专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

81. 发明授权

US07486764B2 Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors 有权
标题翻译：减少像素化能量鉴别检测器中电荷共享的方法和装置
公开(公告)号：US07486764B2
公开(公告)日：2009-02-03
申请号：US11625969
申请日：2007-01-23
申请人： John Eric Tkaczyk , Yanfeng Du , Wen Li
发明人： John Eric Tkaczyk , Yanfeng Du , Wen Li
IPC分类号： H01L27/146 , G01N23/00
CPC分类号： G01T1/249 , G01T1/24
摘要： A CT detector includes a plurality of metallized anodes with each metallized anode separated from another metallized anode by a gap. A direct conversion material is electrically coupled to the plurality of metallized anodes and has a charge sharing region in which an electrical charge generated by an x-ray impinging the direct conversion material is shared between at least two of the plurality of metallized anodes. An x-ray attenuating material is positioned to attenuate x-rays directed toward the charge sharing region.
摘要翻译： CT检测器包括多个金属化阳极，每个金属化阳极通过间隙从另一个金属化阳极分离。直接转换材料电耦合到多个金属化阳极，并且具有电荷共享区域，其中由穿过直接转换材料的X射线产生的电荷在多个金属化阳极中的至少两个之间共享。定位x射线衰减材料以衰减指向电荷共享区域的x射线。

82. 发明申请

US20080279567A1 ASYMMETRIC ETHERNET OPTICAL NETWORK SYSTEM 审中-公开
标题翻译：不对称以太网光网络系统
公开(公告)号：US20080279567A1
公开(公告)日：2008-11-13
申请号：US11746512
申请日：2007-05-09
申请人： Wen Huang , Fulin Pan , Wen Li , Qing Zhu
发明人： Wen Huang , Fulin Pan , Wen Li , Qing Zhu
IPC分类号： H04B10/00
CPC分类号： H04J14/0227 , H04J14/0246 , H04J14/025 , H04J14/0279 , H04J14/0282 , H04J2203/0067 , H04Q11/0067
摘要： An Ethernet-based optical network system includes a first optical transmitter that can receive a first electric signal and to produce a first optical signal, a first optical receiver that can convert the first optical signal to a second electric signal. The first electric signal, the first optical signal, and the second electric signal have a first transmission baud rate. A down converter can receive a third electric signal having the first transmission baud rate and to produce a fourth electric signal having a second transmission baud rate. A second optical transmitter can receive the fourth electric signal and produce a second optical signal having the second transmission baud rate. A second optical receiver can convert the second optical signal to a fifth electric signal having the second transmission baud rate. An up converter can convert the fifth electric signal to a sixth electric signal having the first transmission baud rate.
摘要翻译：一种基于以太网的光网络系统包括能够接收第一电信号并产生第一光信号的第一光发射机，可将第一光信号转换为第二电信号的第一光接收机。第一电信号，第一光信号和第二电信号具有第一传输波特率。下变频器可以接收具有第一传输波特率的第三电信号并产生具有第二传输波特率的第四电信号。第二光发射机可以接收第四电信号并产生具有第二传输波特率的第二光信号。第二光接收器可以将第二光信号转换成具有第二传输波特率的第五电信号。升压转换器可以将第五电信号转换成具有第一传输波特率的第六电信号。

