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    • 84. 发明授权
    • Multi-layer, multi-material fabrication methods for producing micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties
    • 用于生产具有增强的电和/或机械性能的微尺度和毫米级装置的多层多材料制造方法
    • US08613846B2
    • 2013-12-24
    • US12906970
    • 2010-10-18
    • Ming Ting WuRulon Joseph Larsen, IIIYoung KimKieun KimAdam L. CohenAnanda H. KumarMichael S. LockardDennis R. Smalley
    • Ming Ting WuRulon Joseph Larsen, IIIYoung KimKieun KimAdam L. CohenAnanda H. KumarMichael S. LockardDennis R. Smalley
    • C25D5/02C25D5/10
    • G01R1/06716B33Y10/00C23C18/1605C23C18/1651C25D1/003G01R1/06744G01R1/06755G01R3/00H01L21/4853
    • Some embodiments of the invention are directed to electrochemical fabrication methods for forming structures or devices (e.g. microprobes for use in die level testing of semiconductor devices) from a core material and a shell or coating material that partially coats the surface of the structure. Other embodiments are directed to electrochemical fabrication methods for producing structures or devices (e.g. microprobes) from a core material and a shell or coating material that completely coats the surface of each layer from which the probe is formed including interlayer regions. Additional embodiments of the invention are directed to electrochemical fabrication methods for forming structures or devices (e.g. microprobes) from a core material and a shell or coating material wherein the coating material is located around each layer of the structure without locating the coating material in inter-layer regions. Each of these groups of embodiments incorporate both the core material and the coating material during the formation of each layer and each layer is also formed with a sacrificial material that is removed after formation of all layers of the structure. In some embodiments the core material may be a genuine structural material while in others it may be only a functional structural material (i.e. a material that would be removed with sacrificial material if it were accessible by an etchant during removal of sacrificial material.
    • 本发明的一些实施方案涉及用于从芯材料和部分涂覆结构表面的壳或涂层材料形成结构或器件(例如用于半导体器件的晶片级测试的微探针)的电化学制造方法。 其它实施方案涉及用于从芯材和壳或涂层材料制造结构或器件(例如微探针)的电化学制造方法,其完全涂覆形成探针的每个层的表面,包括中间层区域。 本发明的另外的实施方案涉及用于从核心材料和壳或涂层材料形成结构或器件(例如微针)的电化学制造方法,其中涂层材料围绕结构的每一层定位,而不将涂层材料定位在相互之间, 层区域。 这些实施例组中的每一个在形成每个层期间都包括芯材料和涂层材料,并且每个层还形成有牺牲材料,该牺牲材料在形成所述结构的所有层之后被去除。 在一些实施例中,芯材料可以是真正的结构材料,而在其它实施例中,其可以仅是功能性结构材料(即,如果在去除牺牲材料期间可通过蚀刻剂获得牺牲材料,则该材料将被除去。
    • 87. 发明授权
    • Electrochemical fabrication process for forming multilayer multimaterial microprobe structures
    • 用于形成多层多材料微探针结构的电化学制造工艺
    • US07531077B2
    • 2009-05-12
    • US11029221
    • 2005-01-03
    • Adam L. CohenAnanda H. KumarMichael S. LockardDennis R. Smalley
    • Adam L. CohenAnanda H. KumarMichael S. LockardDennis R. Smalley
    • C25D5/02
    • G01R1/06716B33Y10/00C23C18/1605C23C18/1651C25D1/003G01R1/0483G01R1/07357G01R31/2886
    • Some embodiments of the invention are directed to the electrochemical fabrication of microprobes which are formed from a core material and a material that partially coats the surface of the probe. Other embodiments are directed to the electrochemical fabrication of microprobes which are formed from a core material and a material that completely coats the surface of each layer from which the probe is formed including interlayer regions. These first two groups of embodiments incorporate both the core material and the coating material during the formation of each layer. Still other embodiments are directed to the electrochemical fabrication of microprobe arrays that are partially encapsulated by a dielectric material during a post layer formation coating process. In even further embodiments, the electrochemical fabrication of microprobes from two or more materials may occur by incorporating a coating material around each layer of the structure without locating the coating material in inter-layer regions.
    • 本发明的一些实施方案涉及由芯材料和部分涂覆探针的表面的材料形成的微针的电化学制造。 其它实施方案涉及由核心材料形成的微结构的电化学制造,以及完全涂覆形成探针的每个层的表面的材料,包括中间层区域。 这些前两组实施例在形成每个层期间都包括芯材料和涂层材料。 其他实施例涉及在后层形成涂覆工艺期间由电介质材料部分封装的微探针阵列的电化学制造。 在甚至进一步的实施方案中,来自两种或更多种材料的微结构的电化学制造可以通过在结构的每一层周围并入涂层材料而不将涂层材料定位在层间区域中而进行。
    • 89. 发明申请
    • Non-Conformable Masks and Methods and Apparatus for Forming Three-Dimensional Structures
    • 不适合的面罩和形成三维结构的方法和装置
    • US20080230392A1
    • 2008-09-25
    • US12055188
    • 2008-03-25
    • Adam L. CohenDennis R. Smalley
    • Adam L. CohenDennis R. Smalley
    • C25D5/02
    • B81C1/00182B33Y10/00
    • Electrochemical Fabrication techniques are used to modify substrates or to form multilayer structures (e.g. components or devices) from a plurality of overlaying and adhered layers. Masks are used to selectively etch or deposit material. Some masks may be of the contact type and may be formed of multiple materials some of which may be support materials, some of which may be mating materials for contacting a substrate and some may be intermediate materials. In some embodiments the contact masks may have conformable contact surfaces (i.e. surfaces with sufficient flexibility or deformability that they can substantially conform to surface of the substrate to form a seal with it) or they may have semi-rigid or even rigid surfaces. In embodiments where masks are used for selective deposition operations, etching operations may be performed after deposition to remove flash deposits (thin undesired deposits from areas that were intended to be masked).
    • 电化学制造技术用于修饰衬底或从多个覆盖和粘附层形成多层结构(例如组件或器件)。 掩模用于选择性地蚀刻或沉积材料。 一些掩模可以是接触型并且可以由多种材料形成,其中一些可以是支撑材料,其中一些可以是用于接触基底的配合材料,一些可以是中间材料。 在一些实施例中,接触掩模可以具有适形的接触表面(即具有足够的柔性或可变形性的表面,使得它们可以基本上符合基底的表面以与其形成密封),或者它们可以具有半刚性或甚至刚性的表面。 在掩模用于选择性沉积操作的实施例中,可以在沉积之后执行蚀刻操作以去除闪蒸沉积物(来自旨在被掩蔽的区域的不希望的沉积物)。