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    • 83. 发明授权
    • Focus defecting system
    • 焦点缺陷系统
    • US3937950A
    • 1976-02-10
    • US459219
    • 1974-04-08
    • Kazuya HosoeSeiichi MatsumotoHideo YokotaHiroshi Aizawa
    • Kazuya HosoeSeiichi MatsumotoHideo YokotaHiroshi Aizawa
    • G03B13/36G02B7/36G01J1/20
    • G02B7/36
    • A system for detecting the distinction of the object image characterized in that respectively on a photoelectric transducing element presenting electrodes on both extremities along the longer sides of a photoelectric semiconductor presenting considerably short sides as compared with the long sides and on a photoelectric transducing element presenting electrodes on both extremities along the shorter sides of a photoelectric semiconductor presenting considerably short sides as compared with the long sides an object image is formed by means of an optics and that the distinction of the above mentioned object image is detected by detecting the electric characteristics variable corresponding to the distinction of the above mentioned object image, of each of the above mentioned photoelectric transducing elements.
    • 一种用于检测对象图像的区别的系统,其特征在于,分别在光电转换元件上呈现与长边相比呈现相当短边的光电半导体的两侧的两端的电极和呈现电极的光电换能元件 在与长边相比,通过光学元件形成物体图像的情况下,沿着具有相当短边的光电半导体的短边的两个末端上的物体图像,并且通过检测上述目标图像的电特性变量来检测上述目标图像的区别 对上述光电转换元件的上述目标图像的区别。