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    • 1. 发明专利
    • Apparatus for automatically feeding, washing, dehydrating, and discharging waste plastic
    • 用于自动进料,洗涤,去除和排放废物塑料的设备
    • JP2005081340A
    • 2005-03-31
    • JP2003354327
    • 2003-09-04
    • Akio Hara秋男 原
    • HARA AKIO
    • B08B3/04B01J4/00B29B17/00
    • Y02W30/62
    • PROBLEM TO BE SOLVED: To provide a system for easily recycling increasing recyclable waste like waste plastic by effectively utilizing it or reducing the amount of incineration or land reclaiming at a low cost. SOLUTION: One reason of poor recycling ratio of the waste plastic is that much of the waste plastic is incinerated or used for land reclaiming since food residues or contaminants adhered to the plastic prohibit recycling. By completely washing the contaminants adhered to the waste plastic, the recycling ratio can be increased. The waste plastic is subjected to measurement during movement on a belt conveyor equipped with a volume measuring instrument and charged into a washer body. The charged waste plastic is washed by rotation of a washing tub. The waste plastic after washing is moved to a dehydrating system together with washing water by forward tilting of the washing tub, and dehydrated. The dehydrated waste plastic is recovered into a container box, and the washing water entering a water collection cylinder at an outer part of the dehydrating system is filtered by a filtering device and returned to the washing tub. This repeated operation yields little amount of discharge of washing water and causes no environmental pollution. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种系统,通过有效地利用或减少焚化或土地回收的量来容易地回收可再循环的废弃物如废塑料。

      解决方案:废塑料回收率差的原因之一是废弃塑料大部分被焚烧或用于土地回收,因为附着在塑料上的食品残渣或污染物禁止回收利用。 通过完全洗涤附着在废塑料上的污染物,可以提高回收率。 废塑料在装有容积测量仪器的带式输送机上运动期间进行测量并装入垫圈体中。 收集的废塑料通过洗涤桶的旋转来洗涤。 洗涤后的废塑料与洗涤水一起通过洗涤桶的前倾而移动到脱水系统中,并脱水。 将脱水废塑料回收到容器箱中,并且通过过滤装置过滤进入脱水系统外部的收集桶的洗涤水并返回到洗涤桶中。 这种反复操作产生的洗涤水排放量很少,不会造成环境污染。 版权所有(C)2005,JPO&NCIPI

    • 2. 发明申请
    • Integrated circuit device having send/receive macro for serial transfer bus
    • 具有用于串行传输总线的发送/接收宏的集成电路装置
    • US20050091427A1
    • 2005-04-28
    • US10814282
    • 2004-04-01
    • Toshikazu YoshidaMasaaki TaniKenji FuruyaAkio HaraTomoki Kurata
    • Toshikazu YoshidaMasaaki TaniKenji FuruyaAkio HaraTomoki Kurata
    • G06F13/38G06F3/00G06F9/46G06F9/48G06F13/42
    • G06F13/4286
    • An integrated circuit device having a send/receive macro for serially transferring addresses and data to or from an external device via a serial transfer bus, the integrated circuit device includes: a CPU for performing predetermined processing. The send/receive macro includes a send/receive buffer accessed by the CPU, for storing a plurality of units of data to be transmitted or received over the serial transfer bus; an acknowledge detection unit for detecting a data acknowledge signal transmitted from a receiving device in response to transmission of predetermined units of data; and a data send unit for transmitting data stored in the send/receive buffer, in response to detection of the data acknowledge signal by the acknowledge detection unit, without generating any interrupt to the CPU. And the acknowledge signal detection unit generates a data acknowledge signal non-detection interrupt to the CPU if the acknowledge detection unit does not detect a data acknowledge signal transmitted from the receiving device in response to transmission of the predetermined units of data.
    • 一种集成电路装置,其具有用于经由串行传输总线将地址和数据串行地传送到外部设备的发送/接收宏,所述集成电路装置包括:执行预定处理的CPU。 发送/接收宏包括由CPU访问的发送/接收缓冲器,用于存储要通过串行传输总线发送或接收的多个数据单元; 确认检测单元,用于响应于预定数据单元的传输来检测从接收设备发送的数据确认信号; 以及用于响应于确认检测单元检测到数据确认信号而发送存储在发送/接收缓冲器中的数据的数据发送单元,而不产生对CPU的任何中断。 如果应答检测单元响应于预定数据单元的传输,未检测到从接收设备发送的数据确认信号,则确认信号检测单元向CPU产生数据确认信号不检测中断。
    • 4. 发明授权
    • Sintered compact for use in a tool and the method for producing the same
    • 用于工具的烧结体及其制造方法
    • US4389465A
    • 1983-06-21
    • US349663
    • 1982-02-17
    • Tetsuo NakaiYuichiro KonoShuji YazuAkio Hara
    • Tetsuo NakaiYuichiro KonoShuji YazuAkio Hara
    • C04B35/10B23B27/14C04B35/117C04B35/583C04B35/5831C04B35/58
    • C04B35/5831B23B27/148C04B35/117Y10T428/31678
    • The invention relates to a sintered compact for use in an ultrahard tool having high resistance to heat and wear, outstanding thermal conductivity and thermal shock resistance property at elevated temperature, and suitable for high-speed cutting, and to a method for producing the same. A powder mixture comprising 20-80 volume % high pressure form boron nitride powder, the residual part consisting of Al.sub.2 O.sub.3 powder or a compound ceramic powder principally comprising Al.sub.2 O.sub.3 powder and also containing carbides, nitrides of IVb, Vb, VIb metals of the periodic table, mutual solid solution thereof or admixture thereof, is sintered as it stands or after pressing under a high pressure and a high temperature so that Al.sub.2 O.sub.3 of the compound ceramic constitutes a continuous phase in the structure of the sintered compact, and the half width of (116) in the X-ray diffraction of CuK.alpha. ray of Al.sub.2 O.sub.3 crystals in the structure constituting the continuous phase is within the range from 0.200 deg. to 0.600 deg., thereby enabling to obtain a sintered compact for use in a tool having the aforesaid high properties.