83. 发明申请

US20080278174A1 Circuit and Method for Detecting a Dielectric Breakdown Fault 有权
标题翻译：用于检测介质故障的电路和方法
公开(公告)号：US20080278174A1
公开(公告)日：2008-11-13
申请号：US11747755
申请日：2007-05-11
申请人： Edward Li , Mark Gunderson , Wen Li
发明人： Edward Li , Mark Gunderson , Wen Li
IPC分类号： G01R31/02 , G01R31/00
CPC分类号： G01R31/14 , B60L3/0023 , B60L3/0069 , B60W50/04 , G01R31/006 , G01R31/025
摘要： An improved circuit and method for detecting dielectric breakdown and ground fault conditions is provided. The circuitry and method of the present invention include taking a continuous voltage reading of the high voltage battery and sampling the continuous voltage reading of the high voltage battery at a fixed time interval. The circuitry and method calculate a change in the continuous voltage reading of the high voltage battery over the change in time and repeatedly calculate an optimum fixed time interval and an optimum change in voltage over time. Storage of the optimum fixed time interval and optimum change in voltage over time provides for repeatedly comparing the optimum change in voltage over the fixed time interval to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault. The calculation of the resistance of the dielectric breakdown fault is carried out independently of the capacitance of the electric circuit. The circuit and method provide adjustment of the optimum fixed time interval to improve the speed of the comparison of the optimum change in voltage over time to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault.
摘要翻译：提供了一种用于检测介质击穿和接地故障条件的改进的电路和方法。本发明的电路和方法包括对高电压电池进行连续电压读数，并以固定的时间间隔对高压电池的连续电压读数进行采样。电路和方法计算高压电池的连续电压读数随时间变化的变化，并重复计算最佳固定时间间隔和电压随时间的最佳变化。存储最佳固定时间间隔和电压随时间的最佳变化提供了将固定时间间隔内的最佳电压变化与高压电池的恒定电压进行重复比较，以计算电介质击穿故障的电阻。电介质击穿故障电阻的计算与电路的电容无关地进行。电路和方法提供最佳固定时间间隔的调整，以提高电压随时间的最佳变化与高压电池的恒定电压的比较的速度，以计算电介质击穿故障的电阻。

84. 发明申请

US20080230709A1 ENERGY DISCRIMINATING DETECTOR DIFFERENT MATERIALS DIRECT CONVERSION LAYERS 有权
标题翻译：能源鉴别检测器不同材料直接转换层
公开(公告)号：US20080230709A1
公开(公告)日：2008-09-25
申请号：US11690374
申请日：2007-03-23
申请人： J. Eric Tkaczyk , Wen Li , Yanfeng Du , James W. LeBlanc
发明人： J. Eric Tkaczyk , Wen Li , Yanfeng Du , James W. LeBlanc
IPC分类号： G01T1/24
CPC分类号： G01T1/249 , G01T1/242
摘要： A diagnostic imaging system includes a high frequency electromagnetic energy source that emits a beam of high frequency electromagnetic energy toward an object to be imaged. An energy discriminating (ED) detector receives high frequency electromagnetic energy emitted by the high frequency electromagnetic energy source. The ED detector includes a first direct conversion layer and a second direct conversion layer. The first direct conversion layer comprises a first direct conversion material and the second direct conversion layer comprises a second direct conversion material that is different from the first direct conversion material. A data acquisition system (DAS) is operably connected to the ED detector and a computer operably connected to the DAS.
摘要翻译：诊断成像系统包括向待成像对象发射高频电磁能束的高频电磁能源。能量识别（ED）检测器接收由高频电磁能源发出的高频电磁能。 ED检测器包括第一直接转换层和第二直接转换层。第一直接转换层包括第一直接转换材料，第二直接转换层包括不同于第一直接转换材料的第二直接转换材料。数据采集系统（DAS）可操作地连接到ED检测器和可操作地连接到DAS的计算机。

85. 发明申请

US20080181031A1 Data strobe synchronization circuit and method for double data rate, multi-bit writes 有权
公开(公告)号：US20080181031A1
公开(公告)日：2008-07-31
申请号：US12077878
申请日：2008-03-20
申请人： Christopher K. Morzano , Wen Li
发明人： Christopher K. Morzano , Wen Li
IPC分类号： G11C7/00
CPC分类号： G11C7/22 , G11C7/1066 , G11C7/1078 , G11C7/1087 , G11C7/1093 , G11C11/4076 , G11C11/4094
摘要： A data strobe synchronization circuit includes first and second logic circuits receiving global data strobe pulses and respective enable signal. A control circuit initially applies an enable signal to the first logic circuit so that the first logic circuit generates a first data strobe pulse responsive to each global data strobe pulse. The control circuit receives a write control signal. When the write control signal becomes active, the control circuit terminates the enable signal applied to the first logic circuit and applies an enable signal to the second logic circuit. The second logic circuit then generates a second data strobe pulse responsive to the next global data strobe pulse. The first and second data strobe pulses are used to latch a data signal in respective flip-flops. The data strobe pulses may latch the data signal in pairs of flip-flops on the leading and trailing edges of the data strobe pulses.

