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    • 62. 发明专利
    • AT485633T
    • 2010-11-15
    • AT06392004
    • 2006-03-20
    • DIALOG SEMICONDUCTOR GMBH
    • KILLAT DIRKADLER ANDREAS
    • H03M3/02
    • Circuits and methods for eliminating charge errors caused by parasitic capacitances of delta sigma modulators, which comprises - provide in a modulation stage a first switching means for both positive and negative connections between an output of a differential Gm integrator and a correspondent integration capacitor and two buffer amplifiers in series with a second switching means wherein a first buffer amplifier is parallel to said positive connection and a second buffer amplifier is parallel to said negative connection; - open said first switching means and close said second switching means a short period of time before the chopper at the output of said Gm integrator switches; - precharge output nodes of the Gm integrator using said buffer amplifiers tracking the voltage on the capacitor nodes; and - close said first switching means and open said second switching means.
    • 63. 发明专利
    • DE602004024294D1
    • 2010-01-07
    • DE602004024294
    • 2004-06-14
    • DIALOG SEMICONDUCTOR GMBH
    • ARIGLIANO ANTONELLO
    • G05F1/00G01R27/28G01R31/02G01R31/28
    • Circuits and related methods to detect efficiently a short-circuit condition of a pad of an IC device efficiently using a comparator and a current mirror configuration have been achieved. The IC device to be tested is free floating. The current mirror configuration comprises four branches, a biasing branch, a first comparator branch, a second comparator branch and a measurement branch. The measurement branch is connected to a pad of the IC device and a measurement current is charged on to the pad. Said measurement current is mirrored from the current of the biasing branch and the measurement current is mirrored to the second comparator branch. Furthermore the current of the biasing branch is mirrored to the first comparator branch using a scale that the current of the first comparator branch is smaller than the current of the biasing branch. In case of a short-circuit the current of the measurement branch can flow and correspondently the current of the second comparator branch is larger than the current of the first comparator branch and hence the comparator, comparing both currents, can indicate a short-circuit situation.
    • 64. 发明专利
    • AT449993T
    • 2009-12-15
    • AT04392030
    • 2004-06-14
    • DIALOG SEMICONDUCTOR GMBH
    • ARIGLIANO ANTONELLO
    • G05F1/00G01R27/28G01R31/02G01R31/28
    • Circuits and related methods to detect efficiently a short-circuit condition of a pad of an IC device efficiently using a comparator and a current mirror configuration have been achieved. The IC device to be tested is free floating. The current mirror configuration comprises four branches, a biasing branch, a first comparator branch, a second comparator branch and a measurement branch. The measurement branch is connected to a pad of the IC device and a measurement current is charged on to the pad. Said measurement current is mirrored from the current of the biasing branch and the measurement current is mirrored to the second comparator branch. Furthermore the current of the biasing branch is mirrored to the first comparator branch using a scale that the current of the first comparator branch is smaller than the current of the biasing branch. In case of a short-circuit the current of the measurement branch can flow and correspondently the current of the second comparator branch is larger than the current of the first comparator branch and hence the comparator, comparing both currents, can indicate a short-circuit situation.
    • 67. 发明专利
    • DK1326487T3
    • 2008-11-10
    • DK02368001
    • 2002-01-03
    • DIALOG SEMICONDUCTOR GMBH
    • KILLAT DIRK
    • H05B41/392H02M3/02
    • A method to control the illumination intensity of a gas discharge lamp is achieved. The method comprises, first, converting an analog lamp illumination signal into a digital lamp illumination signal. The analog lamp illumination signal is a function of the illumination intensity of a gas discharge lamp. Second, digital target signal is subtracted from the digital lamp illumination signal to create a digital error signal. Third, a digital frequency set point is adjusted from a current value to a new value based on the digital error signal. The digital frequency set point is a high resolution digital value. Fourth, the current value and the new value are averaged by a digital delta sigma modulator to create a smoothed frequency set point. The smoothed frequency set point is a medium resolution value. Finally, an oscillating voltage signal is generated with a drive frequency based on the smoothed frequency set point. The drive frequency determines the illumination intensity of the gas discharge lamp.
    • 70. 发明专利
    • DE60227479D1
    • 2008-08-21
    • DE60227479
    • 2002-01-03
    • DIALOG SEMICONDUCTOR GMBH
    • KILLAT DIRK
    • H05B41/392H02M3/02
    • A method to control the illumination intensity of a gas discharge lamp is achieved. The method comprises, first, converting an analog lamp illumination signal into a digital lamp illumination signal. The analog lamp illumination signal is a function of the illumination intensity of a gas discharge lamp. Second, digital target signal is subtracted from the digital lamp illumination signal to create a digital error signal. Third, a digital frequency set point is adjusted from a current value to a new value based on the digital error signal. The digital frequency set point is a high resolution digital value. Fourth, the current value and the new value are averaged by a digital delta sigma modulator to create a smoothed frequency set point. The smoothed frequency set point is a medium resolution value. Finally, an oscillating voltage signal is generated with a drive frequency based on the smoothed frequency set point. The drive frequency determines the illumination intensity of the gas discharge lamp.