the second contact, a first region of a first conductivity type, a second region of a second conductivity type; and a third region of the first conductivity type. The third region is electrically connected to the second contact. A semiconductor zone of the second conductivity type and increased doping density is arranged in the second region. The semiconductor zone separates a first part of the second region from a second part of the second region. The semiconductor zone has a maximum doping density exceeding about 1016 cm−3 and a thickness along the direction from the first contact to the second contact of less than about 3 μm.
    • 垂直半导体器件包括半导体本体,以及在半导体本体的相对侧上的第一和第二触点。 多个区域形成在半导体本体中,包括从第一接触到第二接触的方向,具有第一导电类型的第一区域和第二导电类型的第二区域; 和第一导电类型的第三区域。 第三区域电连接到第二触点。 第二导电类型的半导体区域和掺杂浓度的增加被布置在第二区域中。 半导体区域将第二区域的第一部分与第二区域的第二部分分开。 半导体区具有超过约1016cm-3的最大掺杂密度和沿着从第一接触到第二接触的方向的厚度小于约3μm。