会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 82. 发明申请
    • Pattern inspection method, pattern inspection system and pattern inspection program of photomask
    • 图案检验方法,图案检查系统和光掩模图案检验程序
    • US20050220332A1
    • 2005-10-06
    • US11093264
    • 2005-03-30
    • Satoshi AkutagawaKazuhiko Takahashi
    • Satoshi AkutagawaKazuhiko Takahashi
    • G01N21/956G03F1/36G03F1/84G06K9/00G06T1/00G06T7/00H01L21/027
    • G03F1/84G06T7/001G06T2207/30148
    • An image of an inspection object pattern formed on a photomask is acquired, which is to be transformed into inspection object pattern data as input data of light intensity distribution simulation for finding light intensity distribution in which optical conditions of an exposure system used in pattern transfer are reflected. The light intensity distribution simulation is performed using the inspection object pattern data, and a difference between light intensity distribution of the inspection object pattern obtained by the light intensity distribution simulation and reference light intensity distribution is found. Inverse light intensity distribution simulation having reversibility to the light intensity distribution simulation is performed using the difference, to obtain difference pattern data determining a defect in the inspection object pattern. Consequently, the presence/absence of the defect in the inspection object pattern can be determined highly accurately and defect location in the inspection object pattern can be identified easily and certainly.
    • 获取形成在光掩模上的检查对象图案的图像,其将被转换为检查对象图案数据作为用于找到其中图案转印中使用的曝光系统的光学条件的光强度分布的光强分布模拟的输入数据 反映。 使用检查对象图案数据进行光强分布模拟,并且发现通过光强分布模拟获得的检查对象图案的光强度分布与参考光强度分布之间的差异。 使用差异进行具有与光强度分布模拟的可逆性的逆光强度分布模拟,以获得确定检查对象图案中的缺陷的差异图案数据。 因此,可以高精确度地确定检查对象图案中的缺陷的存在/不存在,并且可以容易且确定地识别检查对象图案中的缺陷位置。
    • 84. 发明申请
    • Receiving apparatus
    • 接收装置
    • US20050143030A1
    • 2005-06-30
    • US11003762
    • 2004-12-06
    • Yuki KurikiKazuhiko Takahashi
    • Yuki KurikiKazuhiko Takahashi
    • H04B1/16H04B1/00H04B1/10
    • H04B1/1027
    • A receiving apparatus receives a radio wave including an analog sound modulated wave signal, a digital sound modulated wave signal, and a digital character/image modulated wave signal by a receiving device. The analog sound modulated wave signal is demodulated by an analog demodulating device. The digital sound modulated wave signal is demodulated by a digital demodulating device. A determining device determines whether the reception level of the radio wave is equal to or higher than a predetermined level on the basis of a radio frequency signal obtained by reception of the radio wave. A selecting device selects one of the demodulating devices which generate a sound demodulated signal from a result of determination made by the determining device. A sound output device outputs sound by a sound demodulated signal from the selected demodulating device.
    • 接收装置通过接收装置接收包括模拟声音调制波信号,数字声音调制波信号和数字字符/图像调制波信号的无线电波。 模拟声音调制波信号由模拟解调装置解调。 数字声音调制波信号由数字解调装置解调。 确定装置基于通过接收无线电波获得的射频信号来确定无线电波的接收电平是否等于或高于预定电平。 选择装置从由确定装置进行的确定的结果中选择产生声音解调信号的解调装置之一。 声音输出装置通过来自所选解调装置的声音解调信号输出声音。
    • 85. 发明授权
    • Semiconductor memory device provided with test memory cell unit
    • 具有测试存储单元的半导体存储器件
    • US06888766B2
    • 2005-05-03
    • US10254647
    • 2002-09-26
    • Kazuhiko Takahashi
    • Kazuhiko Takahashi
    • G11C11/22G11C29/06G11C29/50H01L21/8246H01L27/105G11C7/24G11C5/02G11C29/00
    • G11C29/50012G11C11/22G11C29/24G11C29/50G11C29/50016
    • A semiconductor memory device includes a memory cell block composed of a memory cell unit having memory cells each containing a ferroelectric capacitor, and a test memory cell unit having test memory cells. The layout pattern of the test memory cells is identical to the layout pattern of the memory cells. The test memory cell unit is arranged close to a memory cell of a plurality of memory cells which is at a position where the ferroelectric capacitor is susceptible to degradation. The memory cell unit and test memory cell unit are subjected to a first cycling test consisting of N1 cycles. Then, the test memory cell unit is subjected to a second cycling test consisting of N2 cycles. The sum (N1+N2) of the number of cycles in the first and second cycling tests equals an assurance number of cycles T, where N1
