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    • 74. 发明授权
    • Immersion lithography apparatus
    • 浸渍光刻设备
    • US08817227B2
    • 2014-08-26
    • US12285432
    • 2008-10-03
    • Marco Koert StavengaHans Jansen
    • Marco Koert StavengaHans Jansen
    • G03B27/52G03B27/42G03B27/58G03B27/32
    • G03F7/7085G03F7/70341
    • An immersion lithographic apparatus is disclosed that includes a detector to measure a distance between a substrate support structure and/or a substrate and a fluid handling system and/or to detect when an item is present between the fluid handling system and a top surface of the substrate and/or substrate support structure. The detector may use information of an electrical property of the fluid provided by the fluid handling system to measure the distance. The detector may measure variation in resistance and/or in capacitance between an electrode of the fluid handling system and an electrode of the substrate and/or substrate support structure.
    • 公开了一种浸没式光刻设备,其包括用于测量衬底支撑结构和/或衬底与流体处理系统之间的距离的检测器和/或检测在流体处理系统和流体处理系统的顶表面之间何时存在物品 衬底和/或衬底支撑结构。 检测器可以使用由流体处理系统提供的流体的电性质的信息来测量距离。 检测器可以测量流体处理系统的电极和基板和/或基板支撑结构的电极之间的电阻和/或电容的变化。