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1. 发明公开

EP1855117A1 Contact for use in testing integrated circuits 审中-公开
标题翻译： Kontakt zur Verwendung bei derPrüfungintegrierter Schaltkreise
公开(公告)号：EP1855117A1
公开(公告)日：2007-11-14
申请号：EP07251948.1
申请日：2007-05-11
申请人： Sherry, Jeffrey C.
发明人： Sherry, Jeffrey C.
IPC分类号： G01R1/067 , G01R1/073
CPC分类号： G01R1/06772 , G01R1/07342 , G01R1/0735 , G01R1/07371
摘要： A contact (12) for use in a contact set assembly. The contact (12) spans a space which separates a lead (20) of an integrated circuit (22) to be tested and a pad (24) of a load board (26) interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead (20) and the load board pad (24). Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact (12) to be provided.
摘要翻译：用于触点组合件的触点（12）。触点（12）跨越一个空间，该空间分离待测试的集成电路（22）的引线（20）和与测试器接口的负载板（26）的焊盘（24）。接触结构提供集成电路引线（20）和负载板焊盘（24）之间的电气连通。包括绝缘层，其部分地包括接触。导电层叠在绝缘层的至少一部分上。施加到陶瓷层的导电迹线的层状结构和尺寸和形状使得能够提供触点（12）的参数。

2. 发明公开

EP1808701A1 Test contact system 审中-公开
标题翻译：测试联络系统
公开(公告)号：EP1808701A1
公开(公告)日：2007-07-18
申请号：EP07000902.2
申请日：2007-01-17
申请人： Sherry, Jeffrey C.
发明人： Sherry, Jeffrey C.
IPC分类号： G01R1/073 , H01L23/485 , H05K3/32
CPC分类号： H05K3/326 , G01R1/06738 , G01R1/0735 , H01L24/10 , H01L24/13 , H01L2224/13 , H01L2224/13099 , H01L2224/81385 , H01L2924/01005 , H01L2924/01006 , H01L2924/01015 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/01076 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/30107 , H01L2924/3025 , H05K2201/0373 , H05K2201/0382 , H05K2201/0394 , H05K2201/10734 , H01L2924/00
摘要： A test contact element (56,57,58) for making temporary electrical contact with a microcircuit terminal comprises at least one resilient finger (56a,56b,57a,57b) projecting from an insulating contact membrane (50) as a cantilevered beam. The finger has on a contact side thereof, a conducting contact pad for contacting the microcircuit terminal. Preferably the test contact element has a plurality of fingers, where each finger is defined at least in part by two radially oriented slots (62) in the membrane that mechanically separate each finger from every other finger of the plurality of fingers forming the test contact element. A plurality of the test contact elements can form a test contact element array (40) comprising with the test contact elements arranged in a predetermined pattern. A plurality of connection vias preferably in an interface membrane are arranged in substantially the predetermined pattern of the test contact elements, with each of said connection vias aligned with one of the test contact elements. The connection vias may have a cup shape with an open end, with the open end of the cup-shaped via contacting the aligned test contact element. The contact and interface membranes may be used as part of a test receptacle including a load board on which individual microcircuits are mounted for testing.
摘要翻译：用于与微电路端子进行临时电接触的测试接触元件（56,57,58）包括作为悬臂梁从绝缘接触膜（50）突出的至少一个弹性指（56a，56b，57a，57b）。手指在其接触侧具有用于接触微电路端子的导电接触垫。优选地，测试接触元件具有多个指状物，其中每个指状物至少部分地由隔膜中的两个径向取向的狭槽（62）限定，其将每个指状物与形成测试接触元件的多个指状物中的每个其他指状物。多个测试接触元件可形成测试接触元件阵列（40），测试接触元件阵列（40）包括以预定图案布置的测试接触元件。优选地在界面膜中的多个连接通孔以基本上预定的测试接触元件图案布置，每个所述连接通孔与测试接触元件中的一个对齐。连接通孔可以具有开口端的杯形，并且杯形通孔的开口端接触对准的测试接触元件。接触膜和界面膜可以用作测试插座的一部分，包括载有单个微电路的负载板用于测试。

3. 发明专利

CA2588313C CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS 未知
公开(公告)号：CA2588313C
公开(公告)日：2016-03-29
申请号：CA2588313
申请日：2007-05-11
申请人： SHERRY JEFFREY C
发明人： SHERRY JEFFREY C
IPC分类号： G01R1/06
摘要： A contact for use in a contact set assembly. The contact spans a space which separates a lead of an integrated circuit to be tested and a pad of a load board interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead and the load board pad. Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact to be provided.

