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51. 发明专利

JPS54158293A SPARK SOURCE MASS ANALYSIS 失效
公开(公告)号：JPS54158293A
公开(公告)日：1979-12-13
申请号：JP6673278
申请日：1978-06-05
申请人： HITACHI LTD
发明人： KOYAMA SUSUMU , OKAJIMA YOSHIAKI
IPC分类号： H01J49/18 , G01N27/62
摘要： PURPOSE:To make it possible to mount a number of test pieces and to easily move the same within a vacuum devide by mounting a number of electrodes to an electrode adjustor and by turning the mounting portions. CONSTITUTION:After identical test pieces are mounted symmetrically to electrodes 2 and 2', am electrode adjustor is installed in an ion source chamber to be evacuated. A knob 9 is turned to bring test pieces 1 and 1 toward each other until the gap inbetween is suitably adjusted. After that, an electric power is supplied at terminals 4 and 4', and the spark is continued, while being adjusted by means of the knob 9 such that the stable spark is effected, thereby to accomplish the analysis. After the analysis, the test pieces are made to restore their original conditions by means of the knob 9, and a test piece electrode adjusting rod 8 is extracted from hook portions 3 and 3' and extracted until an electrode mounting portion 6 can be turned. Then, a knob 10 is turned together with the mounting portion 6, which is made rotatable through steel balls 7 and 7', and is replaced by another test piece. After that, the knob 9 is pushed and turned, until it is retained by the hook portions 3 and 3', so that the analysis is started by the adjustment of the gap between the test pieces.

52. 发明专利

JPS52134493A METHOD OF ANALYZING MASS USING SPARKKDISCHARGE SOURCE AND APPARATUS THEREFOR 失效
公开(公告)号：JPS52134493A
公开(公告)日：1977-11-10
申请号：JP4857677
申请日：1977-04-28
申请人： COMMISSARIAT ENERGIE ATOMIQUE
发明人： JIYATSUKU BERUTOTSUDO
IPC分类号： G01N27/62 , H01J49/18

53. 实用新型

JPS4921757Y1 失效
公开(公告)号：JPS4921757Y1
公开(公告)日：1974-06-11
申请号：JP11922770
申请日：1970-11-30
IPC分类号： H01J49/18 , G01N27/62 , H01J39/35

54. 发明专利

CA2888092C PHOTOIONIZATION DETECTOR FOR GAS CHROMATOGRAPHY HAVING TWO SEPARATELY IONIZING SOURCES 未知
公开(公告)号：CA2888092C
公开(公告)日：2016-07-12
申请号：CA2888092
申请日：2013-11-11
申请人： VALCO INSTR CO LP
发明人： STEARNS STANLEY D , CAI HUAMIN
IPC分类号： G01N30/64 , G01N27/62 , G01N27/64 , G01N27/68 , H01J49/02 , H01J49/16 , H01J49/18
摘要： A detector for gas chromatography using two ionization sources within a single body to separately provide ionization energy to a column gas eluent to provide electrical discharge to two or more collecting electrodes provides improved selectivity and may be so used. Use is made of combined bias/collecting electrodes. The use of two ionization sources permits generation of two detector outputs from within a common body and of a common constituent flow. The ionization sources and any applicable discharge gas and dopant may be selected based on desired selectivity.

55. 发明专利

DK0469019T3 未知
公开(公告)号：DK0469019T3
公开(公告)日：1992-12-14
申请号：DK90906189
申请日：1990-04-17
申请人： FRAUNHOFER GES FORSCHUNG
发明人： RICHTER AXEL , SANDMEIER HERRMANN
IPC分类号： B05B5/025 , B05B5/16 , F04D33/00 , F28D15/02 , H01J20060101 , H01J41/18 , H01J49/18 , H02N11/00
摘要： PCT No. PCT/EP90/00611 Sec. 371 Date Oct. 29, 1991 Sec. 102(e) Date Oct. 29, 1991 PCT Filed Apr. 17, 1990 PCT Pub. No. WO91/02375 PCT Pub. Date Feb. 21, 1991.An electrostatic pump includes two electrodes, which are spaced apart essentially in the pump flow direction and which are adapted to have applied thereto a potential for injecting an ion current flowing between the two electrodes. For further microminiaturization of the pump, the pump includes two semiconductor components, which are arranged one on top of the other in the pump flow direction and which are so structured that the electrodes form an integral constituent part of the semiconductor components.

