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    • 51. 发明授权
    • Decoupling capacitors for thin gate oxides
    • 薄栅氧化物去耦电容器
    • US06828638B2
    • 2004-12-07
    • US09469406
    • 1999-12-22
    • Ali KeshavarziVivek K. DeTanay KarnikRajendran Nair
    • Ali KeshavarziVivek K. DeTanay KarnikRajendran Nair
    • H01L2976
    • H01L27/0805H01L29/94H01L2924/0002H01L2924/00
    • In some embodiments, the invention involves a die having a first conductor carrying a power supply voltage and a second conductor carrying a ground voltage. A semiconductor capacitor operating in depletion mode is coupled between the first and second conductors to provide decoupling capacitance between the first and second conductors, the semiconductor capacitor having a gate voltage. Various configurations may be used including: n+ gate poly and n+ source/drain regions in an n-body; p+ gate poly and n+ source/drain regions in an n-body; p+ gate poly and p+ source/drain regions in an n-body; p+ gate poly and p+ source/drain regions in a p-body; n+ gate poly and p+ source/drain regions in a p-body; n+ gate poly and n+ source/drain regions in a p-body. The power supply voltage may have a larger absolute value than does a flatband voltage.
    • 在一些实施例中,本发明涉及具有承载电源电压的第一导体和承载接地电压的第二导体的管芯。 以耗尽模式工作的半导体电容器耦合在第一和第二导体之间,以在第一和第二导体之间提供去耦电容,半导体电容器具有栅极电压。 可以使用各种构造,包括:n体中的n +栅极多晶硅和n +源极/漏极区域; p +栅极多晶硅和n +源极/漏极区域; p +栅极poly和p +源极/漏极区域在n体中; p体中的p +栅极多晶硅和p +源极/漏极区域; p体中的n +栅极多晶硅和p +源极/漏极区域; p体中的n +栅极多晶硅和n +源极/漏极区域。 电源电压可能比平带电压具有更大的绝对值。
    • 53. 发明授权
    • Measuring power supply stability
    • 测量电源稳定性
    • US06617890B1
    • 2003-09-09
    • US10104393
    • 2002-03-22
    • Tsung-Hao ChenPeter HazuchaAtila AlvandpourTanay KarnikChung-Ping Chen
    • Tsung-Hao ChenPeter HazuchaAtila AlvandpourTanay KarnikChung-Ping Chen
    • H03K5153
    • G01R19/16538G06F1/28H03K5/08H03K5/153
    • A system for measuring the stability of a power signal from a power supply includes a threshold violation detector. The threshold violation detector includes a comparator and an indicator. The comparator has a power signal input, a threshold signal input, and a comparison result output, and is configured to compare the power signal on the power signal input with a threshold on the threshold signal input to present a comparison result signal on the comparison result output. The indicator has a threshold violation output and a comparison input that receives the comparison result signal from the comparator. The indicator presents a threshold violation signal on the threshold violation output when the comparison result signal indicates that the power signal has violated the threshold.
    • 用于测量来自电源的功率信号的稳定性的系统包括阈值违规检测器。 阈值违规检测器包括比较器和指示器。 比较器具有功率信号输入,阈值信号输入和比较结果输出,并且被配置为将功率信号输入上的功率信号与阈值信号输入上的阈值进行比较,以在比较结果上呈现比较结果信号 输出。 指示器具有阈值违反输出和比较输入,其从比较器接收比较结果信号。 当比较结果信号指示电源信号已经违反阈值时,指示器在阈值违反输出上呈现阈值违反信号。
    • 54. 发明授权
    • Storage element with stock node capacitive load
    • 具有堆栈节点容量负载的存储元件
    • US06483363B1
    • 2002-11-19
    • US09663749
    • 2000-09-15
    • Tanay KarnikSriram R. VangalVenkat S. Veeramachaneni
    • Tanay KarnikSriram R. VangalVenkat S. Veeramachaneni
    • H03K3356
    • H03K3/356173H03K3/0375H03K3/356156
    • A storage element includes a forward inverter and a feedback inverter cross-coupled between a storage node and a feedback node. A capacitive load within the feedback inverter is coupled to the storage node when the storage element holds data and is not coupled to the storage node when the storage element is loading. The capacitive load reduces the storage element's susceptibility to soft errors when holding data, and does not appreciably slow the storage element when data is loading. The capacitive load is implemented using the gate capacitance of complementary transistors connected to stack nodes within the feedback inverter. A flip-flop includes cascaded latches, one or more of which have the internal capacitance.
    • 存储元件包括在存储节点和反馈节点之间交叉耦合的正向反相器和反馈反相器。 当存储元件保持数据时,反馈逆变器内的电容性负载被耦合到存储节点,并且当存储元件被加载时,其不耦合到存储节点。 容量负载降低了存储元件在保存数据时对软错误的敏感性,并且在数据加载时不会明显减慢存储元件。 使用连接到反馈逆变器内的堆叠节点的互补晶体管的栅极电容来实现电容负载。 触发器包括级联锁存器,其中一个或多个具有内部电容。
    • 55. 发明授权
    • Soft error rate tolerant latch
    • 软错误率容错锁存器
    • US06380781B1
    • 2002-04-30
    • US09430977
    • 1999-11-01
    • Tanay KarnikKrishnamurthy SoumyanathShekhar Y. Borkar
    • Tanay KarnikKrishnamurthy SoumyanathShekhar Y. Borkar
    • H03K312
    • G01R31/318525G01R31/31816
    • A latch having increased soft error rate tolerance includes cross-coupled inverters having transistors with varying sizes. Diffusion regions of transistors coupled to storage nodes are kept small to reduce the effect of charge accumulation resulting from particles bombarding the bulk of an integrated circuit die. Transistors having gates coupled to the storage nodes are increased in size to increase the capacitance on the storage nodes. The reduced size of diffusion regions and increased size of gates on storage nodes combine to reduce the effects of accumulated charge. Diffusion region area is further reduced by reducing the size of pass gates that load normal data and scan data. A large capacitor is coupled to a feedback node within the cross-coupled inverters to further reduce the effect of accumulated charge.
    • 具有增加的软错误率容限的锁存器包括具有不同尺寸的晶体管的交叉耦合反相器。 耦合到存储节点的晶体管的扩散区域保持较小,以减少由颗粒轰击集成电路管芯的体积而产生的电荷累积的影响。 具有耦合到存储节点的栅极的晶体管的尺寸增加以增加存储节点上的电容。 扩散区尺寸减小,存储节点栅极尺寸增大,减少了累积电荷的影响。 通过减小加载正常数据和扫描数据的通孔的大小进一步减小扩散区域面积。 大电容器耦合到交叉耦合的反相器内的反馈节点,以进一步降低累积电荷的影响。