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81. 发明申请

US20110290441A1 HEADBOX FOR A MACHINE FOR PRODUCING A FIBROUS WEB 失效
标题翻译：用于制造纤维网的机器的头架
公开(公告)号：US20110290441A1
公开(公告)日：2011-12-01
申请号：US13151036
申请日：2011-06-01
申请人： Wolfgang Ruf , Konstantin Ferkl , Markus Iläussler , Klaus Lehleiter
发明人： Wolfgang Ruf , Konstantin Ferkl , Markus Iläussler , Klaus Lehleiter
IPC分类号： D21F1/18
CPC分类号： D21F1/02 , D21F1/022
摘要： The invention relates to a headbox for a machine for producing a fibrous web, especially a paper or cardboard web, from at least one fiber suspension, comprising a feed device feeding the at least one fiber suspension, a perforated distribution pipe plate arranged immediately downstream thereof and having a plurality of channels arranged in lines and columns, an intermediate channel arranged downstream thereof, extending over the width of the headbox and having a plurality of means for dosing a fluid in partial fluid streams to the at least one fiber suspension in a preferably adjustable/controlled manner, the means being spaced apart from each other in the width direction of the headbox and the individual means comprising a plurality of dosing channels having respective dosing channel openings on the outlet side and a dosing channel length, arriving at different levels and being connected to a common supply channel. The headbox according to the invention is characterized in that the dosing channel length of the dosing channel is 1.5 times longer than the dosing channel opening of the dosing channel on the outlet side and in that the distance of the dosing channel opening of the dosing channel on the outlet side to the turbulence generator ranges from 0 to 50 mm.
摘要翻译：本发明涉及一种用于从至少一个纤维悬浮液生产纤维幅材，特别是纸或纸板幅材的机器的流浆箱，其包括供给至少一种纤维悬浮液的进料装置，紧邻其下游布置的穿孔分配管板并且具有以行和列布置的多个通道，布置在其下游的中间通道，其在所述流浆箱的宽度上延伸并且具有多个用于将部分流体流中的流体计量给所述至少一个纤维悬浮液的装置，优选地该装置在流浆箱的宽度方向上彼此间隔开，并且各个装置包括多个计量通道，其具有出口侧上的相应配量通道开口和达到不同水平的配量通道长度，连接到公共供应通道。根据本发明的流浆箱的特征在于，计量通道的计量通道长度比出口侧的计量通道的计量通道开口长1.5倍，并且计量通道的计量通道开口的距离湍流发生器的出口侧范围为0至50 mm。

82. 发明授权

US07752510B2 Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit 失效
标题翻译：用于简化并行测试的集成设备，用于测试多个集成设备的测试板，以及测试系统和测试仪单元
公开(公告)号：US07752510B2
公开(公告)日：2010-07-06
申请号：US11684533
申请日：2007-03-09
申请人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
发明人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
IPC分类号： G01R31/28 , G01R31/26 , G11C29/00
CPC分类号： G01R31/3172 , G01R31/31926 , G01R31/31935
摘要： An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
摘要翻译：集成装置包括功能电路，用于测试功能电路并提供错误数据项的测试电路和用于存储错误数据项的寄存器元件，并用于在集成器件的错误数据输出端输出错误数据项到输出信号。寄存器元件连接到集成器件的数据输入，以便响应于输出信号接受应用于数据输入的数据项。

83. 发明授权

US07428662B2 Testing a data store using an external test unit for generating test sequence and receiving compressed test results 失效
标题翻译：使用外部测试单元测试数据存储，以生成测试序列并接收压缩测试结果
公开(公告)号：US07428662B2
公开(公告)日：2008-09-23
申请号：US10478403
申请日：2002-05-15
申请人： Alexander Benedix , Reinhard Düregger , Robert Hermann , Wolfgang Ruf
发明人： Alexander Benedix , Reinhard Düregger , Robert Hermann , Wolfgang Ruf
IPC分类号： G06F11/00 , G06F11/277
CPC分类号： G11C29/40 , G11C29/48
摘要： Disclosed is a test method for testing a data store having an integrated test data compression circuit where the data store has a memory cell array with a multiplicity of addressable memory cells, read/write amplifiers for reading and writing data to the memory cell via an internal data bus in the data store and a test data compression circuit which compresses test data sequences, which are each read serially from the memory cell array, with stored reference test data sequences in order to produce a respective indicator data item which indicates whether at least one data error has occurred in the test data sequence which has been read.
摘要翻译：公开了一种用于测试具有集成测试数据压缩电路的数据存储器的测试方法，其中数据存储器具有具有多个可寻址存储器单元的存储单元阵列，用于经由内部存储器单元向存储器单元读取和写入数据的读/写放大器数据存储器中的数据总线和压缩从存储单元阵列中串行读取的测试数据序列的测试数据压缩电路与存储的参考测试数据序列一起，以产生相应的指示符数据项，该指示符数据项指示是否至少一个已经读取的测试数据序列中发生了数据错误。

