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61. 发明授权

KR101332306B1 프리스탠딩 나노 박막 제조방법 有权
标题翻译：制造纳米自旋纳米薄膜的方法
公开(公告)号：KR101332306B1
公开(公告)日：2013-11-22
申请号：KR1020120033163
申请日：2012-03-30
申请人： 한국기계연구원
发明人： 최대근 , 황보윤 , 김재현 , 정준호 , 이학주
IPC分类号： B82B3/00 , B29C41/00 , C09J7/02
摘要： 프리스탠딩 나노 박막 제조방법이 개시된다. 본 발명의 일 실시예에 따른 프리스탠딩 나노 박막 제조방법은 제1 기재 상부에 나노 박막을 형성하는 제1 단계; 상기 나노 박막 상부에 제2 기재를 형성하고, 상기 제1 기재를 제거하여 적층체를 형성하는 제2 단계; 상기 적층체에서 상기 제2 기재를 제1 용매로 제거하는 제3 단계; 및 상기 제1 용매를 20 dyne/cm 이하의 계면장력을 갖는 제2 용매로 용매 치환하는 제4 단계를 포함한다.

62. 发明授权

KR101241964B1 판상형 구조의 나노박막과 기판 사이의 신뢰성 향상 장치 有权
标题翻译：提高纳米材料与平面结构与目标基板之间的可靠性的装置
公开(公告)号：KR101241964B1
公开(公告)日：2013-03-11
申请号：KR1020120060650
申请日：2012-06-05
申请人： 한국기계연구원
发明人： 김광섭 , 장봉균 , 최현주 , 황보윤 , 이승모 , 김상민 , 김재현 , 이학주 , 김경식
IPC分类号： B41M5/03
摘要： PURPOSE: A device for improving reliability between a plate-type nano-thin film and a substrate is provided to pressurize a nano-thin film, which has a two-dimensional structure and is deposited or transferred onto the substrate, with a roller or a slider in order to strongly and uniformly bond the nano-thin film to the substrate, thereby improving the electrical, mechanical, and optical properties of the nano-thin film. CONSTITUTION: A device for improving reliability between a plate-type nano-thin film(120) and a substrate(110) includes a conveying stage(100) and a pressurizing roller(200). The substrate has the nano-thin film on the upper side, is fixed on the conveying stage, and moves in an X-axial direction. The rotatable pressurizing roller installed on the upper side of the conveying stage is movable and capable of controlling loads in a Z-axial direction. The pressurizing roller sticks the nano-thin film to the substrate. A coating layer with at least two layers is formed on the outer circumferential surface of the pressurizing roller.
摘要翻译：目的：提供一种用于提高板状纳米薄膜和基板之间的可靠性的装置，以将具有二维结构并被沉积或转印到基底上的纳米薄膜用辊或滑块，以便将纳米薄膜牢固且均匀地粘合到基底上，从而改善纳米薄膜的电学，机械和光学性能。构成：用于提高板状纳米薄膜（120）和基板（110）之间的可靠性的装置包括输送台（100）和加压辊（200）。基板在上侧具有纳米薄膜，固定在输送台上，并沿X轴方向移动。安装在输送台上侧的可旋转加压辊是可移动的，能够控制Z轴方向的载荷。加压辊将纳米薄膜粘贴到基底上。在加压辊的外周面形成有至少两层的涂层。

63. 发明授权

KR101033031B1 변형률 측정 장치 失效
标题翻译：应变测量装置
公开(公告)号：KR101033031B1
公开(公告)日：2011-05-09
申请号：KR1020100095322
申请日：2010-09-30
申请人： 한국기계연구원
发明人： 김재현 , 장봉균 , 황보윤 , 이학주 , 최병익
IPC分类号： G01B11/16 , G01N3/08
摘要： PURPOSE: A deformation rate measuring device is provided to measure deformation rate at high speed by using contactless measuring method. CONSTITUTION: A deformation rate measuring device comprises a light source(20), a concave mirror, and an optical sensor(21). The light source is located one side of the a fine test piece(11) with keeping a fixed distance from a diffraction grid(12). The light source emits laser beam toward the diffraction grid. The concave mirror is located between the minute test piece and light source or located on the opposite side of the light source based on the minute test piece. The optical sensor receives the laser beam, successively reflected by the diffraction grid and concave mirror, and detects the location of the laser beam A controller(30) is connected to the light source and optical sensor and computes the deformation rate of the minute test piece.
摘要翻译：目的：提供一种变形率测量装置，通过非接触式测量方法测量高速变形率。构成：变形率测量装置包括光源（20），凹面镜和光学传感器（21）。光源位于精细测试片（11）的一侧，与衍射光栅（12）保持一定距离。光源向衍射光栅发射激光束。凹面镜位于微小测试片和光源之间，或者位于光源的相对侧，基于微小的测试片。光学传感器接收由衍射栅格和凹面反射镜连续反射的激光束，并且检测激光束A的位置。控制器（30）连接到光源和光学传感器，并计算微小测试片的变形率。

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