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    • 68. 发明申请
    • Novel hard bias design for sensor applications
    • 传感器应用的新型硬偏置设计
    • US20060132988A1
    • 2006-06-22
    • US11016506
    • 2004-12-17
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • G11B5/33G11B5/127
    • B82Y25/00B82Y10/00G11B5/3932G11B2005/3996Y10T29/49032
    • A hard bias structure for biasing a free layer in a MR element within a magnetic read head is comprised of a soft magnetic underlayer such as NiFe and a hard bias layer comprised of Co78.6Cr5.2Pt16.2 or Co65Cr15Pt20 that are rigidly exchange coupled to ensure a well aligned longitudinal biasing direction with minimal dispersions. The hard bias structure is formed on a BCC seed layer such as CrTi to improve lattice matching. The hard bias structure may be laminated in which each of the underlayers and hard bias layers has a thickness that is adjusted to optimize the total HC, Mrt, and S values. The present invention encompasses CIP and CPP spin values, MTJ devices, and multi-layer sensors. A larger process window for fabricating the hard bias structure is realized and lower asymmetry output and NBLW reject rates during a read operation are achieved.
    • 用于偏置磁读头内的MR元件中的自由层的硬偏压结构由诸如NiFe的软磁性底层和由Co ++ 78.6Cr 5.2构成的硬偏置层组成, 或刚性交换耦合以确保良好对准的/SUB>Pt16.2 或Co 15 Cr 15 纵向偏置方向最小分散。 在诸如CrTi的BCC种子层上形成硬偏压结构以改善晶格匹配。 可以层压硬偏压结构,其中每个底层和硬偏压层具有被调节以使总H C,M L t和S的最大化的厚度 价值观。 本发明包括CIP和CPP旋转值,MTJ装置和多层传感器。 实现了用于制造硬偏置结构的更大的工艺窗口,并且实现了读操作期间较低的不对称输出和NBLW废弃率。