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    • 1. 发明专利
    • テスト装置
    • 测试设备
    • JP2015021969A
    • 2015-02-02
    • JP2014145151
    • 2014-07-15
    • 致茂電子股▲分▼有限公司Chroma Ate Inc.Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • LEE YI-CHIAOWU XIN-YI
    • G01R31/26
    • G01R31/2867G01R31/2849G01R31/2874
    • 【課題】スペースを節約するために、各部が同じスペースを共有するテスト装置を提供する。【解決手段】テスト装置は、扇形搬送部3と、移動部2と、テスト部4とを備える。扇形搬送部3は、電子部品を搬送するために使用される複数のソーキングバッファを有し、回動軸により回動可能に設けられ、テスト位置40と移動位置20との間で移動する。移動部2は、移動位置20に対応して設けられ、複数の電子部品を扇形搬送部3の中へ、または、扇形搬送部3の中から移動するために使用される。テスト部4は、テスト位置に対応して設けられ、電子部品をテストし、その電子部品はテスト後に扇形搬送部3の中へ移動される。【選択図】図2
    • 要解决的问题:提供一种测试装置,其中每个部件具有相同的空间以节省空间。解决方案:测试装置包括扇形输送部3,移动部2和测试部4。 带状输送部3具有用于输送电子部件的多个浸泡缓冲器,并且由旋转轴可旋转地设置,以在测试位置40和移动位置20之间移动。移动部2与移动位置对应地设置 并且用于将多个电子部件移动到扇形输送部3中或从扇形输送部3移动。测试部4与测试位置对应地设置,并且对电子部件进行测试。 试验后,电子部件移动到扇形输送部3内。
    • 2. 发明专利
    • Photovoltaic simulator having detector and solar cell inspection device
    • 具有检测器和太阳能电池检测装置的光电模拟器
    • JP2012033844A
    • 2012-02-16
    • JP2010182344
    • 2010-08-17
    • Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • YI JEONG-LINCHANG IL-BOMLIM MYONG-KEOL
    • H01L31/04
    • F21S8/006
    • PROBLEM TO BE SOLVED: To provide a photovoltaic simulator having a detector and a solar cell inspection device.SOLUTION: The bodies of a photovoltaic simulator having a detector and a solar cell inspection device are sealed spaces having an irradiation port, and a luminous body is provided to emit a first light flux by an angle facing the direction of the irradiation port in the sealed spaces. A spectral device is provided on the path in the progression direction of the first light flux to divide the first light flux into a first sub light flux and a second sub light flux, and the first sub light flux is projected to a solar cell for inspection positioned at the irradiation port to use as a solar cell inspection device. Also, a detector is provided to receive the second sub light flux on the progression path of the second light flux, and a signal is output from the detector to be used to monitor the size of the first light flux emitted from the luminous body. Thus, accuracy for measurement of the solar cell is secured.
    • 要解决的问题:提供具有检测器和太阳能电池检查装置的光伏模拟器。 解决方案:具有检测器和太阳能电池检查装置的光伏模拟器的主体是具有照射端口的密封空间,并且发光体设置成以与照射端口的方向成一定角度发射第一光束 在密封的空间。 在第一光束的行进方向上的路径上设置光谱装置,以将第一光束分割成第一子光束和第二子光束,并将第一子光束投影到太阳能电池进行检查 位于照射口以用作太阳能电池检查装置。 此外,提供检测器以在第二光通量的进行路径上接收第二子光通量,并且从检测器输出信号以用于监视从发光体发射的第一光通量的大小。 因此,确保太阳能电池的测量精度。 版权所有(C)2012,JPO&INPIT
    • 3. 发明专利
    • Filming device and filming method
    • 电镀装置和电镀方法
    • JP2012013696A
    • 2012-01-19
    • JP2011140321
    • 2011-06-24
    • Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • IM YU-HEONBAN SIE-YOSONG SIN-AHKCHANG YU-CHOLKAN KWING-DAL
    • G01B9/04G01B9/02G01B11/24G02B21/36
    • G01B11/24G01B11/2441
    • PROBLEM TO BE SOLVED: To provide a filming device and a filming method obtaining a three-dimensional outline video having color information and also obtaining a planar clear video having the color information and deeper depth on the premises that filming action is not increased.SOLUTION: The filming device scanning a measured object includes: a light source; a first spectroscope; a microscopic objective lens set; a second spectroscope; a monochrome video sensing device, and a video sensing device. In this case: the light source is for emitting an irradiation optical beam; the first spectroscope is for reflecting the irradiation optical beam; the microscopic objective lens set is arranged above the measured object and includes a reflection reference surface; the second spectroscope is arranged above the first spectroscope, divides the machining optical beam into a first sub-optical beam and a second sub-optical beam; the monochrome video sensing device is arranged in a proceeding passage of the first sub-optical beam; and the video sensing device is arranged in the proceeding passage of the second sub-optical beam.