84. 发明申请

US20070258307A1 MEMORY CIRCUIT AND METHOD FOR REFRESHING DYNAMIC MEMORY CELLS 审中-公开
标题翻译：用于刷新动态记忆细胞的记忆电路和方法
公开(公告)号：US20070258307A1
公开(公告)日：2007-11-08
申请号：US11742572
申请日：2007-04-30
申请人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
发明人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
IPC分类号： G11C7/00
CPC分类号： G11C11/406 , G11C11/40615 , G11C11/40622
摘要： A memory circuit comprises a memory cell array with dynamic memory cells arranged on word lines and bit lines, a selection unit providing selection information and a refresh circuit selecting the memory cells in each case in dependence on the selection information and refreshing the selected memory cells so that any information stored therein is retained in each case.
摘要翻译：存储器电路包括具有布置在字线和位线上的动态存储器单元的存储单元阵列，提供选择信息的选择单元和根据选择信息选择存储单元的刷新电路，并刷新所选择的存储器单元在每种情况下保留其中存储的任何信息。

85. 发明申请

US20070226591A1 INTEGRATED DEVICE FOR SIMPLIFIED PARALLEL TESTING, TEST BOARD FOR TESTING A PLURALITY OF INTEGRATED DEVICES, AND TEST SYSTEM AND TESTER UNIT 失效
标题翻译：用于简化并行测试的集成设备，用于测试多个集成设备的测试板，以及测试系统和测试单元
公开(公告)号：US20070226591A1
公开(公告)日：2007-09-27
申请号：US11684533
申请日：2007-03-09
申请人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
发明人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
IPC分类号： G11C29/00
CPC分类号： G01R31/3172 , G01R31/31926 , G01R31/31935
摘要： An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
摘要翻译：集成装置包括功能电路，用于测试功能电路并提供错误数据项的测试电路和用于存储错误数据项的寄存器元件，并用于在集成器件的错误数据输出端输出错误数据项到输出信号。寄存器元件连接到集成器件的数据输入，以便响应于输出信号接受应用于数据输入的数据项。

86. 发明授权

US07221617B2 Backwards-compatible memory module 有权
标题翻译：向后兼容内存模块
公开(公告)号：US07221617B2
公开(公告)日：2007-05-22
申请号：US11127536
申请日：2005-05-12
申请人： Bjorn Flach , Monica De Castro Martins , Wolfgang Ruf , Martin Schnell
发明人： Bjorn Flach , Monica De Castro Martins , Wolfgang Ruf , Martin Schnell
IPC分类号： G11C8/00
CPC分类号： G11C7/1078 , G11C7/1045 , G11C7/1051 , G11C7/1066 , G11C7/1072 , G11C7/22 , G11C11/4096 , G11C2207/107
摘要： A backwards-compatible memory module is disclosed. According to one aspect, a memory module comprises addressable memory cells organized in organization units having a predetermined number of memory cells, a read/write control device clocked by a first clock signal, a plurality of prefetch registers for initially storing data read from the memory cells wherein the register size corresponds to the predetermined number. In a first operating mode, a switching device clocked by a second clock signal successively couples the prefetch registers to data input/output terminals. The number of data input/output terminals corresponds to the predetermined number. In a second operating mode, the switching device is controlled by at least one address signal and couples at least one of the prefetch registers to the data input/output terminals.
摘要翻译：公开了向后兼容的存储器模块。根据一个方面，一种存储器模块包括以具有预定数量的存储器单元的组织单元组织的可寻址存储器单元，由第一时钟信号定时的读/写控制装置，用于初始存储从存储器读取的数据的多个预取寄存器其中寄存器大小对应于预定数量的单元。在第一操作模式中，由第二时钟信号计时的开关器件将预取寄存器连续地耦合到数据输入/输出端子。数据输入/输出端子的数量对应于预定数量。在第二操作模式中，开关装置由至少一个地址信号控制，并将预取寄存器中的至少一个耦合到数据输入/输出端子。

87. 发明授权

US06895538B2 Method for testing a device and a test configuration including a device with a test memory 有权
标题翻译：用于测试设备的方法和包括具有测试存储器的设备的测试配置
公开(公告)号：US06895538B2
公开(公告)日：2005-05-17
申请号：US09907694
申请日：2001-07-18
申请人： Alexander Benedix , Henning Hartmann , Reinhard Düregger , Wolfgang Ruf
发明人： Alexander Benedix , Henning Hartmann , Reinhard Düregger , Wolfgang Ruf
IPC分类号： G11C29/44 , H01L23/544 , G11C29/00
CPC分类号： H01L23/544 , G11C29/44 , H01L2223/54473 , H01L2924/0002 , H01L2924/00
摘要： A test configuration that includes a device and a method for testing the device in which test results determined during the testing of the device are stored in a memory in the device. In this way, the test results are connected with the device and available at any time for later evaluations.
摘要翻译：包括用于测试设备的测试配置和测试设备的方法，其中在设备测试期间确定测试结果被存储在设备中的存储器中。以这种方式，测试结果与设备连接，随时可用于以后的评估。

