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    • 1. 发明公开
    • Mass spectrometer
    • 质谱仪
    • EP1566828A3
    • 2006-07-26
    • EP05250864.5
    • 2005-02-15
    • Hoffman, AndrewClare, Mathew
    • Hoffman, AndrewClare, Mathew
    • H01J49/02
    • H01J49/022H05K1/14H05K2201/047
    • A time of flight mass spectrometer has components mounted within an open ended box 10 formed from printed circuit boards (PCBs). The mass spectrometer comprises an ion source 20, an ion focussing means 30, an ion accelerating means 40, a detection chamber 50, an ion mirror 60 and an ion detector 70. Also there is provided a space 82 for a vacuum pump 80, the vacuum pump pumps air out of the PCB box 10 via aperture 84. The mass spectrometer further comprises an aluminium plate (not shown) is provided on which the PCB box 10 is mounted in use. The aluminium plate has a groove in which an O-ring is retained, the O-ring adapted to provide a seal between the plate and rim 13 of the PCB box 10. The plate is further provided with an air outlet for the vacuum pump 80 mounted in the PCB box 10. The vacuum pump 80 thus acts to draw air from the interior of the PCB box 10 through aperture 84 in to the pump and then expels said air through the air outlet in the plate to the exterior of the PCB box 10. As the PCBs themselves are impervious to air and the solder or glue seals between them are airtight, this allows a vacuum to be created within the PCB box 10 once a seal is formed between the plate and the rim 13.
    • 飞行时间质谱仪具有安装在由印刷电路板(PCB)形成的端部开放的盒子10内的部件。 质谱仪包括离子源20,离子聚焦装置30,离子加速装置40,检测室50,离子镜60和离子检测器70.还提供了用于真空泵80的空间82,该 真空泵通过孔84泵出PCB盒10中的空气。质谱仪还包括提供PCB盒10在使用中安装在其上的铝板(未示出)。 铝板具有凹槽,其中保持有O形环,该O形环适于在PCB盒10的板和边缘13之间提供密封。该板还设置有用于真空泵80的空气出口 安装在PCB盒10中。因此,真空泵80用于将空气从PCB盒10的内部通过孔84抽入泵中,然后通过板中的空气出口将所述空气排出到PCB盒的外部 由于PCB本身不透气,并且它们之间的焊料或胶密封是气密的,所以一旦在板和边缘13之间形成密封,这允许在PCB盒10内产生真空。
    • 4. 发明公开
    • Data acquisition and processing in mass spectrometers
    • Datatorfassung und -verarbeitung在Massenspektrometern
    • EP1585167A2
    • 2005-10-12
    • EP05250865.2
    • 2005-02-15
    • Hoffman, Andrew
    • Hoffman, Andrew
    • H01J49/00G06K9/00
    • H01J49/0036G06K9/00523
    • The output of a time of flight mass spectrometer plotted over time is a set of signals comprising a series of peaks, the peaks corresponding to the arrival and subsequent detection of ions of different charge to mass ratios. This process is repeated many times to provide a plurality of sets of signals. In the method of the present invention, each set of output signals is processed to detect peaks corresponding to the arrival of an ion at the detector. Once detected, that part of the signal comprising the peak is processed in order to determine the centre of the peak and the total area of the peak to generate an intermediate signal comprising data representing the position and area of each peak detected in a set of signals. The intermediate signals generated by processing each set of output signals are combined to produce a histogram. Peaks in the histogram are then detected and these peaks are processed to determine their centres and areas and thus determining the relative abundances of detected ions of different charge to mass ratios.
