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    • 7. 发明授权
    • Index modified coating on polymer substrate
    • 聚合物基材上的改性涂层
    • US07993733B2
    • 2011-08-09
    • US12070660
    • 2008-02-20
    • Michael W. StowellManuel D. Campo
    • Michael W. StowellManuel D. Campo
    • B32B7/02H05H1/46
    • G02B1/14C23C16/308C23C16/407C23C16/511C23C16/515C23C16/52G02B1/10Y10T428/24942Y10T428/2495Y10T428/24975
    • The invention includes the structure of a multilayer protective coating, which may have, among other properties, scratch resistance, UV absorption, and an effective refractive index matched to a polymer substrate such as polycarbonate. Each layer may contain multiple components consisting of organic and inorganic materials. The multilayer protective coating includes interleaved organic layers and inorganic layers. The organic layers may have 20% or more organic compounds such as SiOxCyHz. The inorganic layers may have 80% or more inorganic materials, such as SiO2, SiOxNy, and ZnO, or mixtures thereof. Each layer of the multilayer protective coating is a micro layer and may have a thickness of 5 angstroms or less in various embodiments. The multilayer protective coating may contain in the order of hundreds or thousands of micro layers, depending upon the design requirement of applications. In each micro layer, the components may have substantially continuous variations in concentration.
    • 本发明包括多层保护涂层的结构,其可以具有与诸如聚碳酸酯的聚合物基材匹配的耐刮擦性,UV吸收和有效折射率等特性。 每个层可以包含由有机和无机材料组成的多个组分。 多层保护涂层包括交错的有机层和无机层。 有机层可以具有20%以上的有机化合物,例如SiO x C y H z。 无机层可以具有80%以上的无机材料,例如SiO 2,SiO x N y和ZnO,或其混合物。 多层保护涂层的每层是微层,并且在各种实施方案中可以具有5埃或更小的厚度。 取决于应用的设计要求,多层保护涂层可以包含数百或数千个微层的数量级。 在每个微层中,组分可以具有基本上连续的浓度变化。
    • 9. 发明授权
    • Impacted financial statements
    • 财务报表冲销
    • US07941353B2
    • 2011-05-10
    • US10464055
    • 2003-06-17
    • Nigel KingWakana MasumotoPeter HellerMelanie Harp
    • Nigel KingWakana MasumotoPeter HellerMelanie Harp
    • G06Q40/00
    • G06Q10/10G06Q40/00G06Q40/02
    • A system for displaying financial information includes a financial statement having a set of financial accounts, a set of business processes associated with the set of financial accounts, and an financial statement manager for displaying the financial statement and the associated set of business processes. The financial statement manager is further adapted to display the financial statement and the set of risks associated with the set of financial accounts, the financial statement and a set of risk controls associated with the set of financial accounts, and/or the financial statement and a set of sample transactions associated with the set of financial accounts. The financial statement manager is further adapted to import the financial statement, which can be encoded in XML format. The system includes a web server for displaying the financial statement and the associated set of business processes as a web page on a user's web browser.
    • 用于显示财务信息的系统包括具有一组财务账户的财务报表,与该组金融账户相关联的一组业务流程,以及用于显示财务报表和相关业务流程集合的财务报表管理器。 财务报表经理进一步调整显示财务报表和与该组财务账目相关的风险集合,财务报表和与该组财务报表相关的一组风险控制,和/或财务报表和 与该组财务帐户相关联的一组样本交易。 财务报表经理进一步适应导入可以以XML格式编码的财务报表。 该系统包括一个Web服务器,用于在用户的网页浏览器上显示财务报表和相关的业务流程集合作为网页。
    • 10. 发明授权
    • Method for treatment of samples for transmission electron microscopes
    • 透射电子显微镜样品处理方法
    • US07923683B2
    • 2011-04-12
    • US12258965
    • 2008-10-27
    • Qi Hua ZhangChorng Shyr NiouPan LiuMing Li
    • Qi Hua ZhangChorng Shyr NiouPan LiuMing Li
    • G06F17/50G06K9/00
    • G01N1/286G01N2001/2873G01N2033/0095H01L22/12
    • A method for analyzing a sample for the manufacture of integrated circuits, e.g., dynamic random access memory devices, commonly called DRAMS. The method also provides an integrated chip including a thickness, a width, and a length. In a specific embodiment, the integrated chip has at least one elongated structure through a portion of the thickness, while being normal to the width and the length. In a specific embodiment, the elongated structure has a structure width and a structure length that extends through a vertical portion of the thickness. The method includes removing a slice of the integrated chip from a portion of the thickness in a directional manner normal to the structure length. In a specific embodiment, the slice is provided through an entirety of the one elongated structure along the structure length to cause a portion of a thickness of the slice providing the elongated structure to be of a substantially uniform sample thickness. The method also includes capturing one or more images through a portion of the slice using a transmission electron microscope.
    • 用于分析用于制造集成电路的样本的方法,例如通常称为DRAMS的动态随机存取存储器件。 该方法还提供了包括厚度,宽度和长度的集成芯片。 在具体实施例中,集成芯片具有穿过厚度的一部分的至少一个细长结构,同时垂直于宽度和长度。 在具体实施例中,细长结构具有延伸穿过厚度的垂直部分的结构宽度和结构长度。 该方法包括以垂直于结构长度的定向方式从厚度的一部分去除集成芯片的切片。 在一个具体的实施例中,切片沿着结构长度通过整个一个细长结构提供,以使切片的厚度的一部分提供细长结构,使其具有基本均匀的样本厚度。 该方法还包括使用透射电子显微镜捕获通过切片的一部分的一个或多个图像。