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    • 81. 发明授权
    • Method for color correction
    • 颜色校正方法
    • US07375854B2
    • 2008-05-20
    • US10798867
    • 2004-03-12
    • Ching-Hsiang HsuYuh-Ren ShenLing-Chih Lu
    • Ching-Hsiang HsuYuh-Ren ShenLing-Chih Lu
    • G06F15/00G03F3/08G06K9/00
    • H04N9/69H04N5/202
    • A method for color correction is provided. In this method, a plurality of groups of gray levels and luminance of light source of display device are respectively selected by color measurement system. The selected data of each color light are respectively calculated to obtain fitting functions which can fit the gray level data of each interval. The fitting luminance of the gray levels in interval is obtained by the fitting function and formed into a lookup table. Then in order to correspond a gamma curve of normalized gray data of image to a predetermined target curve, the two gamma curves are first taken to logarithmic calculation and the modified gray signals are obtained from the lookup table, then the modified gray signals are transmitted out for providing the display device to express the gray distribution state. The method for color correction is applicable to various display devices, especially liquid crystal display device.
    • 提供了一种用于颜色校正的方法。 在该方法中,通过彩色测量系统分别选择多组灰度级和显示装置的光源亮度。 分别计算每个颜色光的所选数据,以获得可以适合每个间隔的灰度级数据的拟合函数。 通过拟合函数获得间隔中灰度级的拟合亮度,形成查找表。 然后,为了将图像的归一化灰度数据的伽马曲线对应于预定的目标曲线,首先将两个伽马曲线进行对数计算,并从查找表中获得修改的灰度信号,然后将修改的灰度信号发送出去 用于提供显示装置来表达灰色分布状态。 用于颜色校正的方法适用于各种显示装置,特别是液晶显示装置。
    • 83. 发明申请
    • Method for color correction
    • 颜色校正方法
    • US20050201615A1
    • 2005-09-15
    • US10798867
    • 2004-03-12
    • Ching-Hsiang HsuYuh-Ren ShenLing-Chih Lu
    • Ching-Hsiang HsuYuh-Ren ShenLing-Chih Lu
    • G06K1/00G06K9/00
    • H04N9/69H04N5/202
    • A method for color correction is provided. In this method, a plurality of groups of gray levels and luminance of light source of display device are respectively selected by color measurement system. The selected data of each color light are respectively calculated to obtain fitting functions which can fit the gray level data of each interval. The fitting luminance of the gray levels in interval is obtained by the fitting function and formed into a lookup table. Then in order to correspond a gamma curve of normalized gray data of image to a predetermined target curve, the two gamma curves are first taken to logarithmic calculation and the modified gray signals are obtained from the lookup table, then the modified gray signals are transmitted out for providing the display device to express the gray distribution state. The method for color correction is applicable to various display devices, especially liquid crystal display device.
    • 提供了一种用于颜色校正的方法。 在该方法中,通过彩色测量系统分别选择多组灰度级和显示装置的光源亮度。 分别计算每个颜色光的所选数据,以获得可以适合每个间隔的灰度级数据的拟合函数。 通过拟合函数获得间隔中灰度级的拟合亮度,形成查找表。 然后,为了将图像的归一化灰度数据的伽马曲线对应于预定的目标曲线,首先将两个伽马曲线进行对数计算,并从查找表中获得修改的灰度信号,然后将修改的灰度信号发送出去 用于提供显示装置来表达灰色分布状态。 用于颜色校正的方法适用于各种显示装置,特别是液晶显示装置。
    • 88. 发明授权
    • High speed flash memory with high coupling ratio
    • 具有高耦合比的高速闪存
    • US06566703B1
    • 2003-05-20
    • US09665745
    • 2000-09-20
    • Mong-Song LiangChing-Hsiang HsuRuei-Ling Lin
    • Mong-Song LiangChing-Hsiang HsuRuei-Ling Lin
    • H01L2976
    • H01L27/11521H01L27/115
    • A flash memory device includes floating gate electrode, an interelectrode dielectric layer and a control gate electrode. The interelectrode dielectric layer is formed on top of the floating gate electrode and the control gate electrode is formed on top of the interelectrode dielectric layer. A doped silicon semiconductor substrate is covered with variable thickness silicon oxide regions on the surface thereof with junctions between the variable thickness regions. The silicon oxide regions are substantially thicker beneath the center of the floating gate electrode. Source/drain regions formed in the substrate extend beneath the tunnel oxide regions with the junctions aligned with the regions. The floating gate electrodes formed over the silicon oxide regions above the source/drain regions including dielectric sidewalls within the floating gate electrode above the junctions. The variable thickness silicon oxide regions are tunnel oxide regions on either side of a gate oxide region. The floating gate electrode is composed of doped polysilicon and the dielectric sidewalls is reoxidized polysilicon dielectric regions formed within the floating gate electrode above the junctions of the tunnel oxide regions and the gate oxide region.
