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61. 发明申请

WO2003072242A2 MULTI-FUNCTIONAL PROTECTIVE MATERIALS AND METHODS FOR USE 审中-公开
标题翻译：多功能防护材料和使用方法
公开(公告)号：WO2003072242A2
公开(公告)日：2003-09-04
申请号：PCT/US2003/005558
申请日：2003-02-24
申请人： GENTEX CORPORATION
发明人： AXTELL, Holly, C. , HARTLEY, Scott, M. , SALLAVANTI, Robert, A.
IPC分类号： B01J20/06
CPC分类号： B01J20/28057 , A61K33/02 , A62D5/00 , B01J20/041 , B01J20/06 , B01J20/20 , B01J20/28007 , B01J20/28009 , B01J20/28011 , B01J20/28014 , B01J20/28019 , B01J20/28023 , B01J20/28028 , B01J20/28038 , B01J20/28052 , B01J20/28078 , B01J20/28088 , B01J20/28092 , B01J20/28097 , B01J20/3204 , B01J20/3236 , B01J20/3293 , B01J20/3295 , B82Y30/00 , Y10S977/777 , Y10S977/779 , Y10S977/881 , Y10T156/1089 , Y10T442/2525
摘要： A reactive-adsorptive protective material having an activated carbon adsorbent for adsorbing chemical impurities, wherein nanoparticular entities are loaded into and onto a surface of said activated carbon adsorbent to further impart chemically reactive and biocidal properties onto the activated carbon for providing protection against chemical and biological agents in the atmosphere. Advantageously, a superior reactive-adsorptive material is provided having the ability to kill microorganisms in addition to the ability to neutralize and decompose chemical substances, while at the same time not diminishing the adsorptive/reactive capabilities and effectiveness of either the substrate carbon or the loaded nanoparticular entities used.
摘要翻译：具有用于吸附化学杂质的活性炭吸附剂的活性吸附保护材料，其中纳米颗粒实体被装载到所述活性炭吸附剂的表面上并且被施加到所述活性炭吸附剂的表面上，以进一步赋予活化的活性炭吸附剂的化学反应性和杀生物性质碳，用于防止大气中的化学和生物制剂。有利的是，提供了一种优异的反应吸附材料，其除了能够中和和分解化学物质的能力之外还具有杀灭微生物的能力，同时不会降低底物碳或负载的吸附/反应能力和有效性使用的纳米颗粒实体。

62. 发明申请

WO2003069271A1 IMPROVED SCANNING PROBE MICROSCOPE 审中-公开
标题翻译：改进的扫描探针显微镜
公开(公告)号：WO2003069271A1
公开(公告)日：2003-08-21
申请号：PCT/KR2002/002222
申请日：2002-11-27
申请人： PSIA CORPORATION
发明人： HONG, Jae-Wan , KWON, Joon-Hyung , PARK, Sang-Il
IPC分类号： G01B7/34
CPC分类号： G01Q20/02 , G01Q10/02 , G01Q10/04 , G01Q70/02 , Y10S977/732 , Y10S977/849 , Y10S977/869 , Y10S977/87 , Y10S977/873 , Y10S977/881
摘要： A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.
摘要翻译：扫描探针显微镜使用两个不同的扫描仪（也称为“扫描阶段”），其彼此完全分离，并且由固定框架物理分离。一个扫描仪（称为“xy扫描仪”）扫描平面中的样品（也称为“xy平面”），而另一个扫描仪（称为“z扫描仪”）扫描探针尖端（其在悬臂的自由端支撑））在垂直于该平面的方向（也称为“z方向”）上。两个扫描仪之间的分离可以消除串扰。

63. 发明申请

WO01024696A1 FULLERENE CONTRAST AGENT FOR MAGNETIC RESONANCE IMAGING AND SPECTROSCOPY 审中-公开
标题翻译：用于磁共振成像和光谱的FULLERENE对比剂
公开(公告)号：WO01024696A1
公开(公告)日：2001-04-12
申请号：PCT/US2000/027500
申请日：2000-10-05
IPC分类号： G01R33/28 , A61B5/055 , A61K49/00 , A61K49/18 , C01B31/02 , C01B31/00 , G01N24/00
CPC分类号： B82Y15/00 , A61K49/189 , B82Y5/00 , Y10S977/734 , Y10S977/865 , Y10S977/881 , Y10S977/93 , Y10T436/24
摘要： A non-toxic contrast agent for enhancing contrast in in vivo magnetic resonance measurements, comprised of a water-soluble, stable paramagnetic fullerene that is free of paramagnetic metal species. A preferred contrast agent is a fullerol having at least one unpaired electron.
摘要翻译：用于增强体内磁共振测量中的对比度的无毒造影剂，其由不含顺磁性金属物质的水溶性，稳定的顺磁性富勒烯组成。优选的造影剂是具有至少一个不成对电子的富勒醇。

