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61. 发明授权

US06990040B2 Method for writing data to a semiconductor memory comprising a peripheral circuit section and a memory core section including a memory cell 失效
标题翻译：将数据写入半导体存储器的方法，该半导体存储器包括外围电路部分和包括存储单元的存储器核心部分
公开(公告)号：US06990040B2
公开(公告)日：2006-01-24
申请号：US10930591
申请日：2004-08-31
申请人： Shigeo Ohshima , Hiroyuki Ohtake , Katsumi Abe
发明人： Shigeo Ohshima , Hiroyuki Ohtake , Katsumi Abe
IPC分类号： G11C8/00
CPC分类号： G11C7/1069 , G11C7/1039 , G11C7/1051 , G11C7/1078 , G11C7/1096 , G11C11/4076 , G11C2207/107
摘要： An input data register for latching write data is arranged in a position near a memory cell array of a memory core section. The input data register is arranged on the upstream side of a data path used for writing data into a memory cell. Write data input to a data pin which is arranged in the end position on the downstream side is latched in the input data register via a data input buffer, serial/parallel converting circuit and write data line. Data latched in the input data register is written into a memory cell via a DQ write driver, data line pair, I/O gate and bit line pair in a next write cycle.
摘要翻译：用于锁存写入数据的输入数据寄存器被布置在存储器芯部分的存储单元阵列附近的位置。输入数据寄存器布置在用于将数据写入存储单元的数据路径的上游侧。将写入数据引脚的数据输入写入到下游侧的终端位置，经由数据输入缓冲器，串行/并行转换电路和写数据线被锁存在输入数据寄存器中。锁存在输入数据寄存器中的数据在下一个写周期中通过DQ写驱动器，数据线对，I / O门和位线对写入存储单元。

62. 发明授权

US06885606B2 Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the same 失效
标题翻译：具有多个存储体的同步半导体存储器件及其控制方法
公开(公告)号：US06885606B2
公开(公告)日：2005-04-26
申请号：US10353271
申请日：2003-01-28
申请人： Noriyasu Kumazaki , Shigeo Ohshima , Kazuaki Kawaguchi
发明人： Noriyasu Kumazaki , Shigeo Ohshima , Kazuaki Kawaguchi
IPC分类号： G01R31/30 , G01R31/28 , G01R31/3185 , G11C7/10 , G11C8/12 , G11C11/401 , G11C29/06 , G11C8/00
CPC分类号： G11C7/1066 , G11C7/1072 , G11C8/12
摘要： A synchronous semiconductor memory device includes a plurality of memory banks which read data from memory cells and write data into the memory cells, a command decoder circuit which receives a command, detects whether the command is a read command or a write command, and, when detecting a read command or a write command, outputs a first control signal that enables a read operation or a write operation in the plurality of memory banks, bank select circuits which activate a second control signal to activate each of the memory banks, and bank timer circuits which deactivate the activated second control signal and perform control in such a manner that the timing with which the second control signal is deactivated in a test mode differs from that in a normal mode.
摘要翻译：同步半导体存储器件包括从存储器单元读取数据并将数据写入存储单元的多个存储器组，接收命令的命令解码器电路，检测该命令是读命令还是写命令，以及何时检测读取命令或写入命令，输出启用多个存储体中的读取操作或写入操作的第一控制信号，激活第二控制信号的存储体选择电路以激活每个存储体，以及存储体定时器电路，其使激活的第二控制信号去激活并执行控制，使得在测试模式中第二控制信号被去激活的定时与正常模式不同。

63. 发明授权

US06867993B2 Semiconductor memory device 失效
标题翻译：半导体存储器件
公开(公告)号：US06867993B2
公开(公告)日：2005-03-15
申请号：US09910603
申请日：2001-07-19
申请人： Shigeo Ohshima , Nobuo Watanabe
发明人： Shigeo Ohshima , Nobuo Watanabe
IPC分类号： G11C11/401 , G11C5/06 , G11C29/34
CPC分类号： G11C5/066 , H01L2224/4826
摘要： In the package, a semiconductor chip is accommodated. This semiconductor chip has n pads (n is a natural number). The package has n pins connected to n pads.
摘要翻译：在封装中，容纳半导体芯片。该半导体芯片具有n个焊盘（n是自然数）。该封装有n个引脚连接到n个焊盘。

