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    • 85. 发明授权
    • DC/DC converter
    • DC / DC转换器
    • US4685039A
    • 1987-08-04
    • US873091
    • 1986-06-04
    • Kiyoharu InouHitoshi Saito
    • Kiyoharu InouHitoshi Saito
    • H02M3/335
    • H02M3/33569
    • A DC/DC converter which may be used as a power supply of high capacity. The DC/DC converter comprises first and second converters having their primary terminals connected in series so as to insure high output power and high breakdwon voltage; a first diode for forming a closed circuit together with a transformer of the first converter and a capacitor of the second converter when a switching element of the first converter is turned "off"; and a second diode for forming a closed circuit together with a transformer of the second converter and a capacitor of the first converter when a switching element of the second converter is turned "off".
    • 可用作高容量电源的DC / DC转换器。 DC / DC转换器包括其初级端子串联连接的第一和第二转换器,以确保高输出功率和高断续电压; 当第一转换器的开关元件“关闭”时,用于与第一转换器的变压器一起形成闭合电路的第一二极管和第二转换器的电容器; 以及第二二极管,用于当第二转换器的开关元件“关闭”时与第二转换器的变压器一起形成闭合电路和第一转换器的电容器。
    • 86. 发明授权
    • Surface state measuring device, and surface state measuring method using the device
    • 表面状态测量装置和使用该装置的表面状态测量方法
    • US08490209B2
    • 2013-07-16
    • US12852635
    • 2010-08-09
    • Hitoshi Saito
    • Hitoshi Saito
    • G01Q20/00
    • G01Q60/54
    • Provided are a surface state measuring device which can measure an alternating force of an arbitrary frequency and which is excellent in spatial resolution, and a surface state measuring method using the device. This surface state measuring device measures the surface state of a sample by detecting the modulation of the oscillation of a probe arranged above the sample. The measuring device comprises: a cantilever having a probe near a free end; an excitation mechanism for exciting the cantilever; a scanning mechanism for making the probe scan the sample by moving the probe and the sample relative to each other; and alternating force generator for generating an alternating force of an arbitrary frequency in a space; and a modulation measuring mechanism for measuring the degree of frequency modulation or amplitude modulation of the oscillations of the probe, which are generated by the alternating force.
    • 提供一种能够测量任意频率的交变力并且空间分辨率优异的表面状态测量装置以及使用该装置的表面状态测量方法。 该表面状态测量装置通过检测布置在样品上方的探针的振荡的调制来测量样品的表面状态。 测量装置包括:悬臂,其具有靠近自由端的探头; 用于激发悬臂的激励机构; 用于使探针通过相对于彼此移动探针和样品来扫描样品的扫描机构; 以及用于在空间中产生任意频率的交替力的交替力发生器; 以及调制测量机构,用于测量由交替的力产生的探针的振荡的频率调制或幅度调制的程度。
    • 87. 发明申请
    • SEMICONDUCTOR DEVICE AND TEST METHOD
    • 半导体器件和测试方法
    • US20130015587A1
    • 2013-01-17
    • US13482146
    • 2012-05-29
    • Akihiko OkutsuHitoshi SaitoYoshiaki Okano
    • Akihiko OkutsuHitoshi SaitoYoshiaki Okano
    • H01L21/66H01L23/522
    • G01R31/275G01R31/2601G01R31/2884H01L22/32H01L23/522H01L23/564H01L23/585H01L2224/05554H01L2924/0002H01L2924/00
    • A semiconductor device includes a semiconductor substrate including an element region, an inner sealing and an outer sealing which are formed on the element region and have a first opening part and a second opening part, respectively, a multilayer interconnection structure which is formed on the substrate and stacks multiple inter-layer insulation films each including a wiring layer, a moisture resistant film formed between a first inter-layer insulation film and a second inter-layer insulation film which are included in the multilayer interconnection structure, a first portion which extended from a first side of the moisture resistant film and passes the first opening part, a second portion which extended from a second side of the moisture resistant film and passes through the second opening part, and a wiring pattern including a via plug which penetrates the moisture resistant film and connects the first portion and the second portion.
    • 半导体器件包括:半导体衬底,包括元件区域,内部密封件和外部密封件,所述元件区域,内部密封件和外部密封件分别形成在所述元件区域上并具有第一开口部分和第二开口部分,所述多层互连结构分别形成在所述衬底上 并且堆叠多个层间绝缘膜,每个层间绝缘膜包括布线层,形成在包括在多层互连结构中的第一层间绝缘膜和第二层间绝缘膜之间的防潮膜,第一部分从 所述防潮膜的第一面通过所述第一开口部,所述第二部分从所述防湿膜的第二侧延伸并穿过所述第二开口部;以及布线图案,其包括穿过所述防潮膜的通孔塞 并且连接第一部分和第二部分。
    • 88. 发明申请
    • Method and Device for Analyzing Distribution of Coercive Force in Vertical Magnetic Recording Medium Using Magnetic Force Microscope
    • 使用磁力显微镜分析垂直磁记录介质中矫顽力分布的方法和装置
    • US20080284422A1
    • 2008-11-20
    • US11631101
    • 2005-06-15
    • Shunji IshioHitoshi Saito
    • Shunji IshioHitoshi Saito
    • G01R33/00
    • G01R33/14G01Q60/50G01Q60/56G01R33/10
    • In a coercive force distribution analysis device, a magnetic field is applied in substantially vertical direction to a sample having a magnetic thin film capable of recording vertical magnetism. A magnetic flux detection signal is generated in accordance with the leaking magnetic flux generated from a magnetic domain of the sample surface while the sample is horizontally moved. A first and a second external magnetic field corresponding to a first and a second threshold value selected from hysteresis characteristic corresponding to the sample average magnetization are applied to the sample so as to generate image data on a first and a second magnetic domain. The first and the second image data are subjected to digitization processing by the first and the second threshold value and the difference between them is generated as a first coercive force distribution pattern.
    • 在矫顽力分布分析装置中,向具有能够记录垂直磁性的磁性薄膜的样品的大致垂直方向施加磁场。 根据在样品水平移动时从样品表面的磁畴产生的泄漏磁通产生磁通量检测信号。 将对应于从对应于采样平均磁化强度的滞后特性中选择的第一和第二阈值的第一和第二外部磁场施加到样本,以便在第一和第二磁畴上产生图像数据。 通过第一和第二阈值对第一和第二图像数据进行数字化处理,并且产生它们之间的差作为第一矫顽力分布图案。