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    • 63. 发明申请
    • APPARATUS FOR DRIVING LIGHT EMITTING DIVICE USING PULSE-WIDTH MODULATOIN
    • 使用脉冲宽度调制器驱动发光灯的装置
    • US20110140627A1
    • 2011-06-16
    • US12770953
    • 2010-04-30
    • Seung Kon KONGJae Shin LEEJung Hyun KIMJung Sun KWONBo Hyun HWANG
    • Seung Kon KONGJae Shin LEEJung Hyun KIMJung Sun KWONBo Hyun HWANG
    • H05B37/02
    • H05B33/0827H05B33/0818
    • An apparatus for driving a light emitting device (LED) is provided. The apparatus for driving the LED includes a first driving control element, a first current detection unit, a first effective value detection unit, a first reference signal generation unit, and a first comparison unit. The first driving control element controls a current flowing through a first LED channel, in response to a first pulse-width modulated control signal. The first current detection unit detects the current flowing through the first LED channel. The first effective value detection unit detects an effective value of the current detected by the first current detection unit. The first reference signal generation unit generates a preset reference signal having a sawtooth waveform. The first comparison unit compares the reference signal from the first reference signal generation unit with the effective value from the first effective value detection unit.
    • 提供了一种用于驱动发光器件(LED)的装置。 用于驱动LED的装置包括第一驱动控制元件,第一电流检测单元,第一有效值检测单元,第一参考信号生成单元和第一比较单元。 响应于第一脉冲宽度调制控制信号,第一驱动控制元件控制流过第一LED通道的电流。 第一电流检测单元检测流过第一LED通道的电流。 第一有效值检测单元检测由第一电流检测单元检测到的电流的有效值。 第一参考信号产生单元产生具有锯齿波形的预设参考信号。 第一比较单元将来自第一参考信号生成单元的参考信号与来自第一有效值检测单元的有效值进行比较。
    • 70. 发明授权
    • Voltage glitch detection circuits and methods thereof
    • 电压毛刺检测电路及其方法
    • US07483328B2
    • 2009-01-27
    • US11434933
    • 2006-05-17
    • Eui-Seung KimJung-Hyun Kim
    • Eui-Seung KimJung-Hyun Kim
    • G11C5/01
    • G11C7/1051G11C7/02G11C7/06G11C7/1063G11C29/026
    • Voltage glitch detection circuits and methods thereof. The voltage glitch detection circuit may include a monitoring memory array including at least one memory cell storing reference data, a monitoring sense amplifier receiving stored reference data from the monitoring memory array, amplifying the received stored reference data in response to an operation control signal and outputting data based on the reference data, a data storage circuit including at least one latch to store the reference data and a comparator circuit receiving and comparing the data output from the monitoring sense amplifier and the stored reference data from the data storage circuit, and outputting a detection signal based on the comparison. The voltage glitch detection circuit may include a first storage unit configured to latch a first voltage, a second storage unit configured to latch a second voltage, a first comparator circuit first comparing the latched first voltage with a first reference voltage and outputting a first comparison result, a second compariator circuit second comparing the second voltage with a second reference voltage and outputting a second comparison result and a third comparator circuit third comparing the first and second comparison results and outputting a reset detection signal based on the third comparison.
    • 电压毛刺检测电路及其方法。 电压毛刺检测电路可以包括监视存储器阵列,其包括存储参考数据的至少一个存储器单元,监视读出放大器,接收来自监视存储器阵列的存储的参考数据,响应于操作控制信号放大所接收的存储的参考数据并输出 基于参考数据的数据的数据存储电路,包括用于存储参考数据的至少一个锁存器的数据存储电路;以及比较器电路,接收和比较来自监视读出放大器的数据和来自数据存储电路的存储的参考数据, 检测信号基于比较。 电压毛刺检测电路可以包括被配置为锁存第一电压的第一存储单元,被配置为锁存第二电压的第二存储单元,第一比较器电路,首先将锁存的第一电压与第一参考电压进行比较,并输出第一比较结果 第二比较器电路,其将所述第二电压与第二参考电压进行比较,并输出第二比较结果;以及第三比较器电路,其对所述第一和第二比较结果进行比较,并输出基于所述第三比较的复位检测信号。