64. 发明授权

US06795370B2 Fast cycle RAM having improved data write operation 失效
标题翻译：快速循环RAM具有改进的数据写入操作
公开(公告)号：US06795370B2
公开(公告)日：2004-09-21
申请号：US10369945
申请日：2003-02-18
申请人： Shigeo Ohshima , Hiroyuki Ohtake , Katsumi Abe
发明人： Shigeo Ohshima , Hiroyuki Ohtake , Katsumi Abe
IPC分类号： G11C800
CPC分类号： G11C7/1069 , G11C7/1039 , G11C7/1051 , G11C7/1078 , G11C7/1096 , G11C11/4076 , G11C2207/107
摘要： An input data register for latching write data is arranged in a position near a memory cell array of a memory core section. The input data register is arranged on the upstream side of a data path used for writing data into a memory cell. Write data input to a data pin which is arranged in the end position on the downstream side is latched in the input data register via a data input buffer, serial/parallel converting circuit and write data line. Data latched in the input data register is written into a memory cell via a DQ write driver, data line pair, I/O gate and bit line pair in a next write cycle.
摘要翻译：用于锁存写入数据的输入数据寄存器被布置在存储器芯部分的存储单元阵列附近的位置。输入数据寄存器布置在用于将数据写入存储单元的数据路径的上游侧。将写入数据引脚的数据输入写入到下游侧的终端位置，经由数据输入缓冲器，串行/并行转换电路和写数据线被锁存在输入数据寄存器中。锁存在输入数据寄存器中的数据在下一个写周期中通过DQ写驱动器，数据线对，I / O门和位线对写入存储单元。

65. 发明授权

US06545941B2 Clock synchronous circuit 失效
公开(公告)号：US06545941B2
公开(公告)日：2003-04-08
申请号：US09966664
申请日：2001-09-27
申请人： Koji Kato , Shigeo Ohshima
发明人： Koji Kato , Shigeo Ohshima
IPC分类号： G11C800
CPC分类号： G11C7/1066 , G11C7/1045 , G11C7/1072 , G11C7/22 , G11C7/222 , G11C11/4076
摘要： A clock synchronous circuit is stopped or started in accordance with the situation. More specifically, the clock synchronous circuit is stopped when no synchronous clock is necessary or in modes, such as a standby mode, bank active mode, refresh mode, and write mode, other than a read mode. In the read mode, the clock synchronous circuit is operated because a synchronous clock is necessary to output data. In the read mode, the number of clocks, i.e., CL, required from the time a read command is input to the time data is actually output, is 3 or more, when restarting and preamble of the clock synchronous circuit are taken into consideration.

66. 发明授权

US06226204B1 Semiconductor integrated circuit device 失效
标题翻译：半导体集成电路器件
公开(公告)号：US06226204B1
公开(公告)日：2001-05-01
申请号：US09141450
申请日：1998-08-27
申请人： Kazuko Inuzuka , Katsushi Nagaba , Shigeo Ohshima
发明人： Kazuko Inuzuka , Katsushi Nagaba , Shigeo Ohshima
IPC分类号： G11C1604
CPC分类号： G11C7/1057 , G11C7/1051 , G11C7/106 , G11C7/1072 , G11C7/22 , G11C7/222 , G11C11/4076 , G11C11/4093 , G11C11/4096
摘要： The data output circuit in a clock synchronous DRAM comprises a first data transfer circuit to which the data read from a memory is input and which transfers the input data to the output side in synchronization with an internal clock, an equalizing circuit to which the output of the first data transfer circuit is input during a read operation by a burst operation and to which high-impedance data is input after the read operation, a second data transfer circuit connected to the equalizing circuit, and an output buffer to which the output of the second data transfer circuit is input. The second data transfer circuit transfers all the data to the output buffer in synchronization with an output clock. This eliminates the dependence of the data access time and data hold time on data item and/or cycle and facilitates the timing control of the output control signal.
摘要翻译：时钟同步DRAM中的数据输出电路包括第一数据传输电路，从存储器读取的数据被输入到该第一数据传输电路，并且将输入数据与内部时钟同步地传送到输出端;均衡电路，第一数据传送电路在读操作期间通过脉冲串操作输入，并且在读操作之后输入高阻数据，连接到均衡电路的第二数据传输电路和输出缓冲器第二数据传输电路被输入。第二数据传输电路与输出时钟同步地将所有数据传送到输出缓冲器。这消除了数据访问时间和数据保持时间对数据项和/或周期的依赖性，并且便于输出控制信号的定时控制。

67. 发明授权

US6046955A Semiconductor memory device with testable spare columns and rows 失效
标题翻译：半导体存储器件具有可测试的备用列和行
公开(公告)号：US6046955A
公开(公告)日：2000-04-04
申请号：US271468
申请日：1999-03-17
申请人： Yasuhiro Suematsu , Shigeo Ohshima
发明人： Yasuhiro Suematsu , Shigeo Ohshima
IPC分类号： G01R31/28 , G11C8/12 , G11C11/401 , G11C11/407 , G11C29/04 , G11C29/34 , G11C8/00
CPC分类号： G11C8/12
摘要： A synchronous dynamic random access memory has spare columns which can be tested before shipping. In the memory, a mode set register outputs a multibank write signal in the test mode. A CBS latch circuit generates not only a signal for selecting the spare column decoders in banks and in the test mode but also signals for selecting the column decoders. Write driving circuits write the data onto the column lines selected by the column decoders and onto the spare column lines selected by the spare column decoders.
摘要翻译：同步动态随机存取存储器有备用列，可在发货前进行测试。在存储器中，模式设置寄存器在测试模式下输出多存储器写入信号。 CBS锁存电路不仅产生用于在存储体和测试模式中选择备用列解码器的信号，而且还生成用于选择列解码器的信号。写驱动电路将数据写入由列解码器选择的列线上，并将其写入由备用列解码器选择的备用列线上。

