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    • 42. 发明授权
    • Non-volatile memory device
    • 非易失性存储器件
    • US08124968B2
    • 2012-02-28
    • US12366151
    • 2009-02-05
    • June-mo KooSuk-pil KimTae-Eung Yoon
    • June-mo KooSuk-pil KimTae-Eung Yoon
    • H01L29/08
    • H01L27/1021H01L27/101H01L27/2409H01L27/249H01L45/04H01L45/06H01L45/1226H01L45/144H01L45/146
    • Provided are a non-volatile memory device which can be extended in a stack structure and thus can be highly integrated, and a method of manufacturing the non-volatile memory device. The non-volatile memory device includes: at least one first electrode, at least one second electrode crossing the at least one first electrode, at least one data storing layer interposed between the at least one first electrode and the second electrode, at a region in which the at least one first electrode crosses the at least one second electrode and at least one metal silicide layer interposed between the at least one first electrode and the at least one second electrode, at the region in which the at least one first electrode crosses the at least one second electrode.
    • 提供了可以以堆叠结构进行扩展并因此可以高度集成的非易失性存储器件,以及制造非易失性存储器件的方法。 所述非易失性存储器件包括:至少一个第一电极,至少一个第二电极,与所述至少一个第一电极交叉,至少一个数据存储层插入在所述至少一个第一电极和所述第二电极之间的区域中 所述至少一个第一电极与所述至少一个第二电极交叉,并且所述至少一个金属硅化物层插入在所述至少一个第一电极和所述至少一个第二电极之间,所述至少一个第一电极在所述至少一个第一电极与 至少一个第二电极。