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    • 71. 发明授权
    • LGA socket
    • LGA插座
    • US07101210B2
    • 2006-09-05
    • US11288730
    • 2005-11-28
    • Nick LinJian ZhangYu-Chen Chen
    • Nick LinJian ZhangYu-Chen Chen
    • H01R13/62
    • H05K7/12H05K7/1061
    • Disclosed is a LGA socket connector including an insulative housing (2), a stiffener (3), a clip (4), and a lever (5) defining thereof a driving portion (50) and a locking portion (52) linked thereto. The stiffener is configured to grasp a periphery of the housing. The clip and the locking portion of the lever are essentially pivotally moved about longitudinal ends of the housing respectively, but with the driving portion disposed adjacent one transverse side of the housing. At least one of the clip and the stiffener is provided with a recessed region (300) adjacent said transverse side of the housing, thereby preventing the whole connector from becoming inclined when the connector is horizontally locked and placed on the printed circuit board.
    • 公开了一种LGA插座连接器,其包括绝缘壳体(2),加强件(3),夹子(4)和限定有驱动部分(50)的杠杆(5)和与其连接的锁定部分(52)。 加强件构造成抓住壳体的周边。 杠杆的夹子和锁定部分分别基本上围绕壳体的纵向端部枢转地移动,但是驱动部分邻近壳体的一个横向侧面设置。 夹子和加强件中的至少一个设置有与壳体的所述横向侧相邻的凹陷区域(300),从而当连接器水平地锁定并放置在印刷电路板上时,防止整个连接器变得倾斜。
    • 73. 发明授权
    • Real time polishing process monitoring
    • 实时抛光过程监控
    • US07052364B2
    • 2006-05-30
    • US10867087
    • 2004-06-14
    • Jian ZhangIan W. Wylie
    • Jian ZhangIan W. Wylie
    • B24B49/00
    • B24B37/013B24B49/10
    • A technique for in situ monitoring of polishing processes and other material removal processes employs a quartz crystal nanobalance embedded in a wafer carrier. Material removed from the wafer is deposited upon the surface of the crystal. The resulting frequency shift of the crystal gives an indication of the amount of material removed, allowing determination of an instantaneous removal rate as well as a process endpoint. The deposition on the quartz crystal nanobalance may be controlled by an applied bias. Multiple quartz crystal nanobalances may be used. In a further embodiment of the invention, the quartz crystal nanobalance is used to detect defect-causing events, such as a scratches, during the polishing process.
    • 用于原位监测抛光工艺和其它材料去除工艺的技术采用嵌入在晶片载体中的石英晶体纳米天平。 从晶片去除的材料沉积在晶体的表面上。 所得到的晶体频移给出了去除材料量的指示,允许确定瞬时去除速率以及过程终点。 可以通过施加的偏压来控制石英晶体纳米空间上的沉积。 可以使用多个石英晶体纳米天平。 在本发明的另一实施例中,在抛光过程中,使用石英晶体纳米天平来检测缺陷引起的事件,例如刮痕。
    • 77. 发明申请
    • Electrical connector with loading plate
    • 带连接板的电气连接器
    • US20050059288A1
    • 2005-03-17
    • US10940283
    • 2004-09-13
    • Nick LinJian ZhangHuayin Huang
    • Nick LinJian ZhangHuayin Huang
    • H01R12/16H01R13/62H01R4/50H01R13/625
    • H01R12/88
    • An electrical connector (1) for interconnecting an LGA chip (60) with a PCB includes an dielectric housing (10) defining a number of terminal passageways (16) with a plurality of electrical contacts (12) accommodated therein, a metal reinforcement (20) enclosing the housing (10) partly, a loading plate (40) pivotally mounted to an end of the reinforcement (20), and an actuator member (30) attached to an opposite end of the reinforcement (20) for engaging with the loading plate (40). The loading plate (40) defines a pair of pressing portions (43) to press the chip (60) against the connector (1). The pressing portion (43) defines some flexible materials (431) on the bottom surface (430) toward the housing (10) for protecting the chip (60) from being scraped by the loading plate (40).
    • 用于将LGA芯片(60)与PCB互连的电连接器(1)包括限定多个容纳在其中的多个电触头(12)的端子通道(16)的电介质外壳(10),金属加强件 )部分地封装所述壳体(10),可枢转地安装到所述加强件(20)的端部的装载板(40)和附接到所述加强件(20)的相对端的致动器构件(30),用于与所述加载 板(40)。 装载板(40)限定一对按压部分(43)以将芯片(60)压靠在连接器(1)上。 按压部分(43)在底表面(430)上朝向壳体(10)限定一些柔性材料(431),用于保护芯片(60)免受装载板(40)的刮擦。