86. 发明授权

US07403590B2 CT detector photodiode having multiple charge storage devices 有权
标题翻译： CT检测器光电二极管具有多个电荷存储装置
公开(公告)号：US07403590B2
公开(公告)日：2008-07-22
申请号：US11780972
申请日：2007-07-20
申请人： George E. Possin , Jonathan D. Short , Wen Li
发明人： George E. Possin , Jonathan D. Short , Wen Li
IPC分类号： G01N23/083 , H05G1/64 , G01T1/24 , H01L27/14
CPC分类号： G01T1/2018 , A61B6/032
摘要： A CT detector includes a pixel having a single photodiode and multiple charge storage devices that are alternately stored and read out. The photodiode is a frontlit diode with a pair of capacitors that alternately store charge generated during data acquisition. Multiple pixels are connected to a single readout amplifier. Charge is continuously acquired from each photodiode and stored on the charge storage devices, but such readout is from a single charge storage device at a time. As such, each charge storage device is read out independently, but the charge storage devices are connected to a common readout channel or port.
摘要翻译： CT检测器包括具有单个光电二极管的像素和交替存储和读出的多个电荷存储装置。光电二极管是具有一对电容器的前照明二极管，其交替地存储在数据采集期间产生的电荷。多个像素连接到单个读出放大器。从每个光电二极管连续获取电荷并将其存储在电荷存储装置上，但这样的读出是从一个电荷存储装置一次。因此，每个电荷存储装置被独立地读出，但是电荷存储装置连接到公共读出通道或端口。

87. 发明授权

US07283609B2 CT detector photodiode having multiple charge storage devices 有权
标题翻译： CT检测器光电二极管具有多个电荷存储装置
公开(公告)号：US07283609B2
公开(公告)日：2007-10-16
申请号：US11164101
申请日：2005-11-10
申请人： George E. Possin , Jonathan D. Short , Wen Li
发明人： George E. Possin , Jonathan D. Short , Wen Li
IPC分类号： G01N23/083 , H05G1/64 , G01T1/24 , H01L27/14
CPC分类号： G01T1/2018 , A61B6/032
摘要： A CT detector includes a pixel having a single photodiode and multiple charge storage devices that are alternately stored and read out. The photodiode is a frontlit diode with a pair of capacitors that alternately store charge generated during data acquisition. Multiple pixels are connected to a single readout amplifier. Charge is continuously acquired from each photodiode and stored on the charge storage devices, but such readout is from a single charge storage device at a time. As such, each charge storage device is read out independently, but the charge storage devices are connected to a common readout channel or port.
摘要翻译： CT检测器包括具有单个光电二极管的像素和交替存储和读出的多个电荷存储装置。光电二极管是具有一对电容器的前照明二极管，其交替地存储在数据采集期间产生的电荷。多个像素连接到单个读出放大器。从每个光电二极管连续获取电荷并将其存储在电荷存储装置上，但这样的读出是从一个电荷存储装置一次。因此，每个电荷存储装置被独立地读出，但是电荷存储装置连接到公共读出通道或端口。

88. 发明授权

US07271209B2 Fibers and nonwovens from plasticized polyolefin compositions 有权
标题翻译：来自增塑聚烯烃组合物的纤维和无纺布
公开(公告)号：US07271209B2
公开(公告)日：2007-09-18
申请号：US10782306
申请日：2004-02-19
申请人： Wen Li , Chon-Yie Lin , Bryan R. Chapman , Michael B. Kelly
发明人： Wen Li , Chon-Yie Lin , Bryan R. Chapman , Michael B. Kelly
IPC分类号： C08K5/01 , C08L91/06 , C08G18/65
CPC分类号： C08L23/0815 , A61L2202/24 , C08F110/06 , C08F210/06 , C08K5/0016 , C08K5/01 , C08L23/10 , C08L23/12 , C08L23/16 , C08L23/18 , C08L23/20 , C08L23/22 , C08L57/00 , C08L91/00 , C08L2205/03 , C08L2314/06 , D04H1/4291 , Y10T442/60 , C08L2666/06 , C08L2666/02 , C08L53/00 , C08L2666/04 , C08F210/14 , C08F210/16
摘要： The present invention relates to fibers and nonwovens made from plasticized polyolefin compositions comprising a polyolefin and a non-functionalized hydrocarbon plasticizer.
摘要翻译：本发明涉及由包含聚烯烃和非官能化烃增塑剂的增塑聚烯烃组合物制成的纤维和无纺布。

