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    • 52. 发明申请
    • TEST APPARATUS, TEST METHOD, AND DEVICE
    • 测试装置,测试方法和设备
    • US20100283480A1
    • 2010-11-11
    • US12767749
    • 2010-04-26
    • Kenichi NAGATANIMasahiro ISHIDA
    • Kenichi NAGATANIMasahiro ISHIDA
    • H01H31/02
    • G01R31/31709
    • Provided is a test apparatus that tests a device under test, wherein the device under test includes an internal circuit that generates a plurality of internal clocks having different phases based on a reference clock provided thereto, selects from among the internal clocks an internal clock having a predetermined relative phase with respect to an input signal having a frequency substantially equal to that of the internal clocks, and samples the input signal according to the selected internal clock. The test apparatus comprises a selection control section that fixes the internal clock selected by the internal circuit; a phase control section that, with the selection of the internal clock being fixed by the selection control section, sequentially shifts the phase of the internal clock by inputting the reference clock to the device under test while sequentially shifting the phase of the reference clock outside of the device under test; and a measuring section that measures a characteristic of at least one of the input signal and the internal circuit, based on the sampling result of the internal circuit.
    • 提供了一种测试被测器件的测试装置,其中被测器件包括内部电路,该内部电路基于提供的参考时钟产生具有不同相位的多个内部时钟,从内部时钟中选择具有 相对于具有与内部时钟的频率基本相等的频率的输入信号的预定相对相位,并且根据所选择的内部时钟对输入信号进行采样。 测试装置包括:选择控制部分,其固定由内部电路选择的内部时钟; 相位控制部,通过选择控制部选择了内部时钟,通过将基准时钟输入到被测设备,依次移位内部时钟的相位,同时依次将基准时钟的相位偏移到 被测设备; 以及基于内部电路的采样结果来测量输入信号和内部电路中的至少一个的特性的测量部。
    • 53. 发明申请
    • TRANSMISSION CHARACTERISTICS MEASUREMENT APPARATUS, TRANSMISSION CHARACTERISTICS MEASUREMENT METHOD, AND ELECTRONIC DEVICE
    • 传输特性测量装置,传输特性测量方法和电子设备
    • US20100244881A1
    • 2010-09-30
    • US12413604
    • 2009-03-30
    • Masahiro ISHIDAKenichi NAGATANI
    • Masahiro ISHIDAKenichi NAGATANI
    • G01R31/26
    • G01R27/28H04L1/244H04L25/022H04L27/01
    • Provided is a transfer characteristic measurement apparatus that measures a transfer characteristic of a circuit under test between input and output, comprising a test signal input section that generates a test signal by adding together a carrier signal having a prescribed frequency and an additional signal having a frequency that differs from the prescribed frequency, and inputs the test signal to the circuit under test; and a transfer characteristic measuring section that measures the transfer characteristic of the circuit under test at the frequency of the additional signal based on a result from a measurement of an output signal output by the circuit under test. The circuit under test may be formed on a semiconductor chip. The circuit under test may correct a signal input to the semiconductor chip, and outputs the corrected signal. The semiconductor chip may further include a sampling circuit that samples the output signal of the circuit under test at the frequency of the carrier signal.
    • 提供了一种传感特性测量装置,其测量输入和输出之间的被测电路的传输特性,包括测试信号输入部分,其通过将具有规定频率的载波信号与具有规定频率的附加信号相加来生成测试信号 与规定频率不同,并将测试信号输入到被测电路; 以及传输特性测量部分,其基于由被测电路输出的输出信号的测量结果,在附加信号的频率下测量被测电路的传输特性。 被测电路可以形成在半导体芯片上。 被测电路可以校正输入到半导体芯片的信号,并输出校正信号。 半导体芯片还可以包括采样电路,其以载波信号的频率对待测电路的输出信号进行采样。
    • 57. 发明申请
    • TEST APPARATUS
    • 测试仪器
    • US20120323519A1
    • 2012-12-20
    • US13524939
    • 2012-06-15
    • Masahiro ISHIDAKiyotaka ICHIYAMA
    • Masahiro ISHIDAKiyotaka ICHIYAMA
    • G06F19/00
    • G01R31/31932G01R31/31725
    • A pattern generator PG generates control data which specifies a threshold voltage to be compared with a signal under test input to an I/O terminal, and generates expected value data which represents an expected value for the comparison result between the signal under test and the threshold voltage. A threshold voltage generator generates the threshold voltage having a voltage level that corresponds to the control data at every setting timing indicated by a first timing signal. A level comparator compares the voltage level of the signal under test with its corresponding threshold voltage. A timing comparator latches the output of the level comparator at a strobe timing indicated by a second timing signal so as to generate a comparison signal. A timing adjustment unit adjusts the phase of the first timing signal.
    • 模式发生器PG产生控制数据,该控制数据指定要与I / O端子的被测信号进行比较的阈值电压,并产生表示被测信号与阈值之间的比较结果的期望值的期望值数据 电压。 阈值电压发生器在由第一定时信号指示的每个设定定时产生具有对应于控制数据的电压电平的阈值电压。 电平比较器将被测信号的电压电平与其相应的阈值电压进行比较。 定时比较器在由第二定时信号指示的选通定时处锁存电平比较器的输出,以产生比较信号。 定时调整单元调整第一定时信号的相位。