会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 85. 发明申请
    • METHOD AND DEVICE FOR DETECTING BRIGHT DOT OR DARK DOT IN LIQUID CRYSTAL DISPLAY
    • 用于检测液晶显示器中的亮点或深度的方法和装置
    • US20100056008A1
    • 2010-03-04
    • US12547794
    • 2009-08-26
    • Li LiZhilong Peng
    • Li LiZhilong Peng
    • H01J9/42
    • G02F1/1309
    • A method for detecting a bright dot or a dark dot in a LCD comprising applying a first detection voltage to a color filter substrate common electrode and forming a first voltage difference between the color filter substrate common electrode and a pixel electrode on an array substrate; collecting a first luminance value of the bright dot or the dark dot after the bright dot or the dark dot is observed; switching the first detection voltage applied to the color filter substrate common electrode to a second detection voltage, and thus forming a second voltage difference between the color filter substrate common electrode and the pixel electrode; collecting a second luminance value of the bright dot or the dark dot; determining the difference between the first luminance value and the second luminance value, so that the bright dot or the dark dot can be determined to result from a liquid crystal cell defect or an array substrate defect.
    • 一种用于检测LCD中的亮点或暗点的方法,包括:将第一检测电压施加到滤色器基板公共电极,并在阵列基板上形成滤色器基板公共电极与像素电极之间的第一电压差; 在观察到亮点或黑点后收集亮点或暗点的第一亮度值; 将施加到滤色器基板公共电极的第一检测电压切换到第二检测电压,从而在滤色器基板公共电极和像素电极之间形成第二电压差; 收集亮点或暗点的第二亮度值; 确定第一亮度值和第二亮度值之间的差异,从而可以确定亮点或暗点是由液晶单元缺陷或阵列基板缺陷引起的。
    • 86. 发明申请
    • Methods of Forming Trench Isolation and Methods of Forming Arrays of FLASH Memory Cells
    • 形成沟槽隔离的方法和形成闪存单元阵列的方法
    • US20100035404A1
    • 2010-02-11
    • US12572027
    • 2009-10-01
    • Li Li
    • Li Li
    • H01L21/762H01L21/28
    • H01L27/115H01L21/76224H01L27/11521
    • This invention includes methods of forming trench isolation. In one implementation, isolation trenches are provided within a semiconductor substrate. A liquid is deposited and solidified within the isolation trenches to form a solidified dielectric within the isolation trenches. The dielectric comprises carbon and silicon, and can be considered as having an elevationally outer portion and an elevationally inner portion within the isolation trenches. At least one of carbon removal from and/or oxidation of the outer portion of the solidified dielectric occurs. After such, the dielectric outer portion is etched selective to and effective to expose the dielectric inner portion. After the etching, dielectric material is deposited over the dielectric inner portion to within the isolation trenches.
    • 本发明包括形成沟槽隔离的方法。 在一个实施方案中,在半导体衬底内提供隔离沟槽。 在隔离沟槽内沉积和固化液体,以在隔离沟槽内形成凝固的电介质。 电介质包括碳和硅,并且可以被认为具有在隔离沟槽内的正面外部部分和正面内部部分。 发生固化电介质的外部部分的碳去除和/或氧化中的至少一种。 此后,电介质外部部分被选择性蚀刻并有效地暴露电介质内部部分。 在蚀刻之后,电介质材料沉积在电介质内部部分之上以在隔离沟槽内。