4. 发明专利

CA2588313A1 CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS 未知
公开(公告)号：CA2588313A1
公开(公告)日：2007-11-11
申请号：CA2588313
申请日：2007-05-11
申请人： SHERRY JEFFREY C
发明人： SHERRY JEFFREY C
IPC分类号： G01R1/06
摘要： A contact for use in a contact set assembly. The contact spans a space which separates a lead of an integrated circuit to be tested and a pad of a load board interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead and the load board pad. Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact to be provided.

5. 发明申请

WO2012033802A3 ELECTRICALLY CONDUCTIVE PINS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译：用于微型测试仪的导电引线
公开(公告)号：WO2012033802A3
公开(公告)日：2012-05-18
申请号：PCT/US2011050634
申请日：2011-09-07
申请人： JOHNSTECH INT CORP , NELSON JOHN E , SHERRY JEFFREY C , ALLADIO PATRICK J , OBERG RUSSELL F , WARWICK BRIAN , MICHALKO GARY W
发明人： NELSON JOHN E , SHERRY JEFFREY C , ALLADIO PATRICK J , OBERG RUSSELL F , WARWICK BRIAN , MICHALKO GARY W
IPC分类号： G01R31/00
CPC分类号： G01R31/2891 , G01R1/0416 , G01R1/06738 , G01R1/06744 , G01R1/0735 , G01R3/00 , G01R31/2887 , G01R31/2889 , Y10T29/49204
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
摘要翻译：被测器件的端子通过一系列导电引脚对临时电连接到负载板上的相应接触焊盘。销对通过插入器膜保持在适当的位置，该插入器膜包括面向被测器件的顶部接触板，面向负载板的底部接触板以及顶部和底部接触板之间的垂直弹性的非导电部件。每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。当纵向压缩时，销沿着界面滑动朝向彼此平移。滑动主要是纵向的，具有由界面的倾斜度确定的小而理想的横向分量。

6. 发明申请

WO2013059249A1 IMPROVED ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译：用于微型测试仪的改进的导电电磁触头
公开(公告)号：WO2013059249A1
公开(公告)日：2013-04-25
申请号：PCT/US2012/060512
申请日：2012-10-17
申请人： JOHNSTECH INTERNATIONAL CORPORATION , ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
发明人： ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
IPC分类号： G01R31/02
CPC分类号： G01R1/0466
摘要： Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.
摘要翻译：被测器件（DUT）的端子（2，502）通过一系列导电触点连接到相应的触点焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头（770）部分地或完全地横向围绕力接触件（700）。为了增加接触表面，弹簧销（700）构造中的力接触件在引线的弯曲或倾斜的部分处接触被测试端子，而不是与引脚正交。

7. 发明申请

WO2010123991A2 ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译： MICROCIRCUIT测试仪的电导式KELVIN触点
公开(公告)号：WO2010123991A2
公开(公告)日：2010-10-28
申请号：PCT/US2010/031896
申请日：2010-04-21
申请人： JOHNSTECH INTERNATIONAL CORPORATION , ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
发明人： ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
IPC分类号： G01R31/02
CPC分类号： G01R1/067 , G01R1/0466 , G01R1/07378
摘要： Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
摘要翻译：被测器件的端子通过一系列导电触点连接到对应的接触焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头部分或完全横向地围绕力接触，使得其不需要具有其自身的弹性。感觉触点具有分叉端部，其分叉延伸到力接触件的相对侧。或者，感测触头围绕力接触并且横向滑动以匹配力接触件的纵向压缩期间力接触件的横向横截面的横向平移部件。或者，感测触点包括在力接触的相对侧上具有端部并且平行延伸的杆。

