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    • 61. 发明专利
    • Access method, server and system
    • 访问方法,服务器和系统
    • JP2010266908A
    • 2010-11-25
    • JP2009115130
    • 2009-05-12
    • Hitachi Ltd株式会社日立製作所
    • YOSHIDA ISAOYOSHIDA TAKAHIROKAMATA YOSHIE
    • G06F21/24
    • PROBLEM TO BE SOLVED: To share transmission/reception information even with a specific third party not directly transmitting/receiving the information. SOLUTION: In a method for accessing information in a server connected with a plurality of clients via a network, the server includes: a communication part communicating with the clients via the network; and a control part controlling the communication part. The control part controls access to the information transmitted/received between a first client and a second client to a third client based on indirect sharing authority information including transmitter identification information indicating the first client that is a transmitter of the information, recipient identification information indicating the second client that is a recipient of the information transmitted from the transmitter; third party identification information indicating the third client that is a third party which can access the information to the information transmitted/received between the transmitter and the recipient, and third party access range information indicating a range wherein the third party can access the information. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:甚至在不直接发送/接收信息的特定第三方的情况下共享发送/接收信息。 解决方案:在通过网络访问与多个客户端连接的服务器中的信息的方法中,服务器包括:经由网络与客户端通信的通信部分; 以及控制通信部的控制部。 控制部分基于间接共享权限信息控制对在第一客户端和第二客户端之间发送/接收的信息的访问,所述间接共享权限信息包括指示作为信息的发送者的第一客户端的发射机标识信息,表示信息的接收者识别信息 作为从发射机发送的信息的接收者的第二客户端; 指示作为第三方的第三方识别信息,该第三方可以访问与发送者和接收者之间发送/接收的信息的信息,以及第三方访问范围信息,该第三方访问范围信息指示第三方可以访问该信息。 版权所有(C)2011,JPO&INPIT
    • 62. 发明专利
    • Method of evaluating lift-off amount between eddy current flaw detecting probe and inspected object, and evaluation device therefor, eddy current flaw detection method, and eddy current flaw detector
    • 评估检测探头和被检查物体的EDDY电流检测之间的提升量的方法及其评估装置,EDDY电流检测方法和EDDY电流检测器
    • JP2007147525A
    • 2007-06-14
    • JP2005344853
    • 2005-11-30
    • Hitachi Ltd株式会社日立製作所
    • NISHIMIZU AKIRAYOSHIDA ISAOKOIKE MASAHIROMATSUI TETSUYA
    • G01N27/90
    • PROBLEM TO BE SOLVED: To enhance evaluation precision for a lift-off amount of an eddy current flaw detecting probe with respect to a curved face shape part. SOLUTION: A signal generated in each coil is measured 2 when deforming the eddy current flaw detecting probe having a plurality of flexible coils, and a phase θ of the signal is evaluated 4. The signal generated in the each coil is measured 5 in every time when changing a distance between the eddy current flaw detecting probe and a flat face comprising a material same to that of an inspected object. A value of a phase angle component having θ+90° with respect to the signal detected in the measurement 5 is extracted 7 to prepare a data table of the distance corresponding to the value of the extracted component. Then, the eddy current flaw detecting probe is attached 9 to the inspected object in actual flaw detection inspection, a signal generated in the coil is measured 10 under this condition, a value of a phase angle component having θ+90° with respect to the signal detected in the measurement 10 is extracted 29, and the distance corresponding to the extracted 29 value is found from the data table to serve as an evaluation result 11 of the lift-off amount. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提高涡流探伤探针相对于曲面形状部分的剥离量的评价精度。 解决方案:当使具有多个柔性线圈的涡流探伤探伤变形时,测量每个线圈中产生的信号2,并且评估信号的相位θ4.在每个线圈中产生的信号被测量5 在每次改变涡流探伤探针与包含与检查对象物质相同的材料的平面之间的距离时。 提取相对于在测量5中检测到的信号具有θ+ 90°的相位角分量的值,以准备与提取的分量的值相对应的距离的数据表。 然后,在实际的探伤检查中,将涡流探伤探测器9安装在被检查物体上,在该条件下测定线圈中产生的信号为10°,相对于 提取测量10中检测到的信号29,并且从数据表中找到与提取的29值相对应的距离,以作为剥离量的评估结果11。 版权所有(C)2007,JPO&INPIT
    • 63. 发明专利
    • Portal screen configuring apparatus and computer software
    • 门户网络配置设备和计算机软件
    • JP2006107012A
    • 2006-04-20
    • JP2004291168
    • 2004-10-04
    • Hitachi Ltd株式会社日立製作所
    • YOSHIDA ISAOYOSHIDA TAKAHIROKAMATA YOSHIE
    • G06F13/00G06F3/048G06F3/14
    • PROBLEM TO BE SOLVED: To provide a portal screen configuring apparatus made to automatically change into a screen configuration which a user can easily use even if the user does not perform customizing work each time, and to provide computer software therefor. SOLUTION: The computer software stored in the portal screen configuring apparatus 10 generates a Web page based on a screen configuration definition 111 which defines the screen configuration of the Web page for every user and a screen configuration change definition 112 which defines a rule for changing the definition for every user. The computer software acquires a definition and a change definition corresponding to the user acquired from a client 20, acquires a screen configuration change factor for every user from the screen configuring apparatus 10 or the client 20, and processes and creates data of the Web page based on the function of changing the definition based on the definition and the change factor according to the user and the changed definition. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种即使用户每次都不执行定制工作而自动改变为用户可以容易地使用的屏幕配置的门户屏幕配置设备,并且提供用于其的计算机软件。 存储在门户屏幕配置装置10中的计算机软件基于屏幕配置定义111生成网页,屏幕配置定义111定义每个用户的网页的屏幕配置以及定义规则的屏幕配置改变定义112 用于更改每个用户的定义。 计算机软件获取与客户端20获取的用户对应的定义和变更定义,从屏幕配置装置10或客户端20获取每个用户的屏幕配置变更因子,并处理并创建基于网页的数据 关于根据用户和更改的定义根据定义和变化因素改变定义的功能。 版权所有(C)2006,JPO&NCIPI
    • 68. 发明专利
    • BUILT-IN CONTROL CIRCUIT INSULATION GATE TYPE SEMICONDUCTOR DEVICE
    • JPH09116101A
    • 1997-05-02
    • JP27517195
    • 1995-10-24
    • HITACHI LTD
    • SAKAMOTO MITSUZOYOSHIDA ISAO
    • H01L27/04H01L21/822H01L29/78
    • PROBLEM TO BE SOLVED: To provide a built-in control circuit insulation gate type semiconductor device wherein its switching speed is improved, and its gate current when operating it to be protected from overcurrent is reduced, and further the area of its region to be protected from overcurrent is made small. SOLUTION: A gate 91 of a power MOSFET 43 and a gate terminal 11 are connected by a MOSFET 30, and the gate and source of the MOSFET 30 are connected by diodes 14, and further the drain and gate of the MOSFET 30 are connected by a resistor 16. Since when a large current flows in the power MOSFET 43 a current also flows in a MOSFET 21 and a MOSFET 31 connected in a current Miller circuit way with the MOSFET 21 is switched on to make the gate voltage of the MOSFET 30 lower than its source voltage, the ON-resistance of the MOSFET 30 becomes high. Thereby, the gate 91 of the power MOSFET 43 can be so controlled that its drain current is made not larger than a specified current value. When the power MOSFET 43 is switched on, the voltage of the gate terminal 11 is applied to the gate of the MOSFET 30 via the resistor 16.