会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 82. 发明授权
    • Multiprocessor system for locally managing address translation table
    • 用于本地管理地址转换表的多处理器系统
    • US5649141A
    • 1997-07-15
    • US497447
    • 1995-06-30
    • Takeshi Yamazaki
    • Takeshi Yamazaki
    • G06F15/16G06F12/02G06F12/10G06F15/177
    • G06F12/1072G06F12/0284
    • An address translation technique used in a multiprocessor system is disclosed. In a multiprocessor system for connecting a plurality of clusters with each other via a network, each of these clusters is arranged by comprising a plurality of processors; a cluster translator for translating a cluster number; a cluster translation table for storing therein a correspondence relationship between a logical cluster number and a physical cluster number; an address translator for translating an address; and an address translation table for storing therein a correspondence relationship between a logical address and a physical address. The address translation table stores only the data corresponding to a memory employed in the cluster. Accordingly, a total storage capacity of the address translation tables is reduced, and an updating operation of the address translation tables is simplified. Furthermore, the address translation table is exclusively identified based on a local job number and the cluster number, so that operation to update the address translation table is simplified.
    • 公开了一种在多处理器系统中使用的地址转换技术。 在用于经由网络将多个集群彼此连接的多处理器系统中,通过包括多个处理器来布置这些集群中的每一个; 用于翻译簇号的群集翻译器; 集群转换表,用于在其中存储逻辑簇号和物理簇号之间的对应关系; 用于翻译地址的地址转换器; 以及用于在其中存储逻辑地址和物理地址之间的对应关系的地址转换表。 地址转换表仅存储与集群中使用的存储器相对应的数据。 因此,减少了地址转换表的总存储容量,并简化了地址转换表的更新操作。 此外,地址转换表是基于本地作业号和簇号唯一地标识的,因此简化了更新地址转换表的操作。
    • 83. 发明授权
    • Optical pick-up apparatus with holographic optical element to diffract
both forward and return light beams
    • 具有全息光学元件的光学拾取装置,用于衍射光束和反射光束
    • US5648946A
    • 1997-07-15
    • US341087
    • 1994-11-17
    • Takeshi Yamazaki
    • Takeshi Yamazaki
    • G11B7/09G11B7/12G11B7/13G11B7/135
    • G11B7/1353G11B7/0943G11B7/123G11B7/131G11B7/0903G11B7/0909G11B7/0912
    • An optical pick-up apparatus for recording and/or reading information on and/or from an optical record medium including a semiconductor substrate, a semiconductor laser arranged on the semiconductor substrate, plurality of photodetectors formed in the surface of the semiconductor substrate, a diffraction gratings dividing a laser beam into main beam and two sub-beams, an objective lens projecting the main and sub-beams onto the record medium and directing these beams reflected by the record medium toward a hologram which diffracts each of the main and sub-beams into .+-.1-order beams which are received by the photodetectors. The apparatus is constructed to satisfy the following conditions:NA.multidot.d d/.beta..sup.2 >0.01 mmwherein L mm is a distance between a spot of the main beam and a spot of a sub-beam on the record medium, NA is a numerical aperture of the objective lens on a side of the semiconductor laser, .beta. is a magnification of the objective lens viewed from the record medium to the semiconductor laser and d is a deviation of focal points of +1-order beams and -1-order beams viewed along an optical axis.
    • 一种光学拾取装置,用于在包括半导体衬底的光学记录介质和布置在半导体衬底上的半导体激光器,在半导体衬底的表面中形成的多个光电检测器,和/ 将激光束分成主光束和两个子光束的光栅,物镜将主光束和子光束投影到记录介质上,并将这些由记录介质反射的光束引向全息图,衍射各主光束和副光束 由光电检测器接收的+/- 1级光束。 该装置被构造成满足以下条件:NAxd <|Lxβ| 0.04mm> d /β2> 0.01mm其中L mm是主波束的点与记录上的子光束点之间的距离 介质NA是半导体激光器一侧的物镜的数值孔径,β是从记录介质到半导体激光器的物镜的倍率,d是+ 1级光束的焦点偏差 和沿光轴观察的-1级光束。
    • 84. 发明授权
    • Optical pick-up apparatus having hologram and beam splitter with
birefringent member and polarizing film
    • 具有全息图的光学拾取装置和具有双折射元件和偏光膜的分束器
    • US5621714A
    • 1997-04-15
    • US400757
    • 1995-03-08
    • Shohei KobayashiTakeshi YamazakiHiroyuki Imabayashi
    • Shohei KobayashiTakeshi YamazakiHiroyuki Imabayashi
    • G11B7/09G11B7/12G11B7/125G11B7/13G11B7/135G11B11/105G11B7/00
    • G11B7/1356G11B11/10543G11B7/124G11B7/126G11B7/127G11B7/131G11B7/1353G11B11/10576G11B7/09
    • An optical pick-up apparatus for reproducing information recorded on a magneto-optical record medium including a semiconductor laser emitting a linearly polarized laser beam, and a polarizing film provided between a glass prism and a uniaxial birefringent crystal prism. The laser beam emitted by the semiconductor laser is made incident upon the polarizing film via the glass prism and is reflected thereby. The apparatus further includes an objective lens projecting the laser beam reflected by the polarizing film onto the magneto-optical record medium as a fine spot and converging a return laser beam reflected by the record medium toward the polarizing film. The return beam transmitted through the polarizing film is refracted by the uniaxial birefringent crystal prism and is divided into ordinary light and extraordinary light, which are received by a first photodetector to produce a reproduced information signal. The return beam reflected by the polarizing film is made incident upon a hologram and is diffracted thereby into .+-.1-order beams which are received by a second photodetector to produce a focusing error signal and a tracking error signal.