8. 发明申请

WO2010104913A1 ELECTRICALLY CONDUCTIVE PINS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译：微电阻测试仪的导电引脚
公开(公告)号：WO2010104913A1
公开(公告)日：2010-09-16
申请号：PCT/US2010/026767
申请日：2010-03-10
申请人： NELSON, John E. , SHERRY, Jeffrey C. , ALLADIO, Patrick J. , OBERG, Russell F. , WARWICK, Brian , JOHNSTECH INTERNATIONAL
发明人： NELSON, John E. , SHERRY, Jeffrey C. , ALLADIO, Patrick J. , OBERG, Russell F. , WARWICK, Brian
IPC分类号： H05K1/11
CPC分类号： G01R1/0416 , G01R1/0466 , G01R1/0483 , G01R1/0735 , G01R1/07371 , H01H13/702 , H01H2203/04 , H01H2205/006 , H01H2207/028 , H01H2209/052 , H01R12/7082 , H01R13/2414
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
摘要翻译：被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。销对通过插入器膜保持在适当的位置，该插入器膜包括面向被测器件的顶部接触板，面向负载板的底部接触板以及位于顶部和底部接触板之间的垂直弹性的非导电部件。每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。当纵向压缩时，销沿着界面滑动朝向彼此平移。滑动主要是纵向的，具有通过界面的倾斜度确定的小且期望的侧向分量。

9. 发明申请

WO2010123991A3 ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译： MICROCIRCUIT测试仪的电导式KELVIN触点
公开(公告)号：WO2010123991A3
公开(公告)日：2012-02-02
申请号：PCT/US2010031896
申请日：2010-04-21
申请人： JOHNSTECH INT CORP , ERDMAN JOEL N , SHERRY JEFFREY C , MICHALKO GARY W
发明人： ERDMAN JOEL N , SHERRY JEFFREY C , MICHALKO GARY W
IPC分类号： G01R31/02
CPC分类号： G01R1/067 , G01R1/0466 , G01R1/07378
摘要： Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
摘要翻译：被测器件的端子通过一系列导电触点连接到对应的接触焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头部分或完全横向地围绕力接触，使得其不需要具有其自身的弹性。感觉触点具有分叉端部，其分叉延伸到力接触件的相对侧。或者，感测触头围绕力接触并且横向滑动以匹配力接触件的纵向压缩期间力接触件的横向横截面的横向平移部件。或者，感测触点包括在力接触的相对侧上具有端部并且平行延伸的杆。

10. 发明申请

WO2008083404A1 MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WITHIN A SINGLE SLOT 审中-公开
标题翻译： MICROCIRCUIT测试接口在一个单槽内有凯尔金和信号触点
公开(公告)号：WO2008083404A1
公开(公告)日：2008-07-10
申请号：PCT/US2008/050044
申请日：2008-01-02
申请人： JOHNSTECH INTERNATIONAL CORPORATION , SHERRY, Jeffrey C.
发明人： SHERRY, Jeffrey C.
IPC分类号： G01R31/303
CPC分类号： G01R1/0466
摘要： In a first slot of a plurality of adjacent slots in alignment with traces on a load board of a tester, first and second conductor layers, each to make electrical contact with both a load board trace and a DUT lead. Each of the first and second contacts receives force from a resilient element extending across the slots and that urges a contact point on the contact against at least one trace and a DUT lead. Insulation between said first and second contacts in the first slot electrically insulates the first and second contacts from each other within the first slot.
摘要翻译：在与测试器的负载板上的迹线对准的多个相邻槽中的第一槽中，第一和第二导体层各自与负载板迹线和DUT引线电接触。第一和第二触点中的每一个接收来自延伸穿过狭槽的弹性元件的力，并且将触点上的接触点推向至少一个迹线和DUT引线。在第一槽中的所述第一和第二触头之间的绝缘部分使第一和第二触头彼此在第一槽内电绝缘。

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