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    • 67. 发明授权
    • FLUORESZENZBASIERTE OPTISCHE OBJEKTUNTERSUCHUNGSEINRICHTUNG, INSBESONDERE FÜR DIE TIRF-MIKROSKOPIE
    • 荧光基于光学的对象检查设备,特别适用于全内反射荧光显微术
    • EP1573303B1
    • 2009-06-10
    • EP03813134.8
    • 2003-12-17
    • Olympus Soft Imaging Solutions GmbH
    • SEEL, Matthias
    • G01N21/64G01N21/55G02B21/06
    • G01N21/648
    • The invention relates to an optical fluorescence-based device for analysing objects, comprising the following: an object zone, in which at least one object to be analysed (112) can be placed on an object carrier (110); an observation beam path (130), running from the object zone to an image zone or observation zone (134); and at least one excitation beam path, running from a light source (122) or a light outlet to the object zone. Said excitation beam path feeds the excitation light to the object carrier in such a way that said light strikes a boundary surface of the object carrier at an angle of incidence to the axis of incidence in relation to the boundary surface of the object carrier, said angle being greater than or equal to the critical angle of total reflection, measured in relation to the axis of incidence, in order to provide fluorescent excitation in the paths of evanescent electromagnetic fields. According to one embodiment, a dissipation beam path, which is associated with the excitation beam path, feeds excitation light reflected by total reflection to a light trap assembly (140). According to another embodiment, a lens assembly that is associated with both the excitation beam path and an illumination beam path is operated centrically in relation to the excitation light, said assembly coupling illumination light into a lens for illuminating the object zone and excitation light into the lens for feeding the latter to the object carrier for the fluorescent excitation. An additional embodiment is equipped with several excitation beam paths, each having their own free-illumination beam section, which is not connected to a light-conductive medium and is separate in relation to at least one other excitation beam path.