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    • 59. 发明申请
    • METHOD FOR COMPUTING THE CRITICAL AREA OF COMPOUND FAULT MECHANISMS
    • 计算化合物故障机理关键领域的方法
    • US20080127004A1
    • 2008-05-29
    • US11461805
    • 2006-08-02
    • Robert J. AllenSarah C. BraaschMervyn Y. Tan
    • Robert J. AllenSarah C. BraaschMervyn Y. Tan
    • G06F17/50
    • G06F17/5081
    • Disclosed is a method of calculating critical area based on both independent and dependent compound fault mechanisms. This critical area is calculated by generating, for each simple fault mechanism in the compound fault mechanism, a map made up of polygonal regions, where values on a third dimensional z-axis represent the critical defect size for each single fault mechanism at a point x,y. These maps are overlaid and the planar faces (i.e., top surfaces) of each region of each map are projected onto the x,y plane in order to identify intersecting sub-regions. The dominant fault mechanism within each sub-region is identified based on an answer to predetermined Boolean expression and the critical areas for all of the sub-regions are accumulated in order to obtain the total critical area for the compound fault mechanism.
    • 公开了一种基于独立和依赖复合故障机制来计算临界面积的方法。 该关键区域通过为复合故障机制中的每个简单故障机制产生由多边形区域组成的地图来计算,其中第三维z轴上的值表示在点x处的每个单个故障机制的临界缺陷尺寸 ,y。 覆盖这些贴图,并且将每个贴图的每个区域的平面(即,顶面)投影到x,y平面上,以便识别相交的子区域。 基于对预定布尔表达式的答案来识别每个子区域内的主要故障机制,并且累积所有子区域的临界区域以获得复合故障机制的总临界面积。