    • 本发明涉及一种用于具有高耐热耐磨性,高温下优异的导热性和耐热冲击性,适用于高速切割的超硬工具的烧结体及其制造方法。 一种粉末混合物,其包含20-80体积%的高压氮化硼粉末,剩余部分由Al2O3粉末或主要包含Al 2 O 3粉末并且还含有碳化物的化合物陶瓷粉末,周期表中IVb,Vb,VIb族金属的氮化物, 其相互固溶体或其混合物在其高压或高温下进行烧结或压制后,使得复合陶瓷的Al 2 O 3在烧结体的结构中构成连续相,并且(116 )在构成连续相的结构中的Al 2 O 3晶体的CuKα射线的X射线衍射中在0.200度的范围内。 至0.600度,从而能够获得用于具有上述高性能的工具的烧结体。
    • 5. 发明授权
    • Sintered compact for a machining tool and a method of producing the
compact
    • 用于机加工工具的烧结体及其制造方法
    • US4334928A
    • 1982-06-15
    • US119771
    • 1980-02-08
    • Akio HaraShuji Yazu
    • Akio HaraShuji Yazu
    • B22F3/12B22F7/02B22F7/06B23B27/14C04B35/5831C22C26/00B22F3/00
    • C22C26/00B22F7/06B23B27/148C04B35/5831C22C2026/005Y10T428/12056Y10T428/12146
    • A sintered compact for use in a machining tool comprising 80 to 10 volume % of a high pressure form of boron nitride, and the balance a matrix of at least one binder compound material selected from the group consisting of a carbide, nitride, carbonitride, boride or silicide of IVa and Va transition metal of the periodic table, their mixtures as well as the solid solution of these compounds; the matrix forming a continuous bonding structure in the sintered body.A method of producing the compact comprises preparing a mix of 80 to 10 volume % of a high pressure form of a boron nitride powder with 20 to 90 volume % of at least one powdered binder compound selected from the group consisting of a carbide, a nitride, a carbonitride, a boride and a silicide of a IVa, or a Va metal, mixtures thereof or solid solutions of these compounds, and sintering the mix under pressures more than 20 Kb at temperatures higher than 700.degree. C. for more than 3 minutes.
    • 一种用于加工工具的烧结体,其包含80-10体积%的高压形式的氮化硼,余量为选自碳化物,氮化物,碳氮化物,硼化物中的至少一种粘合剂化合物材料的基体 或周期表的IVa和Va过渡金属的硅化物,它们的混合物以及这些化合物的固溶体; 所述基体在所述烧结体中形成连续的接合结构。 制造压块的方法包括制备80至10体积%的高压形式的氮化硼粉末与20至90体积%的至少一种选自碳化物,氮化物的粉末状粘合剂的混合物 ,IVa的碳氮化物,硼化物和硅化物或Va金属,它们的混合物或这些化合物的固溶体,并且在高于700℃的温度下在超过20Kb的压力下将混合物烧结超过3分钟 。
    • 10. 发明授权
    • Internal bus testing device and method
    • 内部总线测试装置及方法
    • US07028237B2
    • 2006-04-11
    • US10385527
    • 2003-03-12
    • Masashi MasudaAkio HaraKohji Kitagawa
    • Masashi MasudaAkio HaraKohji Kitagawa
    • G01R31/28
    • G06F11/27
    • An internal bus testing device for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses. The internal bus testing device includes an area selector which causes the internal bus control circuit to select an address area corresponding to one of the plurality of internal buses. An area address setting unit sets the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating the address area. A control unit supplies, at a start of an internal bus test, the address value from the area address setting unit to the area selector by transmitting the state setting signal from the area address setting unit to the area selector.
    • 一种用于半导体集成电路的内部总线测试装置,其中内部总线控制电路和多个模块通过多个内部总线连接。 内部总线测试装置包括区域选择器,其使得内部总线控制电路选择与多个内部总线之一相对应的地址区域。 区域地址设定单元响应于内部总线测试开始信号将内部总线控制电路设置在内部总线测试模式中,区域地址设置单元存储状态设置信号和指示地址区域的预定地址值。 控制单元通过从区域地址设定单元向区域选择器发送状态设定信号,在内部总线测试开始时,将区域地址设定单元的地址值提供给区域选择器。