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    • 72. 发明授权
    • Avalanche photo diode
    • 雪崩光电二极管
    • US4383266A
    • 1983-05-10
    • US187744
    • 1980-09-16
    • Kazuo SakaiYuichi MatsushimaShigeyuki AkibaTakaya Yamamoto
    • Kazuo SakaiYuichi MatsushimaShigeyuki AkibaTakaya Yamamoto
    • H01L31/107H01L29/90
    • H01L31/1075
    • An avalanche photo diode provided with a guard ring around a photo detecting region having a pn junction, in which semiconductor layers of the photo detecting region having a pn junction, different in conductivity type from a semiconductor of the guard ring, are composed of a second semiconductor layer formed in contact with a first semiconductor layer forming the pn junction of the photo detecting region and of the same conductivity type as the semiconductor of the guard ring, and a third semiconductor layer formed in contact with the second semiconductor layer and having a larger band gap than the second semiconductor layer, and in which the tip end of the guard ring is formed to extend down into the third semiconductor layer. An avalanche photo diode can be formed to be provided with a uniformly thick, first semiconductor layer forming a photo detecting region and a second semiconductor layer forming a first pn junction between it and the first semiconductor layer, in which third and fourth semiconductor layers of the same composition as each other, respectively having larger band gaps than those of the first and second semiconductor layers, are provided to form therebetween a second pn junction which extends from the first pn junction to surround the peripheral portion of the first semiconductor layer.
    • 一种雪崩光电二极管,其在具有pn结的光检测区域周围设置有保护环,其中具有pn结的光检测区域的半导体层与导电类型不同于保护环的半导体,由第二 形成为与形成光检测区域的pn结并且具有与保护环的半导体相同的导电类型的第一半导体层形成的半导体层,以及形成为与第二半导体层接触并具有较大的第三半导体层的第三半导体层 带隙比第二半导体层,并且其中保护环的尖端形成为向下延伸到第三半导体层。 可以形成雪崩光电二极管,以形成均匀厚的形成光检测区域的第一半导体层和在其与第一半导体层之间形成第一pn结的第二半导体层,其中第三半导体层 提供分别具有比第一和第二半导体层的带隙大的带隙的彼此相同的组成,以形成从第一pn结延伸到围绕第一半导体层的周边部分的第二pn结。