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    • 77. 发明授权
    • Multi-level cell programming of PCM by varying the reset amplitude
    • 通过改变复位幅度对PCM进行多级单元编程
    • US07944740B2
    • 2011-05-17
    • US12564904
    • 2009-09-22
    • Chung H. LamMing-Hsiu LeeThomas NirschiBipin Rajendran
    • Chung H. LamMing-Hsiu LeeThomas NirschiBipin Rajendran
    • G11C11/00
    • G11C13/0004G11C11/5678G11C13/0069G11C2013/0083G11C2013/0092
    • A phase change memory device and a method for programming the same. The method includes determining a characterized lowest SET current and corresponding SET resistance for the phase change memory device. The method includes determining a characterized RESET current slope for the phase change memory device. The method also includes calculating a first current amplitude for a RESET pulse based on the characterized lowest SET current and the characterized RESET current slope. The method includes applying the RESET pulse to a target memory cell in the phase change memory device and measuring the resistance of the target memory cell. If the measured resistance is substantially less than a target resistance, the method further includes applying one or more additional RESET pulses. In one embodiment of the invention, the one or more additional RESET pulses have current amplitudes greater than a previously applied RESET pulse.
    • 相变存储器件及其编程方法。 该方法包括确定用于相变存储器件的特征最低的SET电流和相应的SET电阻。 该方法包括确定用于相变存储器件的特征化的RESET电流斜率。 该方法还包括基于所表征的最低SET电流和表征的RESET电流斜率来计算RESET脉冲的第一电流幅度。 该方法包括将RESET脉冲施加到相变存储器件中的目标存储单元并测量目标存储单元的电阻。 如果所测量的电阻远小于目标电阻,该方法还包括应用一个或多个附加的RESET脉冲。 在本发明的一个实施例中,一个或多个附加的RESET脉冲的电流幅度大于先前施加的RESET脉冲。
    • 78. 发明授权
    • Set algorithm for phase change memory cell
    • 相变存储单元的集合算法
    • US07869270B2
    • 2011-01-11
    • US12345384
    • 2008-12-29
    • Ming-Hsiu Lee
    • Ming-Hsiu Lee
    • G11C11/00
    • G11C13/0038G11C13/0004G11C13/0069G11C2013/0071G11C2013/009G11C2013/0092G11C2213/79
    • Memory devices and methods for operating such devices are described herein. A method is described herein for operating a memory cell comprising phase change material and programmable to a plurality of resistance states including a high resistance state and a lower resistance state. The method comprises applying a first bias arrangement to the memory cell to establish the lower resistance state, the first bias arrangement comprising a first voltage pulse. The method further comprises determining whether the memory cell is in the lower resistance state, and if the memory cell is not in the lower resistance state then applying a second bias arrangement to the memory cell. The second bias arrangement comprises a second voltage pulse having a pulse height greater than that of the first voltage pulse.
    • 这里描述了用于操作这样的设备的存储器件和方法。 本文描述了一种用于操作包括相变材料并且可编程为包括高电阻状态和较低电阻状态的多个电阻状态的存储单元的方法。 该方法包括将第一偏置装置施加到存储器单元以建立较低电阻状态,第一偏置装置包括第一电压脉冲。 该方法还包括确定存储器单元是处于较低电阻状态,以及如果存储单元不处于较低电阻状态,则向存储单元施加第二偏置布置。 第二偏置装置包括具有大于第一电压脉冲的脉冲高度的第二电压脉冲。