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    • 4. 发明专利
    • Optical device
    • 光学装置
    • JP2011170354A
    • 2011-09-01
    • JP2011031016
    • 2011-02-16
    • Carl Zeiss Laser Optics Gmbhカール ツァイス レーザー オプティクス ゲーエムベーハー
    • HOLDERER HUBERTABELE KLAUS
    • G02B7/02
    • G02B7/00G02B27/0025
    • PROBLEM TO BE SOLVED: To fix an optical element to a mount with maximum stability and also in a minimum-stressed state. SOLUTION: The optical element 12 is fixed to the mount 16 through compliant support parts 22a, 22b and 22c. Each of the support parts 22a, 22b and 22c has a spring strut arrangement 24 which has a first spring strut 26, a second spring strut 28 and a contact area 30 in which the optical element 12 is fixed at a contact point 32. The first and second spring struts 26 and 28 are respectively connected to: the contact area 30 through first ends 34 and 36; and the outer edge part 42 of the mount through the second ends 38 and 40 located away from the contact area 30. The first and second spring struts 26 and 28 are separated from each other on the same side from the contact area 30 in a compliance direction, extend from the contact area 30, and are parallel to each other substantially. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:将光学元件固定到具有最大稳定性并且处于最小应力状态的安装座上。 解决方案:光学元件12通过柔性支撑部分22a,22b和22c固定到安装件16上。 每个支撑部分22a,22b和22c具有弹簧支柱装置24,其具有第一弹簧支柱26,第二弹簧支柱28和接触区域30,光学元件12固定在接触点32上。第一 并且第二弹簧支柱26和28分别通过第一端34和36连接到接触区域30; 以及安装件的外边缘部分42通过位于远离接触区域30的第二端38和40的位置。第一和第二弹簧支柱26和28在与接触区域30相同的一侧彼此分离, 方向,从接触区域30延伸,并且基本上彼此平行。 版权所有(C)2011,JPO&INPIT
    • 5. 发明专利
    • Optical imaging system
    • 光学成像系统
    • JP2003347625A
    • 2003-12-05
    • JP2003146803
    • 2003-05-23
    • Carl Zeiss Laser Optics Gmbhカール ツァイス レーザー オプティクス ゲーエムベーハー
    • HERKOMMER ALOIS
    • H01S3/00G01J1/42
    • G01J1/4257
    • PROBLEM TO BE SOLVED: To form an image of at least two planes of a light beam (12) spaced apart in the beam direction of the light beam (12), especially a laser light beam onto a common target (16), e.g. a detector. SOLUTION: This system has at least one optically imaging element (18) arranged in a beam path of the light beam (12). The at least one element (18) is a light-collecting primary mirror (M 1 ), at least two secondary mirrors (S 1 -S 4 ) which can be alternately introduced into the means path are arranged on the downstream of the mirror (M 1 ) side, and the mirrors (S 1 -S 4 ) are so designed that one secondary mirror (S 1 -S 4 ) enables formation of an image of one plane, and the other secondary mirror (S 1 -S 4 ) enables formation of an image of the other plane of the beam (12) onto the target (16), respectively. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了形成在光束(12)的光束方向上间隔开的光束(12)的至少两个平面的图像,特别是在公共目标(16)上的激光束, ,例如 检测器 解决方案:该系统具有布置在光束(12)的光束路径中的至少一个光学成像元件(18)。 至少一个元件(18)是聚光主镜(M SB 1),至少两个次镜(S S 4 < 可以交替地引入装置路径中的反射镜(SBB)布置在反射镜(M 1 )侧的下游,并且反射镜(S 1 -S 4 )被设计成使得一个次级反射镜(S S 4 )能够形成一个平面的图像,并且另一个次级反射镜 能够将光束(12)的另一个平面的图像分别形成到目标(16)上。 版权所有(C)2004,JPO
    • 6. 发明专利
    • Method of measuring spectrum of narrow band light source and spectrometer arrangement
    • 测量窄带光源和光谱仪布置的方法
    • JP2010085408A
    • 2010-04-15
    • JP2009224922
    • 2009-09-29
    • Carl Zeiss Laser Optics Gmbhカール ツァイス レーザー オプティクス ゲーエムベーハー
    • CLAUS JOHANNESHERKOMMER ALOISWEIGL BERNHARDMAIRE MICHEL LEMUENZ HOLGER
    • G01J3/26
    • G01J3/26G01J3/36
    • PROBLEM TO BE SOLVED: To measure a spectrum of a narrowband light source, particularly a narrow bandwidth laser device in a high resolution. SOLUTION: This spectrometer arrangement (10) for measuring a spectrum of a light beam (64) emitted from a narrow bandwidth laser device includes: a single etalon (16); a beam splitter (18) for splitting the light beam (64) into a first partial beam (66) and a second partial beam (68); and an optical directing element (20) for directing the first partial beam (66) n times and the second partial beam (68) (n+k) times through the etalon (16), wherein n and k are integers of one or more. This spectrometer arrangement (10) further includes: a light sensitive detector (22); and a spectrum evaluation device (28) that evaluates the spectra, recorded by the detector (22), of the first partial beam that has passed through the etalon (16) n times and of the second partial beam that has passed through the etalon (16) (n+k) times so as to determine the light spectrum corrected with respect to a device function of the etalon (16). COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:以高分辨率测量窄带光源,特别是窄带宽激光器件的光谱。 解决方案:用于测量从窄带激光器件发射的光束(64)的光谱的该光谱仪装置(10)包括:单个标准具(16); 用于将光束(64)分裂成第一部分光束(66)和第二部分光束(68)的分束器(18); 以及用于将所述第一部分光束(66)n次和所述第二部分光束(68)(n + k)引导通过所述标准具(16)的光导向元件(20),其中n和k是一个或多个 。 该光谱仪装置(10)还包括:光敏检测器(22); 以及光谱评估装置(28),其评估由检测器(22)记录的已经通过标准具(16)的第一部分光束的光谱和经过标准具的第二部分光束的光谱(28) 16)(n + k)倍,以便确定相对于标准具(16)的器件功能校正的光谱。 版权所有(C)2010,JPO&INPIT