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    • 51. 发明申请
    • NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND DATA WRITING METHOD THEREFOR
    • 非易失性半导体存储器件及其数据写入方法
    • US20120201070A1
    • 2012-08-09
    • US13415953
    • 2012-03-09
    • Hiroshi MaejimaKatsuaki IsobeHideo Mukai
    • Hiroshi MaejimaKatsuaki IsobeHideo Mukai
    • G11C11/00
    • G11C13/0007G11C7/00G11C13/0004G11C13/0011G11C13/0064G11C13/0069G11C2013/009G11C2213/31G11C2213/56G11C2213/71G11C2213/72
    • A nonvolatile semiconductor storage device includes first and second intersecting wires; a electrically rewritable memory cell disposed at each intersection of the first second wires, including a variable resistor for memorizing a resistance value as data in a nonvolatile manner and a rectifying device are connected in series; and a control circuit which applies a voltage necessary for writing of data to the first and second wires. The control circuit precharges a non-selected second wire to a standby voltage larger than a reference voltage prior to programming a variable resistor connected to selected first and second wires by supplying the reference voltage to a non-selected first wire and the selected second wire, applying to the selected first wire a program voltage for programming of the selected variable resistor and applying to the non-selected second wire a control voltage which prevents the rectifying device from turning ON.
    • 非易失性半导体存储装置包括第一和第二相交线; 在第一第二导线的交点设置有包含用于将电阻值作为数据非易失性地存储的可变电阻器和整流装置的电可重写存储单元串联连接; 以及控制电路,其向第一和第二导线施加写入数据所需的电压。 在通过将参考电压提供给未选择的第一线和所选择的第二线之前,控制电路将未选择的第二线预充电至大于参考电压的待机电压,然后再对连接到所选择的第一和第二线的可变电阻进行编程, 向所选择的第一线施加用于对所选择的可变电阻器进行编程的编程电压,并向未选择的第二线施加防止整流装置导通的控制电压。
    • 52. 发明授权
    • NAND flash memory
    • NAND闪存
    • US07978517B2
    • 2011-07-12
    • US12719686
    • 2010-03-08
    • Katsuaki Isobe
    • Katsuaki Isobe
    • G11C11/34
    • G11C8/08G11C8/10G11C16/0483
    • A NAND flash memory that is read while a selected bit line and a non-selected bit line are adjacent to each other, has a memory cell array having a plurality of blocks each of which is composed of a plurality of memory cell units, each of the memory cell units having a plurality of electrically rewritable memory cells that are connected to each other, wherein a bit line that is selected by a sense amplifier is charged in a state where a drain-side select gate line, a source-side select gate line and a p-type semiconductor substrate are set at a ground potential, and source lines, n-type wells, p-type wells, and a bit line that is not selected by the sense amplifier are in a floating state.
    • 在选择的位线和非选择的位线彼此相邻时读取的NAND快闪存储器具有存储单元阵列,其具有多个块,每个块由多个存储单元单元组成,每个块由多个存储单元单元组成 所述存储单元单元具有彼此连接的多个电可重写存储单元,其中由读出放大器选择的位线在漏极侧选择栅极线,源极侧选择栅极 线路和p型半导体衬底设置为接地电位,源极线,n型阱,p型阱和未被读出放大器选择的位线处于浮置状态。
    • 55. 发明申请
    • NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    • 非易失性半导体存储器件
    • US20100097832A1
    • 2010-04-22
    • US12580795
    • 2009-10-16
    • Hideo MUKAIHiroshi MaejimaKatsuaki Isobe
    • Hideo MUKAIHiroshi MaejimaKatsuaki Isobe
    • G11C11/00G11C5/02G11C5/06
    • G11C8/14G11C7/18G11C8/12G11C13/0004G11C13/0007G11C13/0011G11C13/0028G11C2213/31G11C2213/72
    • A nonvolatile-semiconductor-memory-device including a cell array having a plurality of MATs (unit-cell-array) disposed in a matrix, the MATs each include a plurality of first lines, a plurality of second lines crossing the first lines, and memory cells being connected between the first and second lines. The device further includes a first and second drive circuit selecting the first and second lines connected to the memory cells of each MAT that are accessed, and driving the selected first and second lines to write or read data. The memory cells form a page by being connected to each first line selected from the MATs. The device also includes a data latch latching the write or the read data in units of pages, where the first and second drive circuit drive the first and second lines multiple times to write or read data for one page in and out of the cell array.
