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    • 81. 发明授权
    • Haze-free BST films
    • 无雾BST薄膜
    • US06852593B2
    • 2005-02-08
    • US10614489
    • 2003-07-03
    • Cem BasceriGurtej Sandhu
    • Cem BasceriGurtej Sandhu
    • C23C16/40C30B25/02H01L21/02H01L21/314H01L21/316H01L21/8242
    • H01L21/31691C23C16/409C30B25/02C30B29/32H01L28/55
    • Described herein is a method for producing a haze-free (Ba, Sr)TiO3 (BST) film, and devices incorporating the same. In one embodiment, the BST film is made haze-free by depositing the film with a substantially uniform desired crystal orientation, for example, (100), preferably by forming the film by metal-organic chemical vapor deposition at a temperature greater than about 580° C. at a rate of less than about 80 Å/min, to result in a film having about 50 to 53.5 atomic percent titanium. In another embodiment, where the BST film serves as a capacitor for a DRAM memory cell, a desired {100} orientation is induced by depositing the bottom electrode over a nucleation layer of NiO, which gives the bottom electrode a preferential {100} orientation. BST is then grown over the {100} oriented bottom electrode also with a {100} orientation. A nucleation layer of materials such as Ti, Nb and Mn can also be provided over the bottom electrode and beneath the BST film to induce smooth, haze-free BST growth. Haze-free BST film can also be favored by forming the bottom electrode at high temperatures close to those used for BST deposition, and without a vacuum break between the bottom electrode and BST deposition.
    • 本文描述了一种生产无雾(Ba,Sr)TiO 3(BST)膜的方法,以及包含它的装置。 在一个实施方案中,BST膜通过以基本上均匀的所需晶体取向沉积薄膜而形成为无雾状,例如(100),优选通过金属 - 有机化学气相沉积在大于约580℃的温度下形成薄膜 ℃,以小于约/分钟的速率,得到具有约50至53.5原子百分数的钛的膜。 在另一个实施例中,其中BST膜用作DRAM存储单元的电容器,通过将底部电极沉积在NiO的成核层上来诱导所需的{100}取向,这使得底部电极具有优先{100}取向。 然后,BST也以{100}取向生长在{100}取向的底部电极上。 还可以在底部电极和BST膜下方提供诸如Ti,Nb和Mn的材料的成核层,以引起平滑无雾的BST生长。 通过在接近用于BST沉积的高温下形成底部电极,并且在底部电极和BST沉积之间没有真空断裂,也可以使无色BST膜更有利。
    • 82. 发明授权
    • Top electrode in a strongly oxidizing environment
    • 顶极电极处于强氧化环境
    • US06682969B1
    • 2004-01-27
    • US09652863
    • 2000-08-31
    • Cem BasceriHoward E. RhodesGurtej SandhuF. Daniel GealyThomas M. Graettinger
    • Cem BasceriHoward E. RhodesGurtej SandhuF. Daniel GealyThomas M. Graettinger
    • H01L2100
    • H01L28/65H01L21/31637H01L21/31691H01L23/5222H01L27/10852H01L28/56H01L28/60H01L2924/0002H01L2924/00
    • An improved charge storing device and methods for providing the same, the charge storing device comprising a conductor-insulator-conductor (CIC) sandwich. The CIC sandwich comprises a first conducting layer deposited on a semiconductor integrated circuit. The CIC sandwich further comprises a first insulating layer deposited over the first conducting layer in a flush manner. The first insulating layer comprises a structure having a plurality of oxygen cites and a plurality of oxygen atoms that partially fill the oxygen cites, wherein the unfilled oxygen cites define a concentration of oxygen vacancies. The CIC sandwich further comprises a second conducting layer deposited over the first insulating layer in a strongly oxidizing ambient so as to reduce the concentration of oxygen vacancies in the first insulating layer, so as to provide an oxygen-rich interface layer between the first insulating layer and the second conducting layer, and so as to trap a plurality of oxygen atoms within the second conducting layer. The oxygen-rich interface layer and second conducting layer act as oxygen vacancy sinks for absorbing migrating oxygen vacancies that originate from the first insulating layer to thereby reduce the concentration of oxygen vacancies in the first insulating layer and to thereby reduce the buildup of oxygen vacancies at the interface layer. Thus, the first insulating layer provides an increased dielectric constant and an increased resistance to current flowing therethrough so as to increase the capacitance of the CIC sandwich and so as to reduce leakage currents flowing through the CIC sandwich.
