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    • 54. 发明授权
    • Devices having substrates with opening passing through the substrates and conductors in the openings, and methods of manufacture
    • 具有通过基板的开口的基板和开口中的导体的装置以及制造方法
    • US06717254B2
    • 2004-04-06
    • US09791977
    • 2001-02-22
    • Oleg Siniaguine
    • Oleg Siniaguine
    • H01L2348
    • B81C1/00301B81B2207/097B81C2203/0118H01L21/4853H01L21/486H01L23/481H01L24/48H01L2224/05599H01L2224/45099H01L2224/48091H01L2224/48227H01L2224/48247H01L2224/85399H01L2924/00014H01L2924/01322H01L2924/14H01L2924/16152Y10S438/977H01L2224/45015H01L2924/207H01L2924/00
    • In some embodiments, a fabrication method comprises: forming a structure that has one or more substrates, wherein the one or more substrates are either a single substrate or a plurality of substrates bonded together, wherein the structure comprises a non-electronically-functioning component which includes at least a portion of the one or more substrates and/or is attached to the one or more substrates; wherein the one or more substrates include a first substrate which has: a first side, an opening in the first side, and a conductor in the opening; wherein the method comprises removing material from the structure so that the conductor becomes exposed on a second side of the first substrate. In some embodiments, the second side is a backside of the first substrate, and the exposed conductor provides backside contact pads. In some embodiments, the fabrication method comprises: forming a structure comprising a first substrate which has: a first side, an opening in the first side, and a conductor in the opening; removing material from the structure so that the conductor becomes exposed on a second side of the first substrate; wherein removing of the material comprises removing the material from a first portion of the second side of the first substrate to cause the first portion to be recessed relative to a second portion of the second side of the first substrate.
    • 在一些实施例中,一种制造方法包括:形成具有一个或多个基底的结构,其中所述一个或多个基底是单个基底或多个结合在一起的基底,其中所述结构包括非电子功能组分, 包括所述一个或多个基底的至少一部分和/或附接到所述一个或多个基底; 其中所述一个或多个基板包括第一基板,所述第一基板具有:第一侧,所述第一侧中的开口和所述开口中的导体; 其中所述方法包括从所述结构中去除材料,使得所述导体在所述第一基板的第二侧上露出。 在一些实施例中,第二侧是第一衬底的背面,并且暴露的导体提供背面接触垫。 在一些实施例中,制造方法包括:形成包括第一基板的结构,该第一基板具有:第一侧,第一侧中的开口和开口中的导体; 从所述结构中去除材料,使得所述导体在所述第一基板的第二侧上露出; 其中所述材料的去除包括从所述第一基板的第二侧的第一部分移除所述材料,以使所述第一部分相对于所述第一基板的第二侧的第二部分凹陷。
    • 59. 发明授权
    • Method of preventing motion of article in an article holder
    • 防止物品在物品夹持器中运动的方法
    • US06448188B1
    • 2002-09-10
    • US10020405
    • 2001-12-14
    • Oleg SiniaguineAlex Berger
    • Oleg SiniaguineAlex Berger
    • H01L2131
    • H01L21/68764H01L21/6838H01L21/68771Y10S414/135Y10S414/136Y10T29/41
    • The present invention comprises a dynamic brake that applies restraining frictional force to a wafer in a wafer holder while the wafer holder is substantially at rest, but releases the restraining force as the processing carousel containing several wafer holders rotates about a central axis of the carousel. This dynamic brake preferably comprises a boot that passes through an opening in the wafer holder to rest on the surface of the wafer in an exclusion zone near the wafer's edge. The exclusion zone is typically no more than about 3 mm in extent. The frictional force between the boot and wafer is sufficient to prevent unwanted motion of the wafer in the holder. As the wafer holder rotates about a central axis of the processing carousel, centrifugal forces applied to the brake arising from such rotation cause the boot to pivot upward, releasing the frictional force on the wafer.
    • 本发明包括动力制动器,当晶片保持器基本上处于静止状态时,在晶片保持器中对晶片施加抑制摩擦力,但是随着包含多个晶片保持架的处理转盘绕转盘的中心轴旋转,释放限制力。 该动态制动器优选地包括穿过晶片保持器中的开口的保护罩,以在靠近晶片边缘的排除区域中搁置在晶片的表面上。 排阻区的范围通常不超过约3毫米。 靴子和晶片之间的摩擦力足以防止晶片在保持器中的不期望的运动。 当晶片保持架围绕处理转盘的中心轴线旋转时,由这种旋转引起的对制动器施加的离心力使得护罩向上枢转,释放了晶片上的摩擦力。
    • 60. 发明授权
    • Plasma processing methods and apparatus
    • 等离子体处理方法和装置
    • US06323134B1
    • 2001-11-27
    • US09519281
    • 2000-03-07
    • Oleg Siniaguine
    • Oleg Siniaguine
    • H01L21302
    • H01L21/67017C23C16/4584C23C16/513C23C16/54H01J37/32743H01J37/32788H01J2237/20228H01J2237/31701H01L21/67745H01L21/67796H01L21/68707
    • To move an article in and out of plasma during plasma processing, the article is rotated by a first drive around a first axis, and the first drive is itself rotated by a second drive. As a result, the article enters the plasma at different angles for different positions of the first axis. The plasma cross-section at the level at which the plasma contacts the article is asymmetric so that those points on the article that move at a greater linear velocity (due to being farther from the first axis) move longer distances through the plasma. As a result, the plasma processing time becomes more uniform for different points on the article surface. In some embodiments, two shuttles are provided for loading and unloading the plasma processing system. One of the shuttles stands empty waiting to unload the processed articles from the system, while the other shuttle holds unprocessed articles waiting to load them into the system. After the plasma processing terminates, the empty shuttle unloads processed articles from the system, takes the articles away, and gets unloaded and reloaded with unprocessed articles. Meanwhile, the other shuttle loads unprocessed articles into the system and the plasma processing begins. Since the plasma processing system does not wait for the first shuttle, the productivity of the system is increased.
    • 为了在等离子体处理期间将物品移入和移出等离子体,物品通过围绕第一轴线的第一驱动器旋转,并且第一驱动器本身由第二驱动器旋转。 结果,物品以不同的角度进入等离子体,用于第一轴的不同位置。 等离子体接触制品的等离子体横截面是不对称的,使得以更大的线速度(由于离第一轴越远)移动的制品上的那些点移动通过等离子体的较长距离。 结果,物品表面上的不同点的等离子体处理时间变得更加均匀。 在一些实施例中,提供两个梭子来装载和卸载等离子体处理系统。 其中一个班车空着,等待从系统中卸载已处理的物品,而另一个梭子将未加工物品等待装载到系统中。 等离子处理结束后,空梭从系统中卸载加工物品,取出物品,卸载并重新加载未加工物品。 同时,其他梭子将未处理的物品装入系统并开始等离子体处理。 由于等离子体处理系统不等待第一班车,所以系统的生产率提高。