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    • 56. 发明授权
    • Estimation apparatus, control method thereof, and program
    • 估计装置及其控制方法和程序
    • US08755562B2
    • 2014-06-17
    • US12956037
    • 2010-11-30
    • Miho IshigamiMasakazu MatsuguKatsuhiko MoriYusuke Mitarai
    • Miho IshigamiMasakazu MatsuguKatsuhiko MoriYusuke Mitarai
    • G06K9/00
    • G06K9/00993G06T7/77G06T2207/10028
    • An apparatus includes a capturing unit that captures a target object and generates a range image representing distance information, a general estimation unit that analyzes the range image and estimates a general position and orientation of the target object, and a determination unit that determines a priority order of a plurality of identification units, based on the estimated general position and orientation. In addition, a setting unit sets a search window indicating a range for detailed estimation of position and orientation of the range image based on a preregistered general size of the target object, a calculation unit calculates a difference between a first distance value of a first pixel in the range image and a second distance value of a second pixel which is next to the first pixel in the range image, and an updating unit updates the search window based on the calculated difference. A detailed estimation unit estimates a detailed position and orientation of the target object, using the plurality of identification units in the determined priority order within the range of the search window.
    • 一种装置,包括拍摄目标对象并产生代表距离信息的范围图像的拍摄单元,分析所述距离图像并估计所述目标对象的一般位置和方位的一般估计单元,以及确定所述优先顺序的确定单元 基于所估计的一般位置和方位来确定多个识别单元。 另外,设置单元基于目标对象的预先注册的一般尺寸,设定表示范围图像的位置和姿态的详细估计的范围的搜索窗口,计算单元计算第一像素的第一距离值 在距离图像中的第二像素的第二距离值和距离图像中的第一像素旁边的第二距离值,并且更新单元基于计算出的差异来更新搜索窗口。 详细估计单元使用搜索窗口范围内所确定的优先顺序中的多个识别单元来估计目标对象的详细位置和方位。
    • 59. 发明授权
    • Pattern identification apparatus and method thereof, abnormal pattern detection apparatus and method thereof, and program
    • 模式识别装置及其方法,异常模式检测装置及其方法和程序
    • US08238673B2
    • 2012-08-07
    • US12100664
    • 2008-04-10
    • Yusuke MitaraiMasakazu Matsugu
    • Yusuke MitaraiMasakazu Matsugu
    • G06K9/70
    • G06K9/6252
    • A pattern identification apparatus for identifying one of a plurality of classes defined in advance, to which data of a pattern identification target belongs, comprises a read unit adapted to read out, from a storage unit in correspondence with each of the plurality of classes, a projection rule to a hyperplane which approximates a manifold corresponding to the class in a feature space an input unit adapted to input identification target data; a calculation unit adapted to calculate, for each class, a projection result obtained by projecting the input identification target data to the hyperplane which approximates the manifold corresponding to each of the plurality of classes, on the basis of the projection rule; and an identification unit adapted to identify, on the basis of the projection result of each classes calculated by said calculation unit, one of the plurality of classes to which the identification target data belongs.
    • 一种模式识别装置,用于识别模式识别目标所属的数据预先定义的多个类别中的一个,包括适于从存储单元中读出与多个类别中的每个类别相对应的读取单元 投影规则到近似对应于特征空间中的类别的歧管的超平面,适于输入识别目标数据的输入单元; 计算单元,用于根据所述投影规则,针对每个类计算通过将所述输入的识别目标数据投影到与所述多个类别中的每一个对应的所述歧管的所述超平面上而获得的投影结果; 以及识别单元,其适于基于由所述计算单元计算出的每个类别的投影结果来识别识别目标数据所属的多个类别中的一个。
    • 60. 发明申请
    • MEASUREMENT DEVICE AND MEASUREMENT METHOD
    • 测量装置和测量方法
    • US20120105868A1
    • 2012-05-03
    • US13281883
    • 2011-10-26
    • Osamu NomuraMasakazu Matsugu
    • Osamu NomuraMasakazu Matsugu
    • G01B11/24
    • G01B11/25
    • A measurement device includes a pattern light characteristic setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object, a reflected light measurement unit configured to measure reflected light when the measurement object is irradiated with the illumination light on, an image feature extraction unit configured to extract from the measured reflected light an image feature based on a physical characteristic of the measurement object, a feature distribution calculation unit configured to calculate a distribution characteristic for each local region of the image feature, and a pattern light control unit configured to control the pattern light characteristic of the illumination light, which includes a pattern light characteristic for distance measurement and a pattern light characteristic for image feature extraction, based on the calculated distribution characteristic for each local region.
    • 测量装置包括:图案光特性设定单元,被配置为将具有要投影的图案光特性的照明光设置为被投射到测量对象上;反射光测量单元,被配置为在照射所述照明光的情况下测量所述测量对象时测量反射光; 图像特征提取单元,被配置为基于测量对象的物理特性从所测量的反射光中提取图像特征;特征分布计算单元,被配置为计算图像特征的每个局部区域的分布特性,以及图案光 控制单元,其被配置为基于所计算的每个局部区域的分布特性来控制包括用于距离测量的图案光特性和用于图像特征提取的图案光特性的照明光的图案光特性。