    • 一种改进的电荷存储装置及其提供方法,电荷存储装置包括导体 - 绝缘体导体(CIC)三明治。 CIC夹层包括沉积在半导体集成电路上的第一导电层。 CIC夹层还包括以齐平方式沉积在第一导电层上的第一绝缘层。 第一绝缘层包括具有多个氧化物和部分填充氧化物的多个氧原子的结构,其中未填充的氧气定义氧空位的浓度。 CIC夹层还包括在强氧化环境中沉积在第一绝缘层上的第二导电层,以便降低第一绝缘层中氧空位的浓度,从而在第一绝缘层之间提供富氧界面层 和第二导电层,以便在第二导电层内捕获多个氧原子。 富氧界面层和第二导电层用作氧空位吸收器,用于吸收源于第一绝缘层的迁移氧空位,从而降低第一绝缘层中氧空位的浓度,从而减少氧空位的累积 接口层。 因此,第一绝缘层提供增加的介电常数和增加的电流流过其中,从而增加CIC夹层的电容,并且减少流过CIC夹层的漏电流。
    • 83. 发明授权
    • Method of forming haze- free BST films
    • US06660535B2
    • 2003-12-09
    • US09971945
    • 2001-10-04
    • Cem BasceriGurtej Sandhu
    • Cem BasceriGurtej Sandhu
    • H01L2100
    • H01L21/31691C23C16/409C30B25/02C30B29/32H01L28/55
    • Described herein is a method for producing a haze-free (Ba, Sr)TiO3 (BST) film, and devices incorporating the same. In one embodiment, the BST film is made haze-free by depositing the film with a substantially uniform desired crystal orientation, for example, (100), preferably by forming the film by metal-organic chemical vapor deposition at a temperature greater than about 580° C. at a rate of less than about 80 Å/min, to result in a film having about 50 to 53.5 atomic percent titanium. In another embodiment, where the BST film serves as a capacitor for a DRAM memory cell, a desired {100} orientation is induced by depositing the bottom electrode over a nucleation layer of NiO, which gives the bottom electrode a preferential {100} orientation. BST is then grown over the {100} oriented bottom electrode also with a {100} orientation. A nucleation layer of materials such as Ti, Nb and Mn can also be provided over the bottom electrode and beneath the BST film to induce smooth, haze-free BST growth. Haze-free BST film can also be favored by forming the bottom electrode at high temperatures close to those used for BST deposition, and without a vacuum break between the bottom electrode and BST deposition.
    • 87. 发明授权
    • Integrated circuitry
    • 集成电路
    • US08207563B2
    • 2012-06-26
    • US11638931
    • 2006-12-13
    • Cem BasceriGurtej S. Sandhu
    • Cem BasceriGurtej S. Sandhu
    • H01L27/108
    • H01L28/91H01L27/10817H01L27/10852
    • A method of forming a plurality of capacitors includes providing a plurality of capacitor electrodes comprising sidewalls. The plurality of capacitor electrodes are supported at least in part with a retaining structure which engages the sidewalls, with the retaining structure comprising a fluid pervious material. A capacitor dielectric material is deposited over the capacitor electrodes through the fluid pervious material of the retaining structure effective to deposit capacitor dielectric material over portions of the sidewalls received below the retaining structure. Capacitor electrode material is deposited over the capacitor dielectric material through the fluid pervious material of the retaining structure effective to deposit capacitor electrode material over at least some of the capacitor dielectric material received below the retaining structure. Integrated circuitry independent of method of fabrication is also contemplated.