    • 闪存器件包括浮栅电极,电极间电介质层和控制栅电极。 电极间电介质层形成在浮栅电极的顶部,并且控制栅电极形成在电极间电介质层的顶部。 掺杂硅半导体衬底在其表面上被可变厚度的氧化硅区域覆盖,其中可变厚度区域之间具有接合点。 氧化硅区域在浮栅电极的中心下方基本上更厚。 形成在衬底中的源极/漏极区域在隧道氧化物区域的下方延伸,并且结点与区域对准。 形成在源极/漏极区域之上的氧化硅区域上方的浮置栅电极,包括位于结点之上的浮动栅电极内的电介质侧壁。 可变厚度的氧化硅区域是栅极氧化物区域两侧的隧道氧化物区域。 浮置栅电极由掺杂的多晶硅组成,电介质侧壁是形成在隧道氧化物区域和栅极氧化物区域的结点之上的浮置栅电极内的再氧化的多晶硅介质区域。
    • 89. 发明授权
    • Nonvolatile memory having embedded word lines
    • 具有嵌入字线的非易失性存储器
    • US06448607B1
    • 2002-09-10
    • US09683212
    • 2001-12-03
    • Ching-Hsiang HsuKung-Hong LeeChing-Sung Yang
    • Ching-Hsiang HsuKung-Hong LeeChing-Sung Yang
    • H01L29788
    • H01L29/42336G11C8/14G11C11/5671G11C16/0475G11C16/08H01L27/115H01L29/7883
    • A flash memory cell with an embedded gate structure capable of storing two bits of information and the operation of such a flash memory cell are provided. A first ion-doped region, serving as a source terminal, is formed in a semiconductor substrate. An embedded gate structure and a second ion-doped region are alternately arranged on the first ion-doped region. The embedded gate structure is surrounded by the first oxide layer, the trapping layer, and the second oxide layer. An insulating layer is formed on the embedded gate structure. A diffusion drain is positioned atop the second ion-doped region and a conductive layer connects with the diffusion drains. The embedded gate structure is isolated from the diffusion drain with the insulating layer. Furthermore, the reading, programming, and erasing operation of the memory cell with two bits of information are provided.
    • 提供具有能够存储两位信息的嵌入式门结构和这种闪存单元的操作的闪存单元。 作为源极端子的第一离子掺杂区域形成在半导体衬底中。 嵌入栅极结构和第二离子掺杂区域交替地布置在第一离子掺杂区域上。 嵌入式栅极结构被第一氧化物层,俘获层和第二氧化物层包围。 在嵌入式栅极结构上形成绝缘层。 扩散漏极位于第二离子掺杂区域顶部,导电层与扩散漏极连接。 嵌入式栅极结构与绝缘层与扩散漏极隔离。 此外,提供了具有两位信息的存储单元的读取,编程和擦除操作。
    • 90. 发明授权
    • Multi-level, split-gate, flash memory cell
    • 多级,分闸,闪存单元
    • US06281545B1
    • 2001-08-28
    • US09199130
    • 1998-11-24
    • Mong-Song LiangDi-Son KuoChing-Hsiang HsuRuei-Ling Lin
    • Mong-Song LiangDi-Son KuoChing-Hsiang HsuRuei-Ling Lin
    • H01L29788
    • G11C16/0475G11C11/5621G11C16/0458G11C2211/5612H01L21/28273H01L29/66825H01L29/7887
    • A semiconductor memory device is formed on a doped semiconductor substrate, and covered with a tunnel oxide layer covered in turn with a doped first polysilicon layer. The first polysilicon layer is patterned into a pair of floating gate electrodes. An interelectrode dielectric layer covers the floating gate electrodes, the sidewalls of the floating gate electrodes and the edges of the tunnel oxide below the floating gate electrodes. A second polysilicon layer overlies the interelectrode dielectric layer and is in turn covered by a tungsten silicide layer. A second dielectric layer covers the tungsten silicide layer. A control gate electrode which spans the pair of floating gate electrodes is formed by the second polysilicon layer, the tungsten silicide and the first and second dielectric layers patterned into a gate electrode stack providing a control gate electrode spanning across the pair of floating gate electrodes. There are source/drain regions in the substrate self-aligned with the control gate electrode.
    • 半导体存储器件形成在掺杂半导体衬底上,并被掺杂的第一多晶硅层依次覆盖的隧道氧化物层覆盖。 将第一多晶硅层图案化成一对浮栅电极。 电极间电介质层覆盖浮置栅电极,浮置栅电极的侧壁和隧道氧化物的边缘在浮栅电极下方。 第二多晶硅层覆盖在电极之间的电介质层上,又由硅化钨层覆盖。 第二介电层覆盖硅化钨层。 跨越一对浮置栅电极的控制栅极电极由第二多晶硅层形成,硅化钨和第一和第二电介质层图案化成栅电极堆叠,提供横跨该对浮置栅电极的控制栅电极。 衬底中的源极/漏极区域与控制栅电极自对准。