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    • 71. 发明申请
    • BULK SUBSTRATE FET INTEGRATED ON CMOS SOI
    • 集成在CMOS SOI上的基极FET
    • US20120187492A1
    • 2012-07-26
    • US13425681
    • 2012-03-21
    • Anthony I. ChouArvind KumarShreesh NarasimhaNing SuHuiling Shang
    • Anthony I. ChouArvind KumarShreesh NarasimhaNing SuHuiling Shang
    • H01L27/088
    • H01L27/1207H01L21/84
    • An integrated circuit is provided that integrates an bulk FET and an SOI FET on the same chip, where the bulk FET includes a gate conductor over a gate oxide formed over a bulk substrate, where the gate dielectric of the bulk FET has the same thickness and is substantially coplanar with the buried insulating layer of the SOI FET. In a preferred embodiment, the bulk FET is formed from an SOI wafer by forming bulk contact trenches through the SOI layer and the buried insulating layer of the SOI wafer adjacent an active region of the SOI layer in a designated bulk device region. The active region of the SOI layer adjacent the bulk contact trenches forms the gate conductor of the bulk FET which overlies a portion of the underlying buried insulating layer, which forms the gate dielectric of the bulk FET.
    • 提供了一种集成电路,其将同一芯片上的体FET和SOI FET集成在一起,其中,本体FET包括在大块衬底上形成的栅极氧化物上的栅极导体,其中本体FET的栅极电介质具有相同的厚度, 与SOI FET的掩埋绝缘层基本共面。 在优选实施例中,通过在指定的大容量器件区域中与SOI层的有源区相邻的SOI层和SOI晶片的掩埋绝缘层形成体接触沟槽,从SOI晶片形成本体FET。 邻近体接触沟槽的SOI层的有源区域形成体FET的栅极导体,其覆盖形成本体FET的栅极电介质的下层掩埋绝缘层的一部分。
    • 72. 发明授权
    • Apparatus and method to harden computer system
    • 硬化计算机系统的装置和方法
    • US08132267B2
    • 2012-03-06
    • US12286352
    • 2008-09-30
    • Naga GurumoorthyArvind KumarMatthew J Parker
    • Naga GurumoorthyArvind KumarMatthew J Parker
    • G06F11/00
    • G06F21/88G06F9/4401G06F9/44542G06F21/575G06F21/73G06F2221/2141
    • In some embodiments, a processor-based system may include a processor, the processor having a processor identification, one or more electronic components coupled to the processor, at least one of the electronic components having a component identification, and a hardware security component coupled to the processor and the electronic component. The hardware security component may include a secure non-volatile memory and a controller. The controller may be configured to receive the processor identification from the processor, receive the at least one component identification from the one or more electronic components, and determine if a boot of the processor-based system is a provisioning boot of the processor-based system. If the boot is determined to be the provisioning boot, the controller may be configured to store a security code in the secure non-volatile memory, wherein the security code is based on the processor identification and the at least one component identification. Other embodiments are disclosed and claimed.
    • 在一些实施例中,基于处理器的系统可以包括处理器,处理器具有处理器标识,耦合到处理器的一个或多个电子部件,具有部件识别的电子部件中的至少一个以及耦合到 处理器和电子元件。 硬件安全组件可以包括安全的非易失性存储器和控制器。 控制器可以被配置为从处理器接收处理器标识,从一个或多个电子部件接收至少一个组件标识,并且确定基于处理器的系统的启动是否是基于处理器的系统的供应引导 。 如果确定引导是供应启动,则控制器可以被配置为将安全代码存储在安全非易失性存储器中,其中安全代码基于处理器标识和至少一个组件标识。 公开和要求保护其他实施例。
    • 77. 发明申请
    • FIELD EFFECT TRANSISTOR CONTAINING A WIDE BAND GAP SEMICONDUCTOR MATERIAL IN A DRAIN
    • 含有宽带带隙半导体材料的场效应晶体管
    • US20090121258A1
    • 2009-05-14
    • US11939017
    • 2007-11-13
    • Arvind Kumar
    • Arvind Kumar
    • H01L29/786H01L21/336
    • H01L21/26586H01L29/165H01L29/6653H01L29/66636H01L29/66659H01L29/7833H01L29/7848
    • A field effect transistor comprising a silicon containing body is provided. After formation of a gate dielectric, gate electrode, and a first gate spacer, a drain side trench is formed and filled with a wide band gap semiconductor material. Optionally, a source side trench may be formed and filled with a silicon germanium alloy to enhance an on-current of the field effect transistor. Halo implantation and source and drain ion implantation are performed to form various doped regions. Since the wide band gap semiconductor material as a wider band gap than that of silicon, impact ionization is reduced due to the use of the wide band gap semiconductor material in the drain, and consequently, a breakdown voltage of the field effect transistor is increased compared to transistors employing silicon in the drain region.
