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    • 61. 发明专利
    • JPS5417258B1
    • 1979-06-28
    • JP2691172
    • 1972-03-16
    • G11C11/23H01J29/39H01J31/60H01L29/00G11C11/30G11C11/34
    • An electron beam addressable memory is disclosed in which information is stored as an electric charge in a multilayered memory target. The multilayered memory comprises a conductive layer, an insulating layer having a plurality of charge storage sites, a layer of n-type and a layer of p-type semiconductor material having a p-n junction therebetween. The method of writing causes charge to be stored at selected sites in the insulating layer. The method of reading causes the current through the p-n junction, which is reverse biased, to vary in magnitude depending upon whether or not the beam impinges on a charged site. The read and write electron beams are preferably of the same energy and a different voltage is applied to the conductive layer during reading than is applied during writing. In another embodiment, the conducting layer is omitted and the effect of different voltages applied to the conducting layer is produced by secondary emission from the insulating layer.
    • 62. 发明专利
    • MEMORY SYSTEM
    • JPS5479524A
    • 1979-06-25
    • JP14677777
    • 1977-12-07
    • TOKYO SHIBAURA ELECTRIC CO
    • OOMURA KAZUMICHI
    • G11C11/30G11C11/23G11C27/00
    • PURPOSE:To constitute a memory system which can superpose and store different information by storing information while making the desired element in the desired pattern on the surface of a substrate, by scanning on the surface by charged particle beams, and by reading out information over an energy analysis of generated X rays. CONSTITUTION:Memory substrate 1 employs a Si singel-crystal substrate and Al ions are implanted as large as fixed area at a fixed voltage via the mask previously supplied with required information. Next, As ions are implanted as large as fixed area at a fixed voltage via the mask stored with another information. In this way, the memory part is provided with four regions where no ion, either Al or As and both As and A are injected. To read information, deflective scanning on memory substrate 1 by electron beam 2 is done, and X ray 3 generated through the irradiation of this electron beam is detected by wavelength-dispersive X-ray spectroscope 4, thereby separating different information.