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    • 2. 发明授权
    • Developer solution for photoresist composition
    • 光致抗蚀剂组合物的显影剂溶液
    • US5985525A
    • 1999-11-16
    • US127640
    • 1993-09-28
    • Mitsuru SatoHatsuyuki TanakaToshimasa Nakayama
    • Mitsuru SatoHatsuyuki TanakaToshimasa Nakayama
    • G03F7/32H01L21/027H01L21/30G03C5/00
    • G03F7/322
    • Proposed is an aqueous developer solution for an alkali-developable photoresist composition which contains, besides a water-soluble organic basic compound such as tetramethyl ammonium hydroxide and an anionic or non-ionic surface active agent as conventional ingredients in the prior art developwer solutions, an inorganic ammonium salt such as ammonium sulfate, ammonium phosphates and ammonium borates in a limited amount. By virtue of this unique additive, the developer solution is advantageous in respect of the absence of any scums on the patterned resist layer obtained by the development treatment therewith as well as quite good orthogonality in the cross sectional profile of line-patterned resist layer in addition to the greatly improved latitude in the light exposure dose and range of focusing depth in the light-exposure process of the resist layer with ultraviolet light.
    • 提出了一种用于碱显影光致抗蚀剂组合物的水性显影剂溶液,其除了水溶性有机碱性化合物如四甲基氢氧化铵和阴离子或非离子表面活性剂外,还含有现有技术的开发溶液中的常规成分, 无机铵盐如硫酸铵,磷酸铵和硼酸铵。 由于这种独特的添加剂,显影剂溶液在通过其显影处理获得的图案化抗蚀剂层上不存在任何浮渣以及线图案化抗蚀剂层的横截面轮廓中的相当好的正交性方面是有利的 在抗紫外线的光曝光过程中的曝光剂量和聚焦深度的范围大大提高。
    • 3. 发明申请
    • RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    • 耐蚀组合物和形成耐力图案的方法
    • US20130337387A1
    • 2013-12-19
    • US13868462
    • 2013-04-23
    • Tokyo Ohta Kogyo Co., Ltd.
    • Masahito YahagiJun Iwashita
    • G03F7/004
    • G03F7/004G03F7/0045G03F7/0382G03F7/0392G03F7/0397G03F7/2041G03F7/2059G03F7/40
    • A resist composition including a base component (A) which generates acid upon exposure and exhibits changed solubility in a developing solution by the action of acid, (A) including (A1) including (a0) and (a2), and the resist composition having a Tf temperature of lower than 170° C. (└La01 represents —COO—, —CON(R′)— or a divalent aromatic group, R′ represents a hydrogen atom or a methyl group, Va01 represents a linear alkylene group of at least 3 carbon atoms, A− represents an anion-containing group, Mm+ represents an organic cation, Ya21 represents a single bond or divalent linking group, La21 represents —O—, —COO—, —CON(R′)— or —OCO—, R′ represents a hydrogen atom or a methyl group, and Ra21 represents a lactone-containing group, a carbonate containing group or an —SO2— containing group.
    • 一种抗蚀剂组合物,其包含在曝光后产生酸的基础组分(A),并且通过酸作用而在显影液中溶解度变化,(A)包括(A1)(a0)和(a2)),并且所述抗蚀剂组合物具有 (◎La01表示-COO-,-CON(R') - 或二价芳族基团,R'表示氢原子或甲基,Va 01表示直链亚烷基, 至少3个碳原子,A-表示含阴离子基团,Mm +表示有机阳离子,Ya21表示单键或二价连接基团,La 21表示-O - , - COO - , - CON(R') - 或-OCO - ,R'表示氢原子或甲基,Ra 21表示含内酯基,含碳酸酯基或-SO 2 - 基团。