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    • 82. 发明授权
    • Thin-film magnetic head, a head gimbal assembly and hard disk drive
    • 薄膜磁头,磁头万向架组件和硬盘驱动器
    • US07580222B2
    • 2009-08-25
    • US10898986
    • 2004-07-27
    • Yoshitaka SasakiLijie GuanHiroyuki Ito
    • Yoshitaka SasakiLijie GuanHiroyuki Ito
    • G11B5/127G11B5/147
    • G11B5/1872G11B5/1278G11B5/3103G11B5/3143G11B5/3163
    • A thin-film magnetic head has a laminated construction comprising a main pole layer having a magnetic pole tip on the side of the medium-opposing surface opposing a recording medium, a write shield layer opposite the magnetic pole tip forming a recording gap layer, on the side of the medium-opposing surface, and a thin-film coil wound around at least a portion of the write shield layer. The main pole layer has the magnetic pole tip with a shortened structure which is not connected to the write shield layer, and an upper yoke pole section and/or lower yoke pole section with a larger size than the magnetic pole tip, and has a joined structure wherein the upper yoke pole section and/or lower yoke pole section is joined to the magnetic pole tip.
    • 薄膜磁头具有层叠结构,该层叠结构包括:主磁极层,其在介质相对表面的与记录介质相对的一侧上具有磁极尖端;写入屏蔽层,与形成记录间隙层的磁极末端相对; 介质相对表面的侧面和缠绕在写入屏蔽层的至少一部分上的薄膜线圈。 主极层具有不与写入屏蔽层连接的具有缩短结构的磁极尖端,以及具有比磁极尖端大的尺寸的上轭铁极部分和/或下轭铁极部分,并且具有连接 结构,其中上磁轭极部分和/或下轭铁极部分接合到磁极尖端。
    • 83. 发明申请
    • THIN-FILM MAGNETIC HEAD, HEAD GIMBAL ASSEMBLY, AND HARD DISK SYSTEM
    • 薄膜磁头,头盖组件和硬盘系统
    • US20090116143A1
    • 2009-05-07
    • US12348655
    • 2009-01-05
    • Hiraku HIRABAYASHINorikazu Ota
    • Hiraku HIRABAYASHINorikazu Ota
    • G11B5/10
    • G11B5/3116G11B5/1872G11B5/3136Y10T29/49032
    • A write shield layer that forms a part of a thin-film magnetic head is set with respect to the widthwise full length W thereof lying substantially on an air bearing surface that is opposite to the recording medium such that when the full length W is trisected, the maximum thickness H1/3side thereof in a range of widthwise ⅓ W size positioned at both ends thereof is larger than the average thickness Hm of the whole write shield layer from the air bearing surface up to the rear (H1/3side>Hm), so that the so-called external magnetic field resistance is improved, and inadvertent erasure of the information already recorded in the recording medium is avoided as much as possible. Besides, the PTP (pole tip protrusion) phenomenon arising from the generation of heat from coils, and external temperature changes can be held back.
    • 形成薄膜磁头的一部分的写入屏蔽层相对于其宽度方向的全长W设置,其基本上位于与记录介质相对的空气轴承表面上,使得当全长W被三等分时, 位于其两端的横向1/3W尺寸的范围内的最大厚度H1 / 3侧大于整个写入屏蔽层从空气支承表面直到后部的平均厚度Hm(H1 / 3side> Hm ),使得所谓的外部磁场电阻提高,并且尽可能地避免已经记录在记录介质中的信息的无意擦除。 此外,可以阻止从线圈产生热量引起的PTP(极尖突起)现象以及外部温度变化。
    • 88. 发明申请
    • Perpendicular magnetic head
    • 垂直磁头
    • US20070211380A1
    • 2007-09-13
    • US11483318
    • 2006-07-07
    • Hideyuki AkimotoMitsuru OtagiriHiroshi Shirataki
    • Hideyuki AkimotoMitsuru OtagiriHiroshi Shirataki
    • G11B5/147
    • G11B5/1278G11B5/1872G11B5/3116G11B5/3146
    • The perpendicular magnetic head is capable of solving the problems of side track erasing and pole erasing. The perpendicular magnetic head of the present invention comprises a write-head, which includes a main magnetic pole emitting magnetic fluxes toward a recording medium. An end face of a pole end is formed into a T-shape. A longitudinal pole section of the pole end is made of a low Bs magnetic thin film, whose end face is formed into a rectangle. A transverse pole section of the pole end is made of a high Bs magnetic thin film, whose end face is formed into a rectangle. The low Bs magnetic thin film and the high Bs magnetic thin film are determined by the formula: (area of the end face of the low Bs magnetic thin film)×(saturation magnetic flux density of the low Bs magnetic thin film)>(area of the end face of the high Bs magnetic thin film)×(saturation magnetic flux density of the high Bs magnetic thin film).
    • 垂直磁头能够解决侧轨擦除和磁极擦除的问题。 本发明的垂直磁头包括一个写入头,它包括一个朝着记录介质发射磁通的主磁极。 极端的端面形成为T字形。 极端的纵极部由低Bs磁性薄膜制成,其端面形成为矩形。 极端的横极部由高Bs磁性薄膜制成,其端面形成为矩形。 低Bs磁性薄膜和高Bs磁性薄膜由以下公式确定:(低Bs磁性薄膜的端面的面积)×(低Bs磁性薄膜的饱和磁通密度)>(面积 的高Bs磁性薄膜的端面)x(高Bs磁性薄膜的饱和磁通密度)。