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    • 53. 发明授权
    • Memory system with error detection and correction
    • 具有错误检测和校正的存储器系统
    • US4464755A
    • 1984-08-07
    • US362463
    • 1982-03-26
    • Roger G. StewartAndrew G. F. Dingwall
    • Roger G. StewartAndrew G. F. Dingwall
    • G06F11/10
    • G06F11/1032
    • A memory system comprised of M memory modules where M-1 of the modules are for storing data bits and the Mth modules is for storing system parity bits corresponding to the data bits stored in the other M-1 modules. Each module has R.multidot.C bit locations organized into W internal words of L bits and includes a parity array for storing one parity bit for each internal word, where L is greater than 1, and RC=WL. Each module includes means for reading an internal word and for reading-out a particular subset of the L bits of that internal word. Each module includes means for checking the parity of a selected internal word and for producing a first parity signal indicating whether or not it is correct. The memory system includes means for checking the parity of the selected subsets read out from the M modules and for producing a system parity signal indicating whether the parity of the M subsets is correct. When the first parity signal and the system parity signals indicate the presence of parity errors the subset read out from a module whose first parity signal indicates the presence of a parity error is corrected.
    • 一种由M个存储器模块组成的存储器系统,其中模块的M-1用于存储数据位,并且第M个模块用于存储对应于存储在其它M-1模块中的数据位的系统奇偶校验位。 每个模块具有组织成L位的W个内部字的RxC位位置,并且包括用于存储每个内部字的一个奇偶校验位的奇偶校验位,其中L大于1,并且RC = WL。 每个模块包括用于读取内部字和用于读出该内部字的L位的特定子集的装置。 每个模块包括用于检查所选择的内部字的奇偶性并用于产生指示其是否正确的第一奇偶校验信号的装置。 存储器系统包括用于检查从M个模块读出的所选择的子集的奇偶校验以及用于产生指示M个子集的奇偶校验是否正确的系统奇偶校验信号的装置。 当第一奇偶校验信号和系统奇偶校验信号指示奇偶校验错误的存在时,校正从其第一奇偶校验信号指示存在奇偶校验错误的模块读出的子集。
    • 56. 发明授权
    • Gated parallel decoder
    • 门控并行解码器
    • US4398102A
    • 1983-08-09
    • US232302
    • 1981-02-06
    • Roger G. Stewart
    • Roger G. Stewart
    • G11C11/413G11C11/41H03K19/017H03K19/0948H03K19/096G11C8/00H03K19/094
    • H03K19/01742H03K19/01721H03K19/0948H03K19/0963
    • The decoder includes a plurality of input signal responsive transistors having their conduction paths connected in parallel between a node and a point of reference potential. These transistors, when turned-on, tend to clamp the node to the reference potential. A controllable load is connected between a second voltage and the node for, when enabled and in the absence of an inhibit signal, providing a conduction path charging the node towards the second voltage. An inhibit network responsive to the node voltage inhibits conduction via the charging conduction path of the load when the node voltage is at, or close to, the second voltage. An external control signal applied to the controllable load can enable it in the absence of the inhibit signal.
    • 解码器包括多个输入信号响应晶体管,其导通路径并联连接在节点和参考点之间。 这些晶体管在导通时倾向于将节点钳位到参考电位。 可控负载连接在第二电压和节点之间,用于当使能并且在没有禁止信号时,提供将节点充电到第二电压的导电路径。 当节点电压处于或接近第二电压时,响应于节点电压的禁止网络经由负载的充电传导路径禁止传导。 施加到可控负载的外部控制信号可以在没有禁止信号的情况下使其能够使能。
    • 58. 发明申请
    • Low Cost Testing and Sorting for Integrated Circuits
    • 集成电路的低成本测试和排序
    • US20110122718A1
    • 2011-05-26
    • US12328675
    • 2008-12-04
    • Roger G. Stewart
    • Roger G. Stewart
    • G11C29/38H01L21/66
    • G11C29/006G11C29/38G11C2029/4002
    • Methods of testing and sorting integrated circuits in clusters are disclosed. Each cluster has power and data terminals connected to common power and data busses providing a common power supply. Each integrated circuit has a first non-volatile memory storing an activation code and a second programmable non-volatile memory that is capable of storing the activation code. If an integrated circuit passes testing, the activation code stored in the first non-volatile memory is written into the second non-volatile memory. An integrated circuit is independently functional upon separation from the cluster if the codes in the first and second non-volatile memories match. Upon separation, integrated circuits are queried to determine which respond. Each integrated circuit includes logic adapted to determine whether the codes in the first and second non-volatile memories match. If the codes do not match, the logic permanently disables the integrated circuit upon separation from the cluster.
    • 公开了集群中集成电路的测试和分类方法。 每个集群的电源和数据终端连接到公共电源和数据总线,提供公共电源。 每个集成电路具有存储激活码的第一非易失性存储器和能够存储激活码的第二可编程非易失性存储器。 如果集成电路通过测试,则将存储在第一非易失性存储器中的激活码写入第二非易失性存储器。 如果第一和第二非易失性存储器中的代码匹配,则与集群分离时,集成电路是独立的。 分离后,查询集成电路以确定哪些响应。 每个集成电路包括适于确定第一和第二非易失性存储器中的代码是否匹配的逻辑。 如果代码不匹配,则与集群分离时,逻辑将永久禁用集成电路。
    • 59. 发明申请
    • INTEGRATED CIRCUITS WITH PERSISTENT DATA STORAGE
    • 具有持续数据存储的集成电路
    • US20080197981A1
    • 2008-08-21
    • US12111140
    • 2008-04-28
    • Roger G. StewartJohn Rolin
    • Roger G. StewartJohn Rolin
    • H04B1/713
    • G06K19/0723G06K7/10019G06K19/07381
    • The circuitry introduced in this invention selectively slows down the functioning of an electronic circuit maintaining a particular state for a prolonged period of time. This circuitry is used not only to achieve the desired effect in maintaining security from electronic thieves trying to circumvent codes but also in other applications such as enabling a circuit to continue to function in the event of a brief loss of power. For example, in an RFID system, if a reader is frequency hopping, a tag loses power for as long as about 400 milliseconds when the reader changes to other frequencies. In a preferred embodiment, the disclosed circuitry is used in conjunction with a destruct sequence.
    • 在本发明中引入的电路选择性地减慢保持特定状态长时间的电子电路的功能。 该电路不仅用于在维护电子窃贼试图绕过代码的安全性方面实现期望的效果,而且在其他应用中,例如使电路在短暂的功率损失的情况下继续工作。 例如,在RFID系统中,如果读取器跳频,当读取器改变到其他频率时,标签失去长达约400毫秒的功率。 在优选实施例中,所公开的电路与破坏序列结合使用。