68. 发明授权

US5818785A Semiconductor memory device having a plurality of banks 失效
标题翻译：具有多个存储体的半导体存储器件
公开(公告)号：US5818785A
公开(公告)日：1998-10-06
申请号：US764886
申请日：1996-12-16
申请人： Shigeo Ohshima
发明人： Shigeo Ohshima
IPC分类号： G11C7/10 , G11C8/12 , G11C8/00
CPC分类号： G11C7/10 , G11C7/1051 , G11C8/12
摘要： A semiconductor memory device having a plurality of banks of memory cells is provided. The device has a data line provided in each of the banks for coupling to one of the memory cells in the corresponding bank. A common data line is shared by the banks, and is selectively coupled to one of the data lines through switches. Additionally, an amplifier is coupled to the common data line to amplify data read from a selected memory cell, and an I/O line is coupled to the amplifier to transmit the amplified data to an outer section. In the device, one of the banks of memory cells is selected by a bank select signal. Therefore, the amplifier is shared by the banks. Further the length of the I/O line can be shortened so that the load on the amplifier can be reduced. Accordingly, chip area is decreased and the speed of the memory device is improved.
摘要翻译：提供具有多个存储单元组的半导体存储器件。该设备具有在每个存储体中提供的数据线，用于耦合到相应存储体中的一个存储单元。公共数据线由存储体共享，并且通过开关选择性地耦合到数据线之一。此外，放大器耦合到公共数据线以放大从所选择的存储器单元读取的数据，并且I / O线耦合到放大器以将放大的数据传输到外部部分。在器件中，存储单元组之一由存储体选择信号选择。因此，放大器由银行共享。此外，可以缩短I / O线的长度，从而可以减小放大器的负载。因此，芯片面积减小，存储器件的速度提高。

69. 发明授权

US5777946A Semiconductor memory circuit equipped with a column addressing circuit having a shift register 失效
标题翻译：配备有具有移位寄存器的列寻址电路的半导体存储器电路
公开(公告)号：US5777946A
公开(公告)日：1998-07-07
申请号：US770404
申请日：1996-12-20
申请人： Kazuko Inuzuka , Shigeo Ohshima , Katsushi Nagaba
发明人： Kazuko Inuzuka , Shigeo Ohshima , Katsushi Nagaba
IPC分类号： G11C11/407 , G11C8/04 , G11C11/408
CPC分类号： G11C8/04
摘要： The present invention provides a semiconductor memory circuit capable of high-speed access to a predetermined column portion by a simplified high-speed addressing circuit. The memory circuit in a DRAM is such that a portion of a column addressing circuit normally comprising a counter constitutes a shift register in a column addressing circuit at a preceding stage of a column address buffer so that a plurality of address signal wrappings are realized for accessing the predetermined column portion.
摘要翻译：本发明提供一种能够通过简化的高速寻址电路高速访问预定列部分的半导体存储器电路。 DRAM中的存储器电路使得通常包括计数器的列寻址电路的一部分在列地址缓冲器的前级构成列寻址电路中的移位寄存器，从而实现多个地址信号包装以进行访问预定列部分。

70. 发明授权

US5703381A Semiconductor integrated circuit 失效
标题翻译：半导体集成电路
公开(公告)号：US5703381A
公开(公告)日：1997-12-30
申请号：US557731
申请日：1995-11-13
申请人： Kiyoaki Iwasa , Shigeo Ohshima
发明人： Kiyoaki Iwasa , Shigeo Ohshima
IPC分类号： G01R31/26 , G01R31/28 , H01L21/66 , H01L21/822 , H01L23/544 , H01L27/04 , H01L23/58
CPC分类号： H01L22/34 , G01R31/2884
摘要： A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.
摘要翻译：半导体集成电路包括具有主表面的矩形半导体芯片，形成在半导体芯片的主表面的周边部分中的多个焊盘，用于连接到外部连接构件，多个集成电路的电路元件形成在除了形成多个焊盘的区域之外的主表面的区域，以及至少一个特征评估电路元件，其通过共享形成的杂质掺杂区域而与集成电路的多个电路元件中的至少一个连接所述至少一个电路元件的一部分与所述集成电路的所述至少一个电路元件在所述主表面的除了形成所述多个焊盘的外围部分之外的区域中。

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