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    • 85. 发明授权
    • In-situ performance prediction of pad conditioning disk by closed loop torque monitoring
    • 通过闭环力矩监测对垫片调节盘的现场性能预测
    • US08096852B2
    • 2012-01-17
    • US12187637
    • 2008-08-07
    • Sameer DeshpandeShou-Sung ChangHung Chih ChenRoy C NangoyStan D Tsai
    • Sameer DeshpandeShou-Sung ChangHung Chih ChenRoy C NangoyStan D Tsai
    • B24B49/18
    • B24B49/18B24B37/005B24B49/16B24B53/017
    • Polishing pads used in CMP machines are consumable components that are typically replaced after a specific number of wafers have been processed. The life of a polishing pad is optimized by controlling the rate of material removal from the polishing pad by the conditioning disk. The conditioning disk removes enough material so the polishing surface can properly process the wafers but does not remove any excess material. Preventing excess material removal extends the life of the polishing pad. During CMP processing, the controller receives data concerning the torque applied to the conditioning disk and the torque applied to the arm to sweep the conditioning disk across the polishing pad. Based upon the detected operating conditions, the system can predict the rate of material removal and adjust the forces applied to the conditioning disk so that the life of the polishing pad is optimized.
    • 在CMP机器中使用的抛光垫是可消耗的部件,通常在处理特定数量的晶片之后被替换。 抛光垫的寿命通过控制由调节盘从抛光垫去除的材料的速率被优化。 调节盘移除足够的材料,因此抛光表面可以适当地处理晶片,但不会去除任何多余的材料。 防止多余的材料去除延长了抛光垫的寿命。 在CMP处理期间,控制器接收关于施加到调节盘的扭矩和施加到臂上的扭矩以扫掠经过抛光垫的调节盘的数据。 基于检测到的操作条件,系统可以预测材料去除速率并调节施加到调节盘的力,以便抛光垫的寿命被优化。
    • 89. 发明申请
    • POLISHING PAD CONDITIONER
    • 抛光垫调节器
    • US20100105302A1
    • 2010-04-29
    • US12256845
    • 2008-10-23
    • Hung Chih ChenSen-Hou KoShou-Sung Chang
    • Hung Chih ChenSen-Hou KoShou-Sung Chang
    • B24D11/00
    • B24B53/017
    • Embodiments of the present invention generally provide an improved conditioning module and conditioning disks for improved pressure distribution during the process of conditioning a polishing pad of a chemical mechanical polishing (CMP) system. In one embodiment, a conditioning module comprising multiple, small conditioning disks is provided. In one embodiment, a conditioning disk having a compliant backing member is provided. In one embodiment, the compliant backing member comprises a semi-rigid backing member cut into a spiral shape to provide compliancy. In another embodiment, the compliant backing member comprises a fluid-pressurized, flexible membrane. Each embodiment of the present invention provides an improved pressure distribution across the face of each conditioning disk, resulting in increased disk life as well as increased conditioning rate and uniformity.
    • 本发明的实施例通常提供改进的调节模块和调节盘,用于在调节化学机械抛光(CMP)系统的抛光垫的过程中改善压力分布。 在一个实施例中,提供了包括多个小调节盘的调节模块。 在一个实施例中,提供了具有柔顺背衬构件的调节盘。 在一个实施例中,柔顺背衬构件包括切割成螺旋形状以提供符合性的半刚性背衬构件。 在另一个实施例中,顺从背衬构件包括流体加压的柔性膜。 本发明的每个实施例提供了在每个调节盘的表面上的改进的压力分布,导致增加的盘寿命以及增加的调节速率和均匀性。
    • 90. 发明申请
    • SUBSTRATE HOLDER WITH LIQUID SUPPORTING SURFACE
    • 带液体支撑表面的基座
    • US20090264056A1
    • 2009-10-22
    • US12105798
    • 2008-04-18
    • Hung Chih ChenYin YuanStephen Jew
    • Hung Chih ChenYin YuanStephen Jew
    • B24B41/06
    • B24B37/30
    • Embodiments of the present invention generally relate to a substrate transferring system. One embodiment of the present invention provides a substrate holder comprising a pedestal plate, a basin wall extending from a top surface of the pedestal plate, wherein the basin wall has a substantially leveled top surface, the basin wall and the pedestal plate define a basin configured to retain a liquid therein, and a liquid port opening to the basin, wherein the liquid port is configured to flow a liquid to the basin and allow the liquid to overflow from the basin wall, and a top surface of the overflow liquid in the basin is configured to support a substrate without contacting the basin wall or the pedestal plate.
    • 本发明的实施例一般涉及基板传送系统。 本发明的一个实施例提供了一种衬底保持器,其包括基座板,从基座板的顶表面延伸的盆壁,其中,所述盆壁具有基本上平整的顶表面,所述盆壁和所述基座板限定了配置 在其中保持液体,以及通向所述盆的液体口,其中所述液体端口被配置为使液体流到所述盆中并允许所述液体从所述盆壁溢出,并且所述盆中的所述溢流液体的顶表面 构造成支撑基板而不接触盆壁或基座板。