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    • 71. 发明授权
    • Soft x-ray reduction camera for submicron lithography
    • 用于亚微米光刻的软X射线照相机
    • US5003567A
    • 1991-03-26
    • US308332
    • 1989-02-09
    • Andrew M. HawrylukLynn G. Seppala
    • Andrew M. HawrylukLynn G. Seppala
    • G02B17/06G03F7/20
    • B82Y10/00G02B17/0621G03F7/2039G03F7/70033G03F7/70233
    • Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm.sup.2. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics.
    • 可以使用形成x射线减少相机的X射线光学部件和球形成像透镜(反射镜)来执行软X射线投影光刻。 X射线减少能够使用4.5nm辐射将掩模的5x缩小图像投影到抗蚀剂涂覆的晶片上。 该设计的衍射限制分辨率为约135nm,景深为约2.8微米,视场为0.2cm 2。 使用制造在厚基板上并且可以相对无变形的X射线反射掩模(图案化的X射线多层反射镜),其中激光产生用于源的等离子体。 通过改变组件的光学图形和源特性,可以实现更高的分辨率和/或更大的面积。