    • 要解决的问题:提供一种获得具有彩色信息的三维轮廓视频的拍摄装置和拍摄方法,并且还获得具有不增加拍摄动作的场所上的颜色信息和更深的深度的平面清晰视频 。 扫描测量对象的成像装置包括:光源; 第一个分光镜; 微观物镜组; 第二个分光镜; 单色视频感测装置和视频感测装置。 在这种情况下:光源用于发射照射光束; 第一个分光镜用于反射照射光束; 微观物镜组被布置在测量对象的上方并包括反射参考表面; 第二分光器被布置在第一分光器上方,将加工光束分成第一子光束和第二子光束; 单色视频感测装置布置在第一子光束的前进通道中; 并且视频感测装置布置在第二子光束的前进通道中。 版权所有(C)2012,JPO&INPIT
    • 4. 发明专利
    • Electronic load capable of simulating characteristics of light emitting diode and method for operating the same
    • 发光二极管模拟特性的电子负载及其操作方法
    • JP2011061177A
    • 2011-03-24
    • JP2009282206
    • 2009-12-11
    • Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • TSOU MING-YINGCHENG YI-CHIAOCHEN WEN-CHUNGCHEN REN-KAISU CHANG-CHENG
    • H01L33/00
    • G01R31/2635
    • PROBLEM TO BE SOLVED: To provide an electronic load capable of simulating characteristics of an LED (light emitting diode) and capable of simulating characteristics of different LEDs by input of different control commands. SOLUTION: The electronic load outputs a simulation signal after receiving an input signal from a pour source. The simulation signal has a voltage value and a current value approximating to a characteristic curve of an LED desired to be simulated at any time. The electronic load includes a processing unit, a voltage measurement unit, and a control processing unit, wherein the processing unit receives a set of control commands from the outside of the electronic load, the set of control commands includes at least a set of parameters, the voltage measurement unit measures the voltage of the input signal and generates at least one measurement results, and the control processing unit is connected in communication with the parameter setting device and voltage measurement unit and calculates a set of parameters and measurement results to generate an adjustment command for transmission to a current amplifier. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供能够模拟LED(发光二极管)的特性并且能够通过输入不同控制命令来模拟不同LED的特性的电子负载。

      解决方案:电子负载在从倾倒源接收到输入信号后输出模拟信号。 模拟信号具有与期望在任何时候被模拟的LED的特性曲线近似的电压值和电流值。 电子负载包括处理单元,电压测量单元和控制处理单元,其中处理单元从电子负载的外部接收一组控制命令,该组控制命令至少包括一组参数, 电压测量单元测量输入信号的电压并产生至少一个测量结果,并且控制处理单元与参数设置装置和电压测量单元连接,并计算一组参数和测量结果以产生调整 用于传输到电流放大器的命令。 版权所有(C)2011,JPO&INPIT

    • 5. 发明专利
    • Method and device for measuring surface profile
    • 用于测量表面轮廓的方法和装置
    • JP2007147505A
    • 2007-06-14
    • JP2005344149
    • 2005-11-29
    • Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • CHANG HUANG-CHANGLIN YAO-MING
    • G01B11/245
    • PROBLEM TO BE SOLVED: To provide a method of measuring a surface profile that reduces the effect of noise within an interference spectrum.