    • 提供了包括硅含量体的场效应晶体管。 在形成栅极电介质,栅极电极和第一栅极间隔物之后,形成漏极侧沟槽并填充宽带隙半导体材料。 可选地,可以形成源极沟槽并填充硅锗合金以增强场效应晶体管的导通电流。 进行光晕注入和源极和漏极离子注入以形成各种掺杂区域。 由于宽带隙半导体材料作为比硅的带隙宽的带隙,由于在漏极中使用宽带隙半导体材料,因此冲击电离降低,因此,场效应晶体管的击穿电压比较 涉及在漏极区域中使用硅的晶体管。
    • 78. 发明申请
    • Techniques for Enabling Multiple Vt Devices Using High-K Metal Gate Stacks
    • 使用高K金属栅极堆栈启用多个Vt器件的技术
    • US20090108373A1
    • 2009-04-30
    • US11927964
    • 2007-10-30
    • Martin M. FrankArvind KumarVijay NarayananJeffrey Sleight
    • Martin M. FrankArvind KumarVijay NarayananJeffrey Sleight
    • H01L27/11H01L21/8244
    • H01L27/1104H01L27/11H01L27/1108
    • Techniques for combining transistors having different threshold voltage requirements from one another are provided. In one aspect, a semiconductor device comprises a substrate having a first and a second nFET region, and a first and a second pFET region; a logic nFET on the substrate over the first nFET region; a logic pFET on the substrate over the first pFET region; a SRAM nFET on the substrate over the second nFET region; and a SRAM pFET on the substrate over the second pFET region, each comprising a gate stack having a metal layer over a high-K layer. The logic nFET gate stack further comprises a capping layer separating the metal layer from the high-K layer, wherein the capping layer is further configured to shift a threshold voltage of the logic nFET relative to a threshold voltage of one or more of the logic pFET, SRAM nFET and SRAM pFET.
    • 提供了用于组合彼此具有不同阈值电压要求的晶体管的技术。 在一个方面,一种半导体器件包括具有第一和第二nFET区的衬底以及第一和第二pFET区; 在第一nFET区域上的衬底上的逻辑nFET; 在第一pFET区上的衬底上的逻辑pFET; 位于第二nFET区上的衬底上的SRAM nFET; 以及在第二pFET区上的衬底上的SRAM pFET,每个包括在高K层上具有金属层的栅极堆叠。 逻辑nFET栅极堆叠还包括将金属层与高K层分隔开的覆盖层,其中封盖层还被配置为相对于逻辑pFET中的一个或多个的阈值电压移动逻辑nFET的阈值电压 ,SRAM nFET和SRAM pFET。
    • 80. 发明申请
    • Integrated circuit package resistance measurement
    • 集成电路封装电阻测量
    • US20070080696A1
    • 2007-04-12
    • US11248775
    • 2005-10-11
    • Arvind KumarKambiz Munshi
    • Arvind KumarKambiz Munshi
    • G01R27/08
    • G01R31/3004G01R27/00G01R31/2884G01R31/2896
    • For one embodiment, an integrated circuit includes a node to couple one or more components to the integrated circuit to carry current through a package for the integrated circuit. The integrated circuit also includes a monitor to measure a resistance of the package based at least in part on a reference resistance of the package and a resistance of one or more components that are to carry current through the package. For another embodiment, current through one or more components that are to carry current through a package for an integrated circuit is controlled. A resistance of the package is measured based at least in part on a reference resistance of the package and a resistance of one or more components that are to carry current through the package.
    • 对于一个实施例,集成电路包括将一个或多个组件耦合到集成电路以将电流传送通过集成电路的封装的节点。 集成电路还包括至少部分地基于封装的参考电阻和用于承载电流通过封装的一个或多个部件的电阻来测量封装的电阻的监视器。 对于另一实施例,控制通过用于集成电路的用于承载电流通过封装的一个或多个部件的电流。 封装的电阻至少部分地基于封装的参考电阻和用于承载电流通过封装的一个或多个部件的电阻来测量。