56. 发明专利

AT82088T MIKROMINIATURISIERTE ELEKTROSTATISCHE PUMPE. 未知
公开(公告)号：AT82088T
公开(公告)日：1992-11-15
申请号：AT90906189
申请日：1990-04-17
申请人： FRAUNHOFER GES FORSCHUNG
发明人： RICHTER AXEL , SANDMEIER HERRMANN
IPC分类号： B05B5/025 , B05B5/16 , F04D33/00 , F28D15/02 , H01J20060101 , H01J41/18 , H01J49/18 , H02N11/00

57. 发明专利

DE1950938B2 未知
公开(公告)号：DE1950938B2
公开(公告)日：1973-09-20
申请号：DE1950938
申请日：1969-10-09
申请人： NIHON DENSHI K.K., AKISHIMA, TOKIO (JAPAN)
发明人： WATANABE, EIJI, TOKIO
IPC分类号： H01J49/18 , H01J49/32 , H01J39/36
摘要： 1288254 Mass spectrometers NIHON DENSHI KK 7 Oct 1969 [9 Oct 1968] 49315/69 Heading H1D In a mass spectrometer in which intermittent ion beams from an ion source pass between deflection electrodes 5 which are pulsed to deflect the ion beams to a detector, an arrangement is provided to control the generation of the intermittent ion beams and the application of the pulses to the deflection electrodes such that no ions are present between the deflection electrodes during the rise and fall times of the pulses. The deflection electrode pulses are derived from the output of a clock pulse generator 11 via gate circuit 14, frequency divider 15 and pulse generator 16. The output from clock generator 11 is also fed through delay circuit 12, pulse generator 13, high frequency generator 10 and transformer 9 to supply the spark pulse to the spark electrodes 1 of the ion source on which the specimen to be analysed is arranged. There may be one or more complete spark pulses during each deflection pulse. The arrangement ensures a static image of the ions in the beam formed on the photographic plate 8 of the detector, which comprises electrostatic analyser 6 and magnetic analyser 7.

58. 发明专利

DE1648821B2 未知
公开(公告)号：DE1648821B2
公开(公告)日：1973-09-20
申请号：DE1648821
申请日：1951-01-28
申请人： VARIAN MAT GMBH, 2800 BREMEN
发明人： SCHUY, KLAUS-DIETER, DR., 6101 SEEHEIM , FRANZEN, JOCHEN, DR., 5810 WITTE
IPC分类号： H01J49/18 , H01J39/36

59. 发明专利

GB1241564A APPARATUS FOR AVOIDING THE SPACE CHARGE SPREADING OF MASS SPECTROMETRIC LINES 未知
公开(公告)号：GB1241564A
公开(公告)日：1971-08-04
申请号：GB3727968
申请日：1968-08-05
申请人： VARIAN MAT GMBH
IPC分类号： H01J49/18
摘要： 1,241,564. Mass spectrometers. VARIAN MAT. G.m.b.H. 5 Aug., 1968 [8 Aug., 1967], No. 37279/68. Heading H1D. Non-uniform spreading of the photographically recorded mass lines in a mass spectrometer due to space charge spreading of the ion beam from a spark ion source is reduced by providing a free transit path L of sufficient length to allow the beam to assume a uniform density between diaphragms 6, 7 in Fig. 1 where 3, 4 are the spark electrodes and 13 an ion dispersing grid or between unipotential lenses 15, 16 in Fig. 2.

60. 发明专利

GB1217269A IMPROVEMENTS IN AND RELATING TO SPARK ION SOURCES FOR MASS SPECTROMETERS 未知
公开(公告)号：GB1217269A
公开(公告)日：1970-12-31
申请号：GB5976068
申请日：1968-12-16
申请人： AKAD WISSENSCHAFTEN DDR
发明人： VIERECKL FRANZ
IPC分类号： H01J49/18
摘要： 1,217,269. Supply systems for ion sources. DEUTSCHE AKADEMIE DER WISSENSOHAFTEN ZU BERLIN. 16 Dec., 1968, No. 59760/68. Heading H2H. A spark ion source 6 for a mass spectrometer is supplied by a circuit which includes a thyristor 3 and a pulse transformer 4. Initially, a trigger pulse is applied to the gate terminal 1 of the thyristor, allowing current to flow from a D.C. source to build up a field in the transformer primary. The thyristor is now cut off, and the field collapses, giving rise to a high induced voltage in the secondary winding which has a large number of turns and a high resistance. The induced voltage initiates a discharge across electrodes 5, and this discharge is sustained at a low voltage, the main part of the voltage drop being across the secondary winding. A further D.C. source applies an accelerating potential between the electrodes 5 and the wall of the ion source 6.

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