      SOLUTION: In the surface profile measuring method, the interference is generated between reflected lights of two surfaces, by irradiating the surface of an object to be measured and the reference surface, after the light of a wideband light source is divided via a spectroscope. The interference spectrum whose height value corresponds to the light intensity is generated, by changing the distance between the surface of the object and the spectroscope by a constant step. This interference spectrum is then scanned, to find a first interference fringe corresponding to the maximum light intensity. Thereafter, a second interference fringe having the optimum symmetry is found, by using the principle of symmetry of interference spectrum in the first interference fringe and the interference fringes in the vicinity thereof. In the second interference fringe, a phase compensation method is used to calculate the null optical path difference part, corresponding to the wavefront of the second interference fringe, i.e. the height value of the surface of the object to be measured.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种测量表面轮廓的方法,其减少干扰谱内噪声的影响。 解决方案:在表面轮廓测量方法中,通过照射被测物体的表面和基准面,在两个表面的反射光之间产生干涉,在宽带光源的光经由 分光镜。 通过恒定步长改变物体表面与分光镜之间的距离,产生高度值对应于光强的干涉光谱。 然后扫描该干涉光谱,以找到对应于最大光强度的第一干涉条纹。 此后,通过使用第一干涉条纹中的干涉光谱的对称原理及其附近的干涉条纹,找到具有最佳对称性的第二干涉条纹。 在第二干涉条纹中,使用相位补偿方法来计算对应于第二干涉条纹的波前的零光程差部分,即要测量对象的表面的高度值。 版权所有(C)2007,JPO&INPIT
    • 6. 发明专利
    • Electric testing device and electric testing method
    • 电测试装置和电测试方法
    • JP2014186024A
    • 2014-10-02
    • JP2014001041
    • 2014-01-07
    • Chroma Ate Inc致茂電子股▲分▼有限公司Chroma Ate Inc.
    • FAN FU CHIENGWANG YAO NANWU NAN SHIH
    • G01R31/18G01R31/06G01R31/12
    • PROBLEM TO BE SOLVED: To provide an electric testing device that firstly determines whether or not a tested device is already surely connected to a jig before executing procedures for an interlayer pressure test and is capable of reducing a phenomenon of spark discharge.SOLUTION: An electric testing device according to an embodiment of the invention comprises: a resonant circuit module to be coupled with a tested device; a first power supply module that includes a first switch element and provides first voltage to the resonant circuit module when the first switch element is in an off state; a second power supply module that provides second voltage to the resonant circuit module when the first switch element is in an on state; a measurement module that measures an electric signal generated at least when the resonant circuit module receives the first voltage; and a control module that controls the on or off state of the first switch element on the basis of the electric signal. Therefore, the electric testing device can have functions of open circuit check and inductance measurement.
    • 要解决的问题:提供一种电测试装置,其在执行层压试验之前首先确定被测装置是否已经可靠地连接到夹具,并且能够减少火花放电的现象。解决方案:电 根据本发明实施例的测试装置包括:与测试装置耦合的谐振电路模块; 第一电源模块,其包括第一开关元件,并且当所述第一开关元件处于断开状态时,向所述谐振电路模块提供第一电压; 第二电源模块,其在所述第一开关元件处于导通状态时向所述谐振电路模块提供第二电压; 测量模块,其至少在谐振电路模块接收到第一电压时测量产生的电信号; 以及控制模块,其基于电信号来控制第一开关元件的接通或断开状态。 因此,电气测试装置可以具有开路检查和电感测量的功能。
    • 7. 发明专利
    • Test device for led
    • LED测试装置
    • JP2013024860A
    • 2013-02-04
    • JP2011267167
    • 2011-12-06
    • Chroma Ate Incクロマ エーティーイー インコーポレイテッドChroma Ate Inc.
    • TSENG I-SHIHCHANG TIEN-TENGREH JEFFCHENG CHIH-YUCHENG HSU-TING
    • G01R31/26G01J1/00H01L33/00
    • G01R31/2635G01R1/0408
    • PROBLEM TO BE SOLVED: To measure a flip-chip LED without causing deformation due to negative pressure during fixing.SOLUTION: A test device 3 for a flip-chip LED includes a transparent substrate 30, a spacer member 32, a soft and transparent support stage 34, and a vacuum generator 36. The spacer member 32 is formed on a first surface 300 of the transparent substrate 30. The soft and transparent support stage 34 for substrate is detachably fitted into the spacer member 32 so as to form a closed space S1 by the soft and transparent support stage 34, the spacer member 32, and the first surface 300 of the transparent substrate 30. The vacuum generator 36 is connected to the closed space S1 to suck out air from the closed space S1, and a part of the soft and transparent support stage 34 is stuck to the first surface 300 to form a test area 340 in which a flip-chip LED is set.