64. 发明申请

WO00067290A2 INTEGRATED MICROCOLUMN AND SCANNING PROBE MICROSCOPE ARRAYS 审中-公开
标题翻译：集成微波和扫描探针微阵列阵列
公开(公告)号：WO00067290A2
公开(公告)日：2000-11-09
申请号：PCT/US2000/012241
申请日：2000-05-04
IPC分类号： G01B7/30 , G01B7/00 , G01B21/30 , G01N23/225 , G01Q30/02 , G01Q60/00 , H01J37/16 , H01J37/28 , H01J37/317 , H01J37/30
CPC分类号： G01Q30/02 , H01J37/28 , H01J37/3174 , H01J2237/1205 , H01J2237/2818 , Y10S977/707 , Y10S977/849 , Y10S977/86 , Y10S977/869 , Y10S977/874 , Y10S977/881 , Y10S977/887
摘要： An apparatus for surface inspection and processing of a wafer (12) includes a microcolumn (14) and an associated scanning probe microscope (16). The microcolumn enables high speed scanning of the wafer at a relatively high resolution, while the scanning probe microscope provides atomic resolution of highly localized areas of the wafer. The microcolumn and scanning probe microscope can be partially fabricated out of the same substrate. Additionally, the microcolumn and scanning probe microscope can be a portion of an array of microcolumns and/or scanning probe microscopes. The apparatus may be used for imaging, lithography and spectroscopy.
摘要翻译：用于晶片（12）的表面检查和处理的设备包括微柱（14）和相关联的扫描探针显微镜（16）。微柱可以以相对高的分辨率高速扫描晶片，而扫描探针显微镜提供晶片的高度局部化区域的原子分辨率。微柱和扫描探针显微镜可以由相同的基底部分制成。另外，微柱和扫描探针显微镜可以是微柱阵列和/或扫描探针显微镜的一部分。该装置可用于成像，光刻和光谱学。

65. 发明申请

WO00058759A2 ACTIVE PROBE FOR AN ATOMIC FORCE MICROSCOPE AND METHOD OF USE THEREOF 审中-公开
标题翻译：用于原子力显微镜的主动探测器及其使用方法
公开(公告)号：WO00058759A2
公开(公告)日：2000-10-05
申请号：PCT/US2000/005450
申请日：2000-03-03
IPC分类号： G01B21/30 , G01Q10/06 , G01Q20/02 , G01Q60/24 , G01Q60/34 , G05D3/00 , G05D3/12 , G02B
CPC分类号： G01Q60/34 , G01Q10/045 , G01Q10/065 , Y10S977/849 , Y10S977/851 , Y10S977/863 , Y10S977/869 , Y10S977/875 , Y10S977/881
摘要： An AFM (10) that combines an AFM Z position actuator (16) and a self-actuated Z-position cantilever (20) (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z-position measurements. The self-actuated cantilever (20) includes a Z-positioning element (36) integrated therewith and an oscillator that oscillates the cantilever (20) at a resonant frequency and at an oscillation amplitude equal to a setpoint value. The AFM includes a first feedback circuit (12) nested within a second feedback circuit (14), wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever (20) during a scanning operation, and the second feedback circuit (14) is responsive to the cantilever control signal to generate a position control signal.
摘要翻译： AFM（10）组合了AFM Z位置执行器（16）和自动Z位置悬臂（20）（均可在循环模式和接触模式下操作）与适当的嵌套反馈控制电路实现高速成像和精确的Z位置测量。自动驱动悬臂（20）包括与其成一体的Z定位元件（36）和振荡器，振荡器以共振频率和等于设定值的振荡振幅振荡悬臂（20）。 AFM包括嵌套在第二反馈电路（14）内的第一反馈电路（12），其中第一反馈电路在扫描操作期间响应于自致动悬臂（20）的垂直位移而产生悬臂控制信号，以及第二反馈电路（14）响应于悬臂控制信号以产生位置控制信号。