    • 半导体存储器件包括由具有各自含有铁电电容器的存储单元的存储单元单元和具有测试存储单元的测试存储单元组成的存储单元块。 测试存储单元的布局模式与存储器单元的布局模式相同。 测试存储单元单元布置在靠近强电介质电容器容易劣化的位置的多个存储单元的存储单元附近。 对存储单元单元和测试存储单元单元进行由N 1个循环组成的第一循环测试。 然后,对测试存储单元单元进行由N 2个循环组成的第二循环测试。 第一循环和第二次循环试验中的循环次数的总和(N N 1 N N N N N 2 N)等于循环T的保证数,其中N 1 < / SUB>
    • 87. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5311469A
    • 1994-05-10
    • US845654
    • 1992-03-04
    • Satoru HoshiMasami MasudaKazuhiko Takahashi
    • Satoru HoshiMasami MasudaKazuhiko Takahashi
    • G11C11/413G11C7/06G11C7/10G11C11/409G11C7/00
    • G11C7/06G11C7/1048G11C7/1051
    • A semiconductor memory device including: a memory cell array having at least one cell array unit, the cell array unit including a plurality of memory cells; a decoder for selecting at least one the memory cell in accordance with an externally supplied address; an input/output terminal for outputting data read from the selected memory cell and for receiving data supplied externally and sending the data to the selected memory cell; at least one data line for connecting the input/output terminal to each the cell array unit; sense amplifiers serially connected to each the data line in a multiple stage configuration for amplifying the read data; a write buffer connected in parallel with one of the sense amplifiers connected to each data line; by-pass switching elements connected between input and output terminals of the other sense amplifiers connected to each the data line; and a control circuit for applying an on-signal to at least one by-pass switching element when writing data, the on-signal turning on at least one by-pass switching element.
    • 一种半导体存储器件,包括:具有至少一个单元阵列单元的存储单元阵列,所述单元阵列单元包括多个存储单元; 解码器,用于根据外部提供的地址来选择至少一个所述存储器单元; 用于输出从所选存储单元读取的数据并用于接收外部提供的数据并将数据发送到所选存储单元的输入/输出端子; 用于将输入/输出端子连接到每个单元阵列单元的至少一条数据线; 读出放大器以多级配置串行连接到每条数据线,用于放大读取的数据; 与连接到每个数据线的读出放大器之一并联连接的写入缓冲器; 连接到连接到每个数据线的其它读出放大器的输入和输出端之间的旁路开关元件; 以及控制电路,用于在写数据时向至少一个旁路开关元件施加导通信号,所述接通信号接通至少一个旁路开关元件。
    • 89. 发明授权
    • Non-hydrous soft contact lens and process for producing the same
    • 非水软性隐形眼镜及其制造方法
    • US4737556A
    • 1988-04-12
    • US935954
    • 1986-11-28
    • Tetsuo ItohNoboru SatohKazuhiko TakahashiTaro SuminoeTakao Shimizu
    • Tetsuo ItohNoboru SatohKazuhiko TakahashiTaro SuminoeTakao Shimizu
    • G02C7/04C08F20/22C08F220/22C08F220/28G02B1/04C08F18/20
    • G02B1/043C08F220/22
    • A non-hydrous soft contact lens comprising a copolymer comprising, as monomer units, 49.9 to 95 mole % of an acrylate represented by Formula (I) shown below, 0 to 10 mole % of acrylic acid or the specified ester thereof, 4.9 to 50 mole % of a methacrylate represented by Formula (II) shown below, and 0.1 to 10 mole % of a crosslinking monomer. ##STR1## wherein R.sup.1 is at least one selected from the group consisting of a particular straight chain fluoroalkyl group and a particular straight chain alkyl group. ##STR2## wherein R.sup.2 is a particular straight chain fluoroalkyl group. The present soft contact lens requires no sterilization by boiling, and has good resistance to stain, good oxygen permeability, good elastic recovery and good shape stability.A process for producing the above non-hydrous soft contact lens, comprising the step of subjecting a rigid precursor lens to treatment(s) of esterification and/or transesterification, is also disclosed.
    • 一种非水软性隐形眼镜,其包含共聚物,其包含作为单体单元的49.9至95摩尔%的由下式(I)表示的丙烯酸酯,0至10摩尔%的丙烯酸或其指定的酯,4.9至50 摩尔%的由下式(II)表示的甲基丙烯酸酯和0.1至10摩尔%的交联单体。 (I)其中R 1是选自特定的直链氟代烷基和特定的直链烷基中的至少一种。 (II)其中R2是特定的直链氟代烷基。 本软性隐形眼镜不需要煮沸灭菌,耐污染性好,透氧性好,弹性恢复好,形状稳定性好。 还公开了一种用于生产上述非水合软性隐形眼镜的方法,包括使刚性前体镜片经受酯化和/或酯交换的处理的步骤。