    • 一种用于再现记录在包括发射线性偏振激光束的半导体激光器的磁光记录介质上的信息的光学拾取装置,以及设置在玻璃棱镜和单轴双折射晶体棱镜之间的偏振膜。 由半导体激光器发射的激光束经由玻璃棱镜入射到偏振膜上并被反射。 该装置还包括将由偏振膜反射的激光束投影到磁光记录介质上的物镜作为细微点,并将由记录介质反射的返回激光束会聚到偏振膜。 透过偏光膜的返回光束被单轴双折射晶体棱镜折射,分为普通的光和非常的光,由第一光电检测器接收以产生再现的信息信号。 由偏振膜反射的返回光束入射到全息图上,并被衍射为由第二光电检测器接收的+/- 1次光束,以产生聚焦误差信号和跟踪误差信号。
    • 85. 发明授权
    • Optical pick-up apparatus with tracking error detection by detection of
amount of light in fan field
    • 通过在风扇场中检测光量来检测跟踪误差的光学拾取装置
    • US5608695A
    • 1997-03-04
    • US337190
    • 1994-11-07
    • Takeshi Yamazaki
    • Takeshi Yamazaki
    • G11B7/09G11B7/12G11B7/135H01S5/022H01S5/183
    • G11B7/1353G11B7/0901G11B7/123G11B7/0912H01S5/02296H01S5/0264H01S5/183
    • An optical pick-up apparatus for reading and/or writing information from and/or on an optical record medium including a semiconductor laser, an objective lens projecting a laser beam onto the optical record medium, a hologram optical element having a first hologram for diffracting the laser beam onto a first pair of photodetectors to derive a focusing error and a second hologram for diffracting the laser beam onto a second pair of photodetectors to derive a tracking error. Each of the photodetectors of the second pair has light receiving regions which are divided along a division line substantially parallel with a diffracting direction of the second hologram which introduces astigmatism into the diffracted beams. A large tracking error signal can be detected stably on the basis of a distribution of an amount of light in a far field by the push-pull method.
    • 一种光学拾取装置,用于从包括半导体激光器的光学记录介质和/或将光学记录介质上的激光束投影的物镜读取和/或写入信息,具有用于衍射的第一全息图的全息光学元件 激光束到第一对光电检测器上以导出聚焦误差和第二全息图,用于将激光束衍射到第二对光电检测器上以导出跟踪误差。 第二对的每个光电检测器具有沿着与第二全息图的衍射方向大致平行的分割线分割的光接收区域,该散射方向将散光引入衍射光束。 基于通过推挽法在远场中的光量的分布,可以稳定地检测大的跟踪误差信号。
    • 86. 发明授权
    • Method for manufacturing MOS transistors with high breakdown voltage
    • 具有高击穿电压的MOS晶体管的制造方法
    • US5523248A
    • 1996-06-04
    • US447008
    • 1995-05-22
    • Takeshi Yamazaki
    • Takeshi Yamazaki
    • H01L21/8234H01L27/088H01L21/265
    • H01L21/823493H01L27/088
    • A semiconductor device in which low voltage elements and high voltage elements are formed on the same substrate. To simplify the manufacturing process of semiconductor devices and to improve the punch through voltage resistance between elements, when high voltage elements and low voltage elements are formed on the same semiconductor substrate, during the process for injecting p-type impurity into semiconductor substrate in the low voltage sections, at first a mask pattern having openings above the low voltage sections and openings above the element separating areas of the high voltage sections is formed, then p-type impurity is injected into the semiconductor substrate from above the mask pattern, followed by heat-treatment of the semiconductor substrate to diffuse p-type impurity into the semiconductor substrate. Thereby, channel stop diffusion layers comprising p-type impurity layer are formed under the element separating areas formed in the high voltage sections.
