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    • 63. 发明授权
    • Offset adjusting circuit for optical disc and offset adjusting method
    • 光盘偏移调整电路及偏移调整方法
    • US07257058B2
    • 2007-08-14
    • US10850789
    • 2004-05-20
    • Hideaki Sasaki
    • Hideaki Sasaki
    • G11B7/00
    • G11B7/094
    • An offset adjusting circuit for an optical disc comprises an offset-adjustment differential operational amplifier having an input terminal to which an output signal of an optical pickup is input and the other input terminal to which a control voltage is applied, an A/D converter that outputs a digital signal based on an output signal of the offset-adjustment differential operational amplifier, and a control voltage adjuster that varies the control voltage applied to the offset-adjustment differential operational amplifier based on the digital signal so as to remove an offset.
    • 一种用于光盘的偏移调整电路包括偏移调整差分运算放大器,其具有输入端,光拾取器的输出信号被输入到该输入端,另一个输入端施加到控制电压; A / D转换器, 基于偏移调整差分运算放大器的输出信号输出数字信号,以及控制电压调节器,其基于数字信号改变施加到偏移调整差分运算放大器的控制电压,以消除偏移。
    • 67. 发明授权
    • Solder bump measuring method and apparatus
    • 焊点测量方法和装置
    • US06196441B1
    • 2001-03-06
    • US09289386
    • 1999-04-12
    • Yutaka HashimotoHideaki SasakiMamoru KobayashiShinichi Kazui
    • Yutaka HashimotoHideaki SasakiMamoru KobayashiShinichi Kazui
    • B23K3102
    • H05K13/08G01B11/0608H01L22/12
    • A method of measuring solder bumps formed on a substrate mounting a semiconductor element thereon includes mounting a work to be measured on a work position mechanism, and scanning the work by an optical micro head to measure errors of a mount posture of the work. Each stage is controlled to correct the errors, and thereafter, the apex positions of the bumps are scanned and measured. The measurement results are collected by a personal computer, and the measurement results together with control data of each axis are sent to a main personal computer and displayed on its screen. An error of an apex position of each bump from a regression plane is calculated, and if the error is smaller than a reference value, the work is judged to be satisfactory.
    • 测量在其上安装半导体元件的衬底上形成的焊料凸块的方法包括:将待测量的工件安装在工件位置机构上,并通过光学微头扫描工件以测量工件的安装姿势的误差。 控制每个阶段以校正误差,然后扫描和测量凸块的顶点位置。 测量结果由个人计算机收集,测量结果连同每个轴的控制数据发送到主个人计算机并显示在其屏幕上。 从回归平面计算每个凸起的顶点位置的误差,如果误差小于参考值,则判断为满意。
    • 70. 发明授权
    • Method and apparatus for measuring the height of an object
    • 测量物体高度的方法和装置
    • US6069701A
    • 2000-05-30
    • US982509
    • 1997-12-02
    • Yutaka HashimotoHideaki SasakiShinichi Kazui
    • Yutaka HashimotoHideaki SasakiShinichi Kazui
    • G01B11/02G01B11/06G01N21/88H01L21/60G01B11/24G01B11/00G01N21/00
    • G01B11/0608G01N21/88
    • A method and an apparatus for measuring the height of an apex of an object with high accuracy without influence of the surface state of the object are disclosed. Correlation coefficients of respective positions of a waveform formed from digital data indicative of the height of the object detected by a head portion of a detector and a previously prepared standard waveform are calculated while moving the waveforms in the vertical and horizontal directions and the height of an apex position of the standard waveform at a position having a largest correlation coefficient from the calculated result is decided as the height of the apex of the object. Accordingly, the height of the apex can be decided from the whole detected waveforms without influence of local abnormality of the reflected light quantity waveform due to minute ruggedness or discoloration of the surface of the object.
    • 公开了一种用于在不影响物体的表面状态的情况下以高精度测量物体顶点的高度的方法和装置。 计算表示由检测器的头部检测到的物体的高度的数字数据和预先准备的标准波形形成的波形的相应位置的相关系数,同时移动垂直和水平方向上的波形以及 在从计算结果具有最大相关系数的位置处的标准波形的顶点位置被确定为对象的顶点的高度。 因此,顶点的高度可以由整个检测波形确定,而不受由于物体表面的微小的凹凸或变色而引起的反射光量波形的局部异常的影响。