66. 发明申请

WO00044938A1 METHOD FOR MEASURING INTRAMOLECULAR FORCES BY ATOMIC FORCE MICROSCOPY 审中-公开
标题翻译：通过原子力显微镜测量分子内力的方法
公开(公告)号：WO00044938A1
公开(公告)日：2000-08-03
申请号：PCT/US2000/001647
申请日：2000-01-27
IPC分类号： C12Q1/68 , G01Q30/20 , G01Q60/24
CPC分类号： G01Q60/42 , Y10S977/853 , Y10S977/863 , Y10S977/873 , Y10S977/881 , Y10S977/924
摘要： A method is disclosed for measuring intramolecular forces within a sample compound by providing an atomic force microscope that includes a sample support member and a cantilever. The sample support member has a plurality of protrusions, and each protrusion has an apical substrate region that has been chemically modified to have a sample compound immobilized thereon. The cantilever has a fixed end and a free end, the free end having a surface region that has been chemically modified to have a grasping compound immobilized thereon. To measure intramolecular forces within the sample compound, the relative position and orientation of the cantilever and the sample support member are controlled to select a particular protrusion and to allow a molecule of the grasping compound to bind with a molecule of the sample compound. Then, the relative position and orientation of the cantilever and the sample support member are controlled to vary the distance between the cantilever and the sample support member so that the forces exerted on the cantilever as the distance between the cantilever and the sample support member is varied and as the molecule of the sample compound is stretched between the cantilever and the sample support member can be measured.
摘要翻译：公开了一种通过提供包括样品支撑构件和悬臂的原子力显微镜来测量样品化合物内的分子内力的方法。样品支撑构件具有多个突起，并且每个突起具有经化学修饰以固定其上的样品化合物的顶端基底区域。悬臂具有固定端和自由端，自由端具有经化学修饰以具有固定在其上的抓握化合物的表面区域。为了测量样品化合物中的分子内力，控制悬臂和样品支撑构件的相对位置和取向以选择特定的突起并使得抓握化合物的分子与样品化合物的分子结合。然后，控制悬臂和样品支撑构件的相对位置和取向以改变悬臂和样品支撑构件之间的距离，使得当悬臂与样品支撑构件之间的距离变化时施加在悬臂上的力并且可以测量样品化合物的分子在悬臂和样品支撑构件之间的拉伸。

67. 发明申请

WO1993007905A2 TREATED APATITE PARTICLES FOR MEDICAL DIAGNOSTIC IMAGING 审中-公开
标题翻译：用于医学诊断成像的治疗APATITE颗粒
公开(公告)号：WO1993007905A2
公开(公告)日：1993-04-29
申请号：PCT/US1992009032
申请日：1992-10-21
申请人： MALLINCKRODT MEDICAL, INC.
发明人： MALLINCKRODT MEDICAL, INC. , DEUTSCH, Edward, A. , DEUTSCH, Karen, F. , CACHERIS, William, P. , RALSTON, William, P. , WHITE, David, H. , WOULFE, Steven, R.
IPC分类号： A61K47/48
CPC分类号： A61K49/225 , A61B90/39 , A61B2090/3925 , A61B2090/3954 , A61K47/6923 , A61K49/1818 , A61K49/183 , A61K49/1842 , A61K49/1881 , Y10S977/722 , Y10S977/775 , Y10S977/881 , Y10S977/91 , Y10S977/927 , Y10S977/928 , Y10S977/929 , Y10S977/93 , Y10T436/24
摘要： Treated apatite particles are disclosed for enhancing medical diagnostic imaging such as magnetic resonance imaging ("MRI"), magnetic resonance spectroscopy ("MRS"), magnetic resonance spectroscopy imaging ("MRSI"), X-ray diagnostic imaging, and ultrasound imaging. Novel coating and manufacturing techniques are disclosed to control particle size and particle aggregation resulting in compositions for organ specific imaging of the liver, spleen, gastrointestinal tract, or tissue disease states. Depending on the diagnostic imaging technique, apatite particles are treated to be paramagnetic, radiopaque, or echogenic. The apatite particles may also be fluorinated to form stable fluoroapatite compositions useful for F imaging. Also disclosed are diagnostic compositions and methods of performing medical diagnostic procedures which involve administering to a warm-blooded animal a diagnostically effective amount of the above-described apatite particles and then performing the medical diagnostic procedure.
摘要翻译：公开了治疗磷灰石颗粒用于增强诸如磁共振成像（“MRI”），磁共振光谱（“MRS”），磁共振光谱成像（“MRSI”），X射线诊断成像和超声成像的医学诊断成像。公开了新颖的涂层和制造技术来控制颗粒尺寸和颗粒聚集，从而导致用于肝脏，脾脏，胃肠道或组织疾病状态的器官特异性成像的组合物。根据诊断成像技术，磷灰石颗粒被治疗为顺磁性，不透射线或回声。磷灰石颗粒也可以被氟化以形成用于<19> F成像的稳定的氟磷灰石组合物。还公开了执行医学诊断程序的诊断组合物和方法，其涉及向温血动物施用诊断有效量的上述磷灰石颗粒，然后进行医学诊断程序。