    • 形成多个电容器的方法包括提供包括侧壁的多个电容器电极。 多个电容器电极至少部分地由与侧壁接合的保持结构支撑,保持结构包括透液材料。 电容器电介质材料沉积在电容器电极上,通过保持结构的流体可渗透材料,其有效地将电容器电介质材料沉积在容纳在保持结构下方的侧壁的部分上。 电容器电极材料通过保持结构的流体可透过材料沉积在电容器介电材料上,有效地将电容器电极材料沉积在容纳在保持结构下方的电容器电介质材料的至少一些之上。 还考虑了与制造方法无关的集成电路。
    • 88. 发明申请
    • Mixed Composition Interface Layer and Method of Forming
    • 混合组合界面层和成型方法
    • US20120120549A1
    • 2012-05-17
    • US13293778
    • 2011-11-10
    • Cem BasceriGurtej S. Sandhu
    • Cem BasceriGurtej S. Sandhu
    • H01G9/00
    • H01L21/0228C23C16/029C23C16/18C23C16/405C23C16/45525H01L21/02183H01L21/28562H01L21/31604H01L21/31683H01L28/40H01L28/60Y10T428/24917Y10T428/24926
    • An interface forming method includes forming a first layer containing a first chemical element and chemisorbing on the first layer an interface layer containing at least one monolayer of the first chemical element intermixed with a second chemical element different from the first chemical element. A second layer comprising the second chemical element can be formed on the interface layer. The first layer might not substantially contain the second chemical element, the second layer might not substantially contain the first chemical element, or both. An apparatus can include a first layer containing a first chemical element, an interface layer chemisorbed on the first layer, and a second layer containing a second element on the interface layer. The interface layer can contain at least one monolayer of the first chemical element intermixed with a second chemical element different from the first chemical element.
    • 界面形成方法包括在第一层上形成含有第一化学元素和化学吸附的第一层,所述界面层含有与第一化学元素不同的第二化学元素混合的第一化学元素的至少一个单层。 包含第二化学元素的第二层可以形成在界面层上。 第一层可能基本上不包含第二化学元素,第二层可能基本上不含有第一化学元素,或两者都不包含。 装置可以包括含有第一化学元素的第一层,在第一层上化学吸附的界面层和在界面层上含有第二元素的第二层。 界面层可以包含与第一化学元素不同的第二化学元素混合的第一化学元素的至少一个单层。
    • 90. 再颁专利
    • Mixed composition interface layer and method of forming
    • 混合组成界面层和成型方法
    • USRE43025E1
    • 2011-12-13
    • US12566533
    • 2009-09-24
    • Cem BasceriGurtej S. Sandhu
    • Cem BasceriGurtej S. Sandhu
    • B32B9/00
    • H01L21/0228C23C16/029C23C16/18C23C16/405C23C16/45525H01L21/02183H01L21/28562H01L21/31604H01L21/31683H01L28/40H01L28/60Y10T29/417Y10T428/24917Y10T428/24926
    • An interface forming method includes forming a first layer containing a first chemical element and chemisorbing on the first layer an interface layer containing at least one monolayer of the first chemical element intermixed with a second chemical element different from the first chemical element. A second layer comprising the second chemical element can be formed on the interface layer. The first layer might not substantially contain the second chemical element, the second layer might not substantially contain the first chemical element, or both. An apparatus can include a first layer containing a first chemical element, an interface layer chemisorbed on the first layer, and a second layer containing a second element on the interface layer. The interface layer can contain at least one monolayer of the first chemical element intermixed with a second chemical element different from the first chemical element.
    • 界面形成方法包括在第一层上形成含有第一化学元素和化学吸附的第一层,所述界面层含有与第一化学元素不同的第二化学元素混合的第一化学元素的至少一个单层。 包含第二化学元素的第二层可以形成在界面层上。 第一层可能基本上不包含第二化学元素,第二层可能基本上不含有第一化学元素,或两者都不包含。 装置可以包括含有第一化学元素的第一层,在第一层上化学吸附的界面层和在界面层上含有第二元素的第二层。 界面层可以包含与第一化学元素不同的第二化学元素混合的第一化学元素的至少一个单层。