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    • 71. 发明授权
    • Device for forming blisters
    • 用于形成水泡的装置
    • US5312239A
    • 1994-05-17
    • US979594
    • 1992-11-20
    • Kouzaburo MatuzawaAtsushi Fujii
    • Kouzaburo MatuzawaAtsushi Fujii
    • B29C51/10B29C51/22B29C51/42
    • B29C51/225
    • A device for forming blisters in which a web material including a thermoplastic resin that is supplied to a rotary forming drum is heated and deformed by heat in accordance with the configuration of cavities provided on the rotary forming drum. A predetermined tension in the range of 5 kg/215 mm to 50 kg/215 mm is applied to the web material while feeding it. When the rotary forming drum consists of a polygonal drum, each peripheral surface of the drum is formed as a curved surface extending along an arc whose radius is larger than that of the circumscribed circle of the polygon. This invention can be used in a packing device for foods, drugs, etc.
    • 一种用于形成泡罩的装置,其中包括供应到旋转成型滚筒的热塑性树脂的网状材料根据设置在旋转成型滚筒上的空腔的形状通过加热而变形。 在将纸张材料送入时,在5kg / 215mm至50kg / 215mm的范围内施加预定的张力。 当旋转成型鼓由多边形鼓组成时,滚筒的每个周边表面形成为沿着半径大于多边形的外接圆的圆弧的弧形表面。 本发明可用于食品,药物等的包装装置
    • 75. 发明申请
    • PROCESS FOR PRODUCING ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER
    • 生产电子摄影成像的方法
    • US20130316283A1
    • 2013-11-28
    • US13983994
    • 2012-03-01
    • Atsushi FujiiHideaki MatsuokaHaruyuki TsujiNobuhiro NakamuraKazuhisa Shida
    • Atsushi FujiiHideaki MatsuokaHaruyuki TsujiNobuhiro NakamuraKazuhisa Shida
    • G03G7/00
    • G03G7/0053G03G5/0507G03G5/0525G03G5/10G03G5/104G03G5/142G03G5/144
    • To provide a process for producing an electrophotographic photosensitive member that can not easily cause any fog due to an increase in dark attenuation, a conductive layer is formed with use of a coating liquid for conductive layer prepared with use of a solvent, a binder material and metal oxide particles. The metal oxide particles (P) and binder material (B) in the coating liquid for conductive layer are in a mass ratio (P/B) of from 1.5/1.0 to 3.5/1.0. The metal oxide particle is a titanium oxide particle coated with tin oxide doped with phosphorus or tungsten. Where powder resistivity of the metal oxide particle is represented by x (Ω·cm) and powder resistivity of the titanium oxide particle as a core particle constituting the metal oxide particle is represented by y (Ω·cm), the y and the x satisfy the following relations (i) and (ii): 5.0×107≦y≦5.0×109  (i) 1.0×102≦y/x≦1.0×106  (ii).
    • 为了提供一种用于制造由于暗衰减增加而不容易引起灰雾的电子照相感光构件的制造方法,使用通过使用溶剂,粘合剂材料和粘合剂材料制备的导电层用涂布液形成导电层, 金属氧化物颗粒。 用于导电层的涂布液中的金属氧化物颗粒(P)和粘合剂材料(B)的质量比(P / B)为1.5 / 1.0至3.5 / 1.0。 金属氧化物颗粒是涂覆有掺杂有磷或钨的氧化锡的氧化钛颗粒。 其中金属氧化物颗粒的粉末电阻率由x(Ω·cm)表示,作为构成金属氧化物颗粒的核心颗粒的氧化钛颗粒的粉末电阻率由y(Ω·cm)表示,y和x满足 以下关系式(i)和(ii):5.0×107 @ y @ 5.0×109(i)1.0×102 @ y / x @ 1.0×106(ii)。
    • 78. 发明授权
    • Semiconductor memory and operating method of same
    • 半导体存储器及其操作方法相同
    • US07649796B2
    • 2010-01-19
    • US12005389
    • 2007-12-27
    • Masaki OkudaAtsushi Fujii
    • Masaki OkudaAtsushi Fujii
    • G11C7/00
    • G11C29/50G11C11/401G11C11/406G11C29/14G11C29/50012G11C2211/4061
    • A semiconductor memory has a memory cell array having dynamic memory cells. An access control circuit accesses the memory cells in response to an access command which is supplied externally. A refresh control circuit generates, during a test mode, a test refresh request signal in synchronization with the access command so as to execute a refresh operation of the memory cells when a refresh mask signal is at an invalid level. Also, the refresh control circuit prohibits generation of the test refresh request signal when the refresh mask signal is at a valid level. The test refresh request signal is generated or prohibited from being generated according to the level of the refresh mask signal. Thus, only a refresh operation needed for a test can be executed, and hence test efficiency can be improved.
    • 半导体存储器具有具有动态存储单元的存储单元阵列。 访问控制电路响应于外部提供的访问命令来访问存储器单元。 刷新控制电路在测试模式期间与访问命令同步地生成测试刷新请求信号,以便当刷新屏蔽信号处于无效级时执行存储器单元的刷新操作。 此外,当刷新屏蔽信号处于有效电平时,刷新控制电路禁止产生测试刷新请求信号。 生成或禁止根据刷新屏蔽信号的电平生成测试刷新请求信号。 因此,可以仅执行测试所需的刷新操作,因此可以提高测试效率。