89. 发明授权

US07267908B2 In cycling stability of Li-ion battery with molten salt electrolyte 有权
标题翻译：锂离子电池与熔盐电解液的循环稳定性
公开(公告)号：US07267908B2
公开(公告)日：2007-09-11
申请号：US11214159
申请日：2005-08-29
申请人： Wen Li , Hiroki Awano , Gerald Perron
发明人： Wen Li , Hiroki Awano , Gerald Perron
IPC分类号： H01M4/58 , H01M6/04
CPC分类号： H01M10/399 , H01M4/02 , H01M4/13 , H01M4/48 , H01M4/52 , H01M2010/4292
摘要： An example battery according to an embodiment of the present invention includes a positive electrode, a negative electrode, and an electrolyte. The positive electrode comprises a positive active material, and has a positive electrode area and a positive electrode capacity. The negative electrode comprises a negative active material, and has a negative electrode area and a negative electrode capacity. The battery has an electrode area ratio equal to the positive electrode area divided by the negative electrode area, and an electrode capacity ratio equal to the positive electrode capacity divided by the negative electrode capacity. In an example battery, the electrode area ratio is at least approximately one, and/or the electrode capacity ratio is at least approximately one.
摘要翻译：根据本发明实施例的示例性电池包括正极，负极和电解质。正极包含正极活性物质，具有正极面积和正极容量。负极包含负极活性物质，具有负极面积和负极容量。电池的电极面积比等于正极面积除以负极面积，电极容量比等于正极容量除以负极容量。在示例性电池中，电极面积比至少约为1，和/或电极容量比至少约为1。

90. 发明申请

US20070036421A1 Method and apparatus for inspecting defects of semiconductor device 失效
标题翻译：用于检查半导体器件缺陷的方法和装置
公开(公告)号：US20070036421A1
公开(公告)日：2007-02-15
申请号：US11500979
申请日：2006-08-09
申请人： Tadanobu Toba , Shuji Kikuchi , Yuichi Sakurai , Wen Li
发明人： Tadanobu Toba , Shuji Kikuchi , Yuichi Sakurai , Wen Li
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , G06T2207/30148
摘要： When an inspection apparatus of a semiconductor device repeatedly executes computation of prescribed area data, such as image processing for detecting defects, procedures for commanding, data load, computation, and data store need to be repeated the number of times of the computation. This may impose a limitation on the speeding up of the operation. In addition, when performing parallel computation by a high-capacity image processing system for handling minute images, a lot of processors are needed, resulting in an increase in cost. In order to solve the above-mentioned problems, in the invention, an inspection apparatus of a semiconductor device includes a data memory including an access section which is capable of reading and writing simultaneously, a plurality of numerical computation units, a connector for connecting the data memory and the numerical computation units, a controller for collectively controlling the contents of processing by the plurality of numerical computation units, another connector for connecting the numerical computation units and the controller, and a data transfer controller for controlling data transfer between the numerical computation units.
摘要翻译：当半导体装置的检查装置重复执行规定区域数据的计算时，例如用于检测缺陷的图像处理，命令，数据加载，计算和数据存储的过程需要重复计算次数。这可能对操作的加速施加限制。此外，当通过大容量图像处理系统执行并行计算以处理微小图像时，需要许多处理器，导致成本增加。为了解决上述问题，在本发明中，半导体装置的检查装置包括数据存储器，该数据存储器包括能够同时读写的访问部分，多个数值计算单元，连接器数据存储器和数值计算单元，用于共同控制多个数值计算单元的处理内容的控制器，用于连接数值计算单元和控制器的另一连接器，以及用于控制数值计算之间的数据传送的数据传输控制器单位。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式