    • 要解决的问题:测量倒装芯片LED,而不会由于固定期间的负压而引起变形。 解决方案:用于倒装芯片LED的测试装置3包括透明基板30,间隔件32,柔软透明的支撑台34和真空发生器36.间隔件32形成在第一表面 300的透明基板30.用于基板的柔软和透明的支撑台34可拆卸地装配到间隔件32中,以便通过软和透明支撑台34,间隔件32和第一表面形成封闭空间S1 300.透明基板30的真空发生器36连接到封闭空间S1以从封闭空间S1吸出空气,并且将柔软和透明的支撑台34的一部分粘附到第一表面300以形成测试 区域340,其中设置倒装芯片LED。 版权所有(C)2013,JPO&INPIT
    • 8. 发明专利
    • Tray
    • 托盘
    • JP2013004522A
    • 2013-01-07
    • JP2012121908
    • 2012-05-29
    • Chroma Ate Incクロマ エーティーイー インコーポレイテッドChroma Ate Inc.
    • HWANG CHANG-CHENCHENG LEE-YI
    • H01M2/10
    • H01M2/1077H01M2/0207H01M2/1061
    • PROBLEM TO BE SOLVED: To provide a new tray for allowing a plurality of porch-shaped batteries to be arranged thereon.SOLUTION: A tray includes: one frame; at least one driving shaft; a plurality of fixed plates; and a plurality of moving plates. The driving shaft is fixed to the frame so as to slide along a driving axis, and has a positioning device for deciding a relative position of the driving shaft to the frame. The fixed plates are vertical to the driving axis, and are successively arranged and fixed along the driving axis in the frame. Also, the moving plates are vertical to the driving axis, are arranged along the driving axis in the frame, and combined with the fixed plates. The moving plates are moved together with the driving shaft. Each of the moving plates and each of the fixed plates define a receiving space for receiving a porch-shaped battery, and are used for clamping each of the porch-shaped battery.
    • 要解决的问题:提供一种用于允许在其上布置多个门状电池的新托盘。 解决方案:托盘包括:一个框架; 至少一个驱动轴; 多个固定板; 和多个移动板。 驱动轴固定在框架上,以沿着驱动轴线滑动,并具有用于确定驱动轴相对于框架的相对位置的定位装置。 固定板垂直于驱动轴线,并且沿框架中的驱动轴线依次布置和固定。 此外,移动板垂直于驱动轴线,沿框架中的驱动轴线布置,并与固定板组合。 移动板与驱动轴一起移动。 移动板和每个固定板中的每一个限定了用于容纳门形电池的接收空间,并且用于夹持每个门状电池。 版权所有(C)2013,JPO&INPIT
    • 10. 发明专利
    • Battery charging and discharging device, and method
    • 电池充电和放电装置及方法
    • JP2010239857A
    • 2010-10-21
    • JP2010025443
    • 2010-02-08
    • Chroma Ate Incクロマ エーティーイー インコーポレイテッドChroma Ate Inc.
    • WANG YAO NANWU WEN-CHIEHCHEN CHAO HSU
    • H02J7/04H01M10/44
    • H02J7/0018G06F1/203G06F1/26H02J7/0022H02J7/0072H02J2007/0067
    • PROBLEM TO BE SOLVED: To provide a battery charging and discharging device, and a method.
      SOLUTION: The battery charging and discharging device includes a power supply and a plurality of charging and discharging modules. Each charging and discharging module is provided with a current limit transistor, a current limit resistor, a charging control unit, and a discharging control unit. Both of the charging control unit and the discharging control unit are battery voltage tracking type. When the charging and discharging modules charge the battery, the voltage crossing two end parts of the current limit transistor and the current limit resistor connected in series is limited to a fixed value by the charging control unit. When the battery is discharged, the voltage crossing two end parts of the current limit transistor and the current limit resistor connected in series is limited to a fixed value by the discharging control unit. The discharging control unit feeds back discharge energy to the power supply from the battery.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种电池充放电装置及其方法。 解决方案:电池充放电装置包括电源和多个充电和放电模块。 每个充放电模块设置有限流晶体管,限流电阻,充电控制单元和放电控制单元。 充电控制单元和放电控制单元都是电池电压跟踪型。 当充电和放电模块对电池充电时,通过充电控制单元限制跨过电流限制晶体管的两个端部的电压和串联连接的限流电阻器的固定值。 当电池放电时,通过放电控制单元将与电流限制晶体管的两端部分和串联连接的限流电阻器的电压限制在固定值。 放电控制单元将电池的放电能量反馈给电源。 版权所有(C)2011,JPO&INPIT