    • 在同一衬底上形成低电压元件和高电压元件的半导体器件。 为了简化半导体器件的制造过程,并且通过在同一半导体衬底上形成高电压元件和低电压元件,提高元件之间的穿通电压电阻,在将p型杂质注入到半导体衬底中的过程中 首先,形成具有在低压部分之上的开口的掩模图案,并且形成在高压部分的元件分离区域上方的开口,然后将p型杂质从掩模图案上方注入到半导体衬底中,随后加热 处理半导体衬底以将p型杂质扩散到半导体衬底中。 由此,在形成于高压部的元件分离区域的下方形成包含p型杂质层的沟道阻挡扩散层。
    • 87. 发明授权
    • Ellipsometer and method of controlling coating thickness therewith
    • 椭偏仪及其控制涂层厚度的方法
    • US5438415A
    • 1995-08-01
    • US927410
    • 1992-09-22
    • Akira KazamaTakahiko OshigeYoshiro YamadaTakeo YamadaTakeshi YamazakiTakamitsu TakayamaShuichiro Nomura
    • Akira KazamaTakahiko OshigeYoshiro YamadaTakeo YamadaTakeshi YamazakiTakamitsu TakayamaShuichiro Nomura
    • G01B11/06
    • G01B11/065
    • An ellipsometer has a nonpolarization beam splitter (18) for dividing reflected light (17) from an object to be measured (16) into portions traveling along first and second optical paths (18a, 18b), an analyzer (19) for passing the polarized light component in a reference direction of the reflected light portion traveling along the first optical path, and a polarization beam splitter (20) for dividing the reflected light portion traveling along the second optical path into two polarized light components in different directions with respect to the reference direction. The light beams passing through the analyzer (19) and polarization beam splitter (20) are sensed by first, second and third photodetectors (21a, 21b, 21c), respectively. In a coating thickness control method, first and second ellipsometers (35a, 35b) are placed before and after a coating apparatus (36) provided along the transport path of a belt-like plate to be coated (31). A first ellipsoparameter (.DELTA.1,.psi.1) for the surface of the plate before coating is obtained with the first ellipsometer (35a). A second ellipsoparameter (.DELTA.2,.psi.2) for the surface of the plate after coating is obtained with the second ellipsometer (35b). The coating apparatus (36) controls the coating thickness (d) based on the difference between the first and second ellipsoparameters.
    • PCT No.PCT / JP92 / 00067 Sec。 371日期:1992年9月22日 102(e)1992年9月22日PCT PCT 1992年1月27日PCT公布。 公开号WO92 / 14119 日期为1992年8月20日。椭偏仪具有用于将反射光(17)从被测量物体(16)分离成沿着第一和第二光路(18a,18b)行进的部分的非极化分束器(18) (19),用于沿着沿着第一光路行进的反射光部分的参考方向使偏振光分量通过;以及偏振分束器(20),用于将沿着第二光路行进的反射光部分分成两个偏振光分量 在相对于参考方向的不同方向上。 通过分析器(19)和偏振分束器(20)的光束分别由第一,第二和第三光电检测器(21a,21b,21c)检测。 在涂布厚度控制方法中,在沿着要涂覆的带状板(31)的传送路径设置的涂布装置(36)之前和之后放置第一和第二椭偏仪(35a,35b)。 用第一椭偏仪(35a)获得用于涂覆前的板表面的第一椭圆参数(DELTA 1,psi 1)。 用第二椭偏仪(35b)获得用于涂覆后的板表面的第二椭圆参数(DELTA 2,psi 2)。 涂布装置(36)基于第一和第二椭圆参数之间的差来控制涂层厚度(d)。
    • 88. 发明授权
    • Focus error detecting apparatus
    • 聚焦误差检测装置
    • US5233444A
    • 1993-08-03
    • US556363
    • 1990-07-24
    • Toru MushaTakeshi Yamazaki
    • Toru MushaTakeshi Yamazaki
    • G02B7/32G11B7/09G11B7/12
    • G02B7/32G11B7/0909G11B7/123
    • A focus error detecting apparatus in which a light emitting and receiving element including a light emitting portion and light receiving portions all of which are formed in a common semiconductor substrate, a hologram element diffracts a light beam reflected by an object to generate plus and minus first-order diffraction light beams and to introduce an astigmatism into the plus and minus first-order diffraction light beams such that shapes of spots of the diffraction light beams formed on the light receiving portions of the light emitting and receiving element vary into substantially reverse directions to each other, and a focusing condition is detected in accordance with outputs of the light receiving portions. Therefore, in this apparatus, positioning adjustment of the light receiving portions with respect to the light emitting portion is not necessary, and thus a number of the adjusting process can be remarkably decreased and the cost for manufacturing the apparatus can be reduced. Furthermore, the focusing condition can be detected with high accuracy.
    • 一种聚焦误差检测装置,其中包括发光部分和光接收部分的发光和接收元件全部都形成在公共半导体衬底中,全息元件衍射由对象反射的光束,以产生正负第一 并且在正负衍射光束中引入像散,使得形成在发光和接收元件的光接收部分上的衍射光束的斑点的形状基本上相反地变化到 并且根据光接收部的输出来检测聚焦条件。 因此,在该装置中,光接收部相对于发光部的定位调整不是必需的,因此能够显着地减少调整处理的次数,能够降低制造装置的成本。 此外,可以高精度地检测聚焦条件。