    • 一种非易失性半导体存储器件,包括具有以矩阵形式设置的多个MAT(单位阵列)的单元阵列,所述MAT各包括多条第一线,与第一线交叉的多条第二线,以及 存储单元连接在第一和第二线之间。 该装置还包括第一和第二驱动电路,选择连接到每个MAT的存储器单元的第一和第二线,所述存储器单元被访问,并且驱动所选择的第一和第二行来写入或读取数据。 存储单元通过连接到从MAT中选择的每个第一行形成页面。 该设备还包括以页为单位锁存写入或读取数据的数据锁存器,其中第一和第二驱动电路多次驱动第一和第二行以写入或读取单元阵列中的一页的数据。
    • 56. 发明授权
    • NAND flash memory
    • NAND闪存
    • US07660157B2
    • 2010-02-09
    • US11873859
    • 2007-10-17
    • Hiroshi MaejimaKatsuaki Isobe
    • Hiroshi MaejimaKatsuaki Isobe
    • G11C11/34
    • G11C16/26G11C16/0483
    • A NAND flash memory, including a memory cell array, a row decoder, and a sense amplifier. In a read operation, a p-type semiconductor substrate is set at a ground potential, a bit line is charged to a first voltage, a source line, a n-type well and a p-type well are charged to a second voltage, which lies between a ground potential and a first voltage, and in a block not selected by the row decoder, a drain-side select gate line and the source-side select gate line are charged to a third voltage, which is higher than the ground potential and is equal to or lower than the second voltage.
    • 一种NAND闪存,包括存储单元阵列,行解码器和读出放大器。 在读取操作中,将p型半导体衬底设置为接地电位,将位线充电至第一电压,将源极线,n型阱和p型阱充电至第二电压, 位于接地电位和第一电压之间,并且在未被行解码器选择的块中,漏极侧选择栅极线和源极侧选择栅极线被充电到高于地的第三电压 并且等于或低于第二电压。
    • 57. 发明申请
    • NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND DATA WRITING METHOD THEREFOR
    • 非易失性半导体存储器件及其数据写入方法
    • US20090207647A1
    • 2009-08-20
    • US12370111
    • 2009-02-12
    • Hiroshi MAEJIMAKatsuaki IsobeHideo Mukai
    • Hiroshi MAEJIMAKatsuaki IsobeHideo Mukai
    • G11C11/00G11C7/00G11C11/416
    • G11C13/0007G11C7/00G11C13/0004G11C13/0011G11C13/0064G11C13/0069G11C2013/009G11C2213/31G11C2213/56G11C2213/71G11C2213/72
    • A nonvolatile semiconductor storage device comprises: a first wire and a second wire intersecting each other; a memory cell which is disposed at each intersection of the first wire and the second wire and electrically rewritable and in which a variable resistor for memorizing a resistance value as data in a nonvolatile manner and a rectifying device are connected in series; and a control circuit which applies a voltage necessary for writing of data to the first and second wires. The control circuit precharges a non-selected second wire up to a standby voltage larger than a reference voltage prior to a set operation for programming only a variable resistor connected to selected first and second wires by supplying the reference voltage to a non-selected first wire and the selected second wire, applying a program voltage necessary for programming of the selected variable resistor based on the reference voltage to the selected first wire and applying a control voltage which prevents the rectifying device from turning ON based on the program voltage to the non-selected second wire.
    • 非易失性半导体存储装置包括:第一线和彼此交叉的第二线; 存储单元,其配置在所述第一配线和所述第二配线的各交叉点并且是电可重写的,并且其中存储用作非易失性数据的电阻值的可变电阻器和整流装置串联连接; 以及控制电路,其向第一和第二导线施加写入数据所需的电压。 控制电路在设置操作之前将未选择的第二线预充电到大于参考电压的待机电压,以仅通过将参考电压提供给未选择的第一线来仅编程连接到所选择的第一和第二线的可变电阻器 和所选择的第二线路,基于参考电压将所选择的可变电阻器编程所需的编程电压施加到所选择的第一线路,并施加防止整流装置导通的控制电压, 选择第二根线。