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    • 62. 发明授权
    • Non volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US07643358B2
    • 2010-01-05
    • US11756936
    • 2007-06-01
    • Michio NakagawaHiroshi Nakamura
    • Michio NakagawaHiroshi Nakamura
    • G11C7/00
    • G11C16/08
    • A non volatile semiconductor memory device wherein it is possible to transfer Vpp without a drop in voltage of the transfer transistor Vth (threshold voltage) in a transfer circuit or decoder circuit for selectively transferring Vpp by using a usual LVP (low voltage P type transistor) to reduce step(s) of production process and costs. An LVP (low voltage P type transistor) instead of a HVP (high voltage P type transistor) for a transfer circuit is used. Two-way diodes each of which threshold value becomes about Vdd are inserted between the gate and the drain.
    • 一种非易失性半导体存储器件,其中可以在用于通过使用通常的LVP(低电压P型晶体管)选择性地传输Vpp的传输电路或解码器电路中传输Vpp而不会传输晶体管Vth的电压下降(阈值电压) 以减少生产过程和成本的步骤。 使用LVP(低电压P型晶体管)代替用于传输电路的HVP(高压P型晶体管)。 阈值变为约Vdd的双向二极管插入在栅极和漏极之间。
    • 67. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE
    • 半导体存储器件
    • US20090103368A1
    • 2009-04-23
    • US12339153
    • 2008-12-19
    • Mikio OGAWANorihiro FujitaHiroshi Nakamura
    • Mikio OGAWANorihiro FujitaHiroshi Nakamura
    • G11C11/34H01L29/788
    • G11C7/12G11C7/065G11C16/0483G11C16/24G11C16/28
    • A semiconductor memory device includes a memory cell array and a sense amp circuit. The memory cell array includes bit lines connected to memory cells operative to store first logic data and second logic data smaller in cell current than the first logic. The sense amp circuit has a clamp transistor operative to clamp a bit line voltage. The sense amp circuit is operative to detect data in a selected memory cell via the clamp transistor and the bit line. The sense amp circuit is operative to read data from the selected memory cell in at least the two of first and second read cycles while a control voltage is applied to a gate of the clamp transistor. Different control voltages are applied to the gate of the clamp transistor in the first and second read cycles.
    • 半导体存储器件包括存储单元阵列和读出放大器电路。 存储单元阵列包括连接到存储器单元的位线,该存储器单元可操作以存储第一逻辑数据和小区电流中比第一逻辑小的第二逻辑数据。 感测放大器电路具有用于钳位位线电压的钳位晶体管。 感测放大器电路用于通过钳位晶体管和位线检测所选存储单元中的数据。 当将控制电压施加到钳位晶体管的栅极时,感测放大器电路用于在至少两个第一和第二读取周期中从所选存储单元读取数据。 在第一和第二读取周期中,不同的控制电压施加到钳位晶体管的栅极。
    • 68. 发明申请
    • Remote Control System
    • 遥控系统
    • US20090067847A1
    • 2009-03-12
    • US11887279
    • 2006-03-06
    • Hiroshi Nakamura
    • Hiroshi Nakamura
    • H04B10/00
    • G08C23/04G08C2201/32
    • A quick selection of a depression key provided with a remote controller is impeded, so that controllable characteristics of the remote controller are deteriorated, and a lifetime of a cell provided on the side of the remote controller is reduced in order to acquire transport motional information.While a remote control system is equipped with the remote controller and an infrared communication apparatus 33, a pattern for reflecting diffraction light by illumination light is provided with the remote controller, whereas a transmitting/receiving unit 37 and a control unit 39 are provided with the infrared communication apparatus 33. A light emitting unit 11 for emitting light to the pattern, and a light receiving unit 17 for receiving reflection light from the pattern are provided with the transmitting/receiving unit 37. A detecting unit 41 for detecting intensity of the light received by the light receiving unit 17, a calculating unit 43 for binary-processing the intensity of the detected light to obtain binary information in response to the intensity of the detected light, and a converting unit 45 for converting the binary information into a control signal for a main appliance are provided with the control unit 39.
    • 阻碍了设置有遥控器的按键的快速选择,使得遥控器的可控特性恶化,并且减小了设置在遥控器一侧的单元的寿命以便获取传送运动信息。 在远程控制系统配备有遥控器和红外线通信装置33的情况下,遥控器设置有用于通过照明光反射衍射光的图案,而发送/接收单元37和控制单元39设置有 红外通信设备33.用于向该图案发射光的发光单元11和用于从该图案接收反射光的光接收单元17设置有发送/接收单元37.用于检测光的强度的检测单元41 由光接收单元17接收的计算单元43,用于响应于检测到的光的强度二次处理检测到的光的强度以获得二进制信息的计算单元43和用于将二进制信息转换为控制信号的转换单元45 主设备设置有控制单元39。
    • 70. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07486562B2
    • 2009-02-03
    • US11194608
    • 2005-08-02
    • Mikio OgawaNorihiro FujitaHiroshi Nakamura
    • Mikio OgawaNorihiro FujitaHiroshi Nakamura
    • G11C11/34
    • G11C7/12G11C7/065G11C16/0483G11C16/24G11C16/28
    • A semiconductor memory device comprises a memory cell array and a sense amp circuit. The memory cell array includes bit lines connected to memory cells operative to store first logic data and second logic data smaller in cell current than the first logic. The sense amp circuit has a clamp transistor operative to clamp a bit line voltage. The sense amp circuit is operative to detect data in a selected memory cell via the clamp transistor and the bit line. The sense amp circuit is operative to read data from the selected memory cell in at least the two of first and second read cycles while a control voltage is applied to a gate of the clamp transistor. Different control voltages are applied to the gate of the clamp transistor in the first and second read cycles.
    • 半导体存储器件包括存储单元阵列和读出放大器电路。 存储单元阵列包括连接到存储器单元的位线,该存储器单元可操作以存储第一逻辑数据和小区电流中比第一逻辑小的第二逻辑数据。 感测放大器电路具有用于钳位位线电压的钳位晶体管。 感测放大器电路用于通过钳位晶体管和位线检测所选存储单元中的数据。 当将控制电压施加到钳位晶体管的栅极时,感测放大器电路用于在至少两个第一和第二读取周期中从所选存储单元读取数据。 在第一和第二读取周期中,不同的控制电压施加到钳位晶体管的栅极。