88. 发明授权

US06890408B2 Headbox for the metered addition of a fluid medium into a suspension stream 失效
标题翻译：用于将流体介质计量加入到悬浮液流中的流浆箱
公开(公告)号：US06890408B2
公开(公告)日：2005-05-10
申请号：US10226260
申请日：2002-08-23
申请人： Wolfgang Ruf , Hans Loser , Klaus Lehleiter
发明人： Wolfgang Ruf , Hans Loser , Klaus Lehleiter
IPC分类号： D21F1/02 , D21F1/06 , D21F1/08 , D21F1/00
CPC分类号： D21F1/022 , D21F1/02 , D21F1/026 , D21F1/06 , D21F1/08
摘要： Headbox for one of a paper and cardboard machine includes at least one material suspension supply running a width of the machine. At least one turbulence producer has at least one conduit through which a material suspension flows. At least one metered addition point is located in the conduit for introducing a fluid medium. A headbox nozzle is located downstream from the at least one turbulence producer for delivering the material suspension. A portion of a flow resistance located downstream of the metered addition point is at least approximately 50% of a total flow resistance of the at least one conduit.
摘要翻译：用于纸和纸板机之一的流浆箱包括运行机器宽度的至少一种材料悬挂供应。至少一个湍流发生器具有至少一个导管，材料悬浮液通过该导管流动。至少一个计量加法点位于用于引入流体介质的管道中。流浆箱喷嘴位于至少一个湍流发生器的下游，用于输送材料悬浮液。位于计量加法点下游的流动阻力的一部分至少为至少一个导管的总流阻的50％。

89. 发明授权

US06819606B2 Method for storing data in a memory device with the possibility of access to redundant memory cells 有权
标题翻译：将数据存储在具有访问冗余存储单元的可能性的存储器件中的方法
公开(公告)号：US06819606B2
公开(公告)日：2004-11-16
申请号：US10339031
申请日：2003-01-09
申请人： Alexander Benedix , Stefan Dankowski , Reinhard Dueregger , Wolfgang Ruf
发明人： Alexander Benedix , Stefan Dankowski , Reinhard Dueregger , Wolfgang Ruf
IPC分类号： G11C700
CPC分类号： G11C29/70
摘要： A method is provided for storing data in a memory device having memory cells arranged in memory cell rows and memory cell columns. The method can include a step for providing redundant memory cells in the memory device. The method can also include a step for localizing defective cells. Further, the method can include a step of accessing the redundant memory cells by means of a predeterminable access mode. The method can also include a step of bypassing defective memory cells of the memory device in a manner dependent on the predeterminable access mode during operation of the memory device for accessing redundant memory cells and for replacement by redundant memory cells. Further, the method can include a step for providing redundant memory cells for storing additional information describing a defect correction.
摘要翻译：提供了一种用于将数据存储在具有布置在存储单元行和存储单元列中的存储单元的存储器件中的方法。该方法可以包括在存储器件中提供冗余存储器单元的步骤。该方法还可以包括用于定位缺陷单元的步骤。此外，该方法可以包括通过可预定访问模式访问冗余存储器单元的步骤。该方法还可以包括在存储器设备的操作期间以取决于可预定访问模式的方式绕过存储器件的有缺陷的存储单元的步骤，用于访问冗余存储器单元并由冗余存储器单元替换。此外，该方法可以包括用于提供用于存储描述缺陷校正的附加信息的冗余存储器单元的步骤。

90. 发明授权

US06777924B2 Method and magazine device for testing semiconductor devices 失效
标题翻译：半导体器件测试方法和杂志设备
公开(公告)号：US06777924B2
公开(公告)日：2004-08-17
申请号：US10377348
申请日：2003-02-28
申请人： Björn Flach , Wolfgang Ruf , Martin Schnell , Jörg Stippler , Andreas Logisch
发明人： Björn Flach , Wolfgang Ruf , Martin Schnell , Jörg Stippler , Andreas Logisch
IPC分类号： G01R104
CPC分类号： G01R31/2853
摘要： A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.
摘要翻译：一种方法和装置允许在可编程测试装置上测试功能上相同的半导体器件。半导体器件被放置在盒装置中，并且针对不同类型的封装件的类似的半导体器件提供了相对于测试装置的统一的盒子接口。半导体器件有利地在测试装置上一个接一个地测试，基本上不依赖于它们的封装类型，并且在测试装置上不需要任何机械转换。

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