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1. 发明申请

WO2006012875A3 METHOD FOR EVALUATING A TEST PROGRAM QUALITY 审中-公开
标题翻译：测试计划的评估过程质量
公开(公告)号：WO2006012875A3
公开(公告)日：2006-05-26
申请号：PCT/DE2005001349
申请日：2005-07-28
申请人： CERTESS S A , GROSSE JOERG , HAMPTON MARK
发明人： GROSSE JOERG , HAMPTON MARK
IPC分类号： G06F17/50
CPC分类号： G06F17/5022
摘要： The invention relates to a method for evaluating an integrated circuit test program simulated with the aid of a computer and consisting (a) in providing a first file describing an integrated circuit, (b) in simulating a mutant integrated circuit obtainable by introducing mutations into the integrated circuit described at the first stage, (c) in supplying input values to the mutant integrated circuit and detecting output values produced by the mutant integrated circuit for said input values, (d) in comparing the output values produced by the mutant integrated circuit with expected values produced by the test program, wherein said expected values are generated in a reference system and (e) in evaluating the test program quality by means of comparison results.
摘要翻译：本发明涉及一种方法，用于评估测试程序的质量，含有（a）提供其描述集成电路的第一文件的计算机集成电路模拟; 这是通过将突变引入在集成突变集成电路的电路中的第一文件中的所述获得（B）仿真; （C）提供的输入值用于由突变集成电路这些输入值所产生的输出值的突变的集成电路和记录; （D）比较由与由测试程序，其中，所述预期值已经在参考系统中生成提供预期值的突变的集成电路的输出值的产生; 和（e），以评估比较结果的基础上，测试程序的质量。

2. 发明专利

DE102004037402A1 未知
公开(公告)号：DE102004037402A1
公开(公告)日：2006-03-23
申请号：DE102004037402
申请日：2004-07-30
申请人： CERTESS S A
发明人： GROSE JOERG , HAMPTON MARK
IPC分类号： G06F11/28 , G06F17/50
摘要： The disclosure relates to a method for rating the quality of a test program for integrated circuits simulated by means of a computer. The method includes provision of a first file which describes an integrated circuit; simulation of a mutated integrated circuit which is obtained by incorporating mutations into the integrated circuit described in the first file; supplying input values to the mutated integrated circuit and recording of the output values produced for these input values by the mutated integrated circuit; comparison of the output values produced by the mutated integrated circuit with expected values which are provided by the test program, where the expected values have been generated in a reference system; and rating of the quality of the test program on the basis of the comparison results.

3. 发明专利

DE502005006290D1 未知
公开(公告)号：DE502005006290D1
公开(公告)日：2009-01-29
申请号：DE502005006290
申请日：2005-07-28
申请人： CERTESS S A
发明人： GROSSE JOERG , HAMPTON MARK
IPC分类号： G06F17/50
摘要： The disclosure relates to a method for rating the quality of a test program for integrated circuits simulated by means of a computer. The method includes provision of a first file which describes an integrated circuit; simulation of a mutated integrated circuit which is obtained by incorporating mutations into the integrated circuit described in the first file; supplying input values to the mutated integrated circuit and recording of the output values produced for these input values by the mutated integrated circuit; comparison of the output values produced by the mutated integrated circuit with expected values which are provided by the test program, where the expected values have been generated in a reference system; and rating of the quality of the test program on the basis of the comparison results.

4. 发明专利

DE102004037403A1 未知
公开(公告)号：DE102004037403A1
公开(公告)日：2006-03-23
申请号：DE102004037403
申请日：2004-07-30
申请人： CERTESS S A
发明人： GROSE JOERG , HAMPTON MARK
IPC分类号： G06F11/28
摘要： The invention relates to a method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising (a) provision of a mutated integrated circuit which is obtained by incorporating one or more functional mutations into the (unmutated) integrated circuit; (b) influencing of the mutated integrated circuit's input data and output data, with the output data from the mutated integrated circuit being recorded; (c) comparison of the output data obtained in this manner from the mutated integrated circuit with the output data which the computer program expects when the unmutated integrated circuit is influenced; and (d) rating of the quality of the computer program on the basis of the comparison results.

5. 发明专利

DE102004037403B4 未知
公开(公告)号：DE102004037403B4
公开(公告)日：2008-11-20
申请号：DE102004037403
申请日：2004-07-30
申请人： CERTESS S A
发明人： GROSE JOERG , HAMPTON MARK
IPC分类号： G06F11/28
摘要： The invention relates to a method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising (a) provision of a mutated integrated circuit which is obtained by incorporating one or more functional mutations into the (unmutated) integrated circuit; (b) influencing of the mutated integrated circuit's input data and output data, with the output data from the mutated integrated circuit being recorded; (c) comparison of the output data obtained in this manner from the mutated integrated circuit with the output data which the computer program expects when the unmutated integrated circuit is influenced; and (d) rating of the quality of the computer program on the basis of the comparison results.

6. 发明专利

DE102004037402B4 Verfahren zur Bewertung der Güte eines Testprogrammes 未知
公开(公告)号：DE102004037402B4
公开(公告)日：2011-02-03
申请号：DE102004037402
申请日：2004-07-30
申请人： CERTESS S A
发明人： GROSE JOERG , HAMPTON MARK
IPC分类号： G06F11/28 , G06F17/50

7. 发明专利

AT433586T 未知
公开(公告)号：AT433586T
公开(公告)日：2009-06-15
申请号：AT05771365
申请日：2005-07-28
申请人： CERTESS S A
发明人： GROSSE JOERG , HAMPTON MARK
IPC分类号： G06F17/50
摘要： The invention relates to a method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising (a) provision of a mutated integrated circuit which is obtained by incorporating one or more functional mutations into the (unmutated) integrated circuit; (b) influencing of the mutated integrated circuit's input data and output data, with the output data from the mutated integrated circuit being recorded; (c) comparison of the output data obtained in this manner from the mutated integrated circuit with the output data which the computer program expects when the unmutated integrated circuit is influenced; and (d) rating of the quality of the computer program on the basis of the comparison results.

8. 发明专利

AT418108T 未知
公开(公告)号：AT418108T
公开(公告)日：2009-01-15
申请号：AT05771429
申请日：2005-07-28
申请人： CERTESS S A
发明人： GROSSE JOERG , HAMPTON MARK
IPC分类号： G06F17/50
摘要： The disclosure relates to a method for rating the quality of a test program for integrated circuits simulated by means of a computer. The method includes provision of a first file which describes an integrated circuit; simulation of a mutated integrated circuit which is obtained by incorporating mutations into the integrated circuit described in the first file; supplying input values to the mutated integrated circuit and recording of the output values produced for these input values by the mutated integrated circuit; comparison of the output values produced by the mutated integrated circuit with expected values which are provided by the test program, where the expected values have been generated in a reference system; and rating of the quality of the test program on the basis of the comparison results.

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