    • 随着时间的推移,飞行时间质谱仪的输出是包括一系列峰的信号集合,峰值对应于不同电荷对质量比的离子的到达和随后的检测。 该过程重复多次以提供多组信号。 在本发明的方法中,处理每组输出信号以检测对应于离子到达检测器的峰值。 一旦被检测到,包括峰值的信号的该部分被处理,以便确定峰值的中心和峰值的总面积以产生中间信号,该中间信号包括表示在一组信号中检测到的每个峰值的位置和面积的数据 。 通过处理每组输出信号而产生的中间信号被组合以产生直方图。 然后检测直方图中的峰,并处理这些峰以确定其中心和面积,从而确定不同电荷与质量比的检测离子的相对丰度。
    • 6. 发明公开
    • Mass spectrometer
    • Massenspektrometer
    • EP1566828A2
    • 2005-08-24
    • EP05250864.5
    • 2005-02-15
    • Hoffman, AndrewClare, Mathew
    • Hoffman, AndrewClare, Mathew
    • H01J49/02
    • H01J49/022H05K1/14H05K2201/047
    • A time of flight mass spectrometer has components mounted within an open ended box 10 formed from printed circuit boards (PCBs). The mass spectrometer comprises an ion source 20, an ion focussing means 30, an ion accelerating means 40, a detection chamber 50, an ion mirror 60 and an ion detector 70. Also there is provided a space 82 for a vacuum pump 80, the vacuum pump pumps air out of the PCB box 10 via aperture 84. The mass spectrometer further comprises an aluminium plate (not shown) is provided on which the PCB box 10 is mounted in use. The aluminium plate has a groove in which an O-ring is retained, the O-ring adapted to provide a seal between the plate and rim 13 of the PCB box 10. The plate is further provided with an air outlet for the vacuum pump 80 mounted in the PCB box 10. The vacuum pump 80 thus acts to draw air from the interior of the PCB box 10 through aperture 84 in to the pump and then expels said air through the air outlet in the plate to the exterior of the PCB box 10. As the PCBs themselves are impervious to air and the solder or glue seals between them are airtight, this allows a vacuum to be created within the PCB box 10 once a seal is formed between the plate and the rim 13.
    • 飞行时间质谱仪具有安装在由印刷电路板(PCB)形成的开放式箱体10内的部件。 质谱仪包括离子源20,离子聚焦装置30,离子加速装置40,检测室50,离子反射镜60和离子检测器70.还有一个用于真空泵80的空间82, 真空泵通过孔84从PCB盒10中排出空气。质谱仪还包括在使用中安装有PCB盒10的铝板(未示出)。 铝板具有保持O形环的凹槽,O形环适于在PCB盒10的板和边缘13之间提供密封。该板还设置有用于真空泵80的空气出口 安装在PCB盒10中。因此,真空泵80用于将空气从PCB盒10的内部通过孔84吸入泵中,然后将空气通过板中的空气出口排出到PCB盒的外部 由于PCB本身不受空气影响,并且它们之间的焊料或胶水密封件是气密的,所以一旦在板和边缘13之间形成密封,就允许在PCB盒10内产生真空。
    • 8. 发明专利
    • A time of flight secondary ion mass spectrometer
    • GB2414594A
    • 2005-11-30
    • GB0411961
    • 2004-05-28
    • HOFFMAN ANDREWIONOPTIKA LTD
    • HOFFMAN ANDREW
    • G01N23/225H01J37/252H01J49/14
    • A time of flight secondary ion mass spectrometer (TOF-SIMS) 200 comprises an ion gun 210 which fires a continuous beam of primary ions 211 at a sample 220 to generate secondary ions 221. The secondary ions 221 are then collected by a collection electrode arrangement (collection optics) 230. The secondary ions 211 pass from the collection optics 230 into a cooling electrode arrangement 240. The secondary ions 221 then enter an acceleration means 260 adapted to periodically apply an impulse to ions 221 in a direction orthogonal to the ions direction of travel. The ions 221 are thus directed towards a detector 280 via a reflectron 270. By calculating the time interval between an impulse generated by the acceleration means 260 and the arrival of ions at the detector, the charge to mass ratio and relative abundance of various ions can be determined, in turn enabling the composition of the sample 220 to be determined. Application to purity testing of semiconductor materials and devices is disclosed. Other applications include the analysis of polymers, metals, chemical samples or biological materials, and pharmaceutical absorption testing.