68. 发明申请

WO2008079349A3 SYSTEMS AND METHODS FOR UTILIZING SCANNING PROBE SHAPE CHARACTERIZATION 审中-公开
标题翻译：使用扫描探针形状表征的系统和方法
公开(公告)号：WO2008079349A3
公开(公告)日：2008-11-27
申请号：PCT/US2007026193
申请日：2007-12-21
申请人： VEECO METROLOGY INC , BAO TIANMING , LIU HAO-CHIH , GREGORY DAHLEN A , JAIN ROHIT
发明人： BAO TIANMING , LIU HAO-CHIH , GREGORY DAHLEN A , JAIN ROHIT
IPC分类号： G01B21/30 , G01Q30/06 , G01Q40/00 , H01J37/28
CPC分类号： G01Q40/00 , G01Q30/06 , Y10S977/878 , Y10S977/881
摘要： A scanning probe microscope's probe tip dimensions as they exist or existed for a certain data or measurement are inferred based on probe activity taking place since a probe characterization procedure was performed. The inferred probe tip dimensions can be used to correct nanoscale measurements taken by the probe to account for changes in the probe's geometry such as wear.
摘要翻译：扫描探针显微镜的探针尖端尺寸，因为存在或存在某些数据或测量是基于探针活性发生，因为执行探针表征程序。推测的探头尖端尺寸可用于校正探针所采取的纳米尺度测量，以考虑探头几何形状（如磨损）的变化。

69. 发明申请

WO2003060944A1 POINT SOURCE FOR PRODUCING ELECTRONS BEAMS 审中-公开
标题翻译：生产电子束的要点
公开(公告)号：WO2003060944A1
公开(公告)日：2003-07-24
申请号：PCT/US2003/000603
申请日：2003-01-09
申请人： BIOMED SOLUTIONS, LLC , SCHNEIKER, Conrad, W. , HAMEROFF, Stuart , GRAY, Robert, W.
发明人： SCHNEIKER, Conrad, W. , HAMEROFF, Stuart , GRAY, Robert, W.
IPC分类号： H01J37/073
CPC分类号： B82Y10/00 , H01J3/022 , H01J37/073 , H01J2201/30469 , Y10S977/881
摘要： An apparatus (20) for producing an electron beam (34), containing a vacuum chamber (16), a source of electron beams (332) within the vacuum chamber, and a device for focusing the electron beams. An electron transparent window (12) is formed at the end of the vacuum chamber; and the vacuum chamber has a volume of less than about 1 cubic millimeter and a pressure of less than 10 -7 Torr. In one embodiment, the focusing device is located outside of the vacuum chamber.
摘要翻译：一种用于制造电子束（34）的装置（20），其包含真空室（16），真空室内的电子束源（332）和用于聚焦电子束的装置。电子透明窗（12）形成在真空室的端部; 真空室的体积小于约1立方毫米，压力小于10-7乇。在一个实施例中，聚焦装置位于真空室外部。

70. 发明申请

WO0163555A3 IMAGE DECONVOLUTION TECHNIQUES FOR PROBE SCANNING APPARATUS 审中-公开
标题翻译：用于探测扫描装置的图像解压缩技术
公开(公告)号：WO0163555A3
公开(公告)日：2003-01-23
申请号：PCT/US0105434
申请日：2001-02-21
申请人： MASSACHUSETTS INST TECHNOLOGY
发明人： AUMOND BERNARDO D , YOUCEF-TOUMI KAMAL
IPC分类号： G01Q10/00 , G01Q30/04 , G01Q30/06 , G01Q60/24 , G01Q80/00 , G06F17/15 , G06T1/00 , G06T5/00 , G21K7/00
CPC分类号： G06T5/003 , G01Q30/06 , G01Q40/00 , G06T5/30 , G06T2207/10056 , Y10S977/85 , Y10S977/863 , Y10S977/875 , Y10S977/881
摘要： An apparatus and method are provided for processing the images obtained from an atomic force microscopy when profiling high aspect ratio features. A deconvolution technique for deconvolving the sample image includes the use of multiple images but does not require exact calibration of the scanning probe. In one embodiment, erosion and dilation techniques are used to obtain an undistorted image of the sample being measured. In another embodiment, Legendre transforms are used to obtain an undistorted image of the sample being measured. Also described is a technique for measuring the tip radius of the scanning probe.
摘要翻译：提供了一种装置和方法，用于在分析高纵横比特征时处理从原子力显微镜获得的图像。用于对样本图像进行去卷积的去卷积技术包括使用多个图像，但不需要精确校准扫描探针。在一个实施例中，使用侵蚀和扩张技术来获得待测样品的未失真图像。在另一个实施例中，勒让德变换用于获得被测样本的未失真图像。还描述了一种用于测量扫描探针的尖端半径的技术。

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