会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 45. 发明授权
    • Contactless system for detecting microdefects on electrostatographic
members
    • 用于检测静电元件上的微缺陷的非接触式系统
    • US06008653A
    • 1999-12-28
    • US960673
    • 1997-10-30
    • Zoran D. PopovicSteven I. DejakSatchidanand Mishra
    • Zoran D. PopovicSteven I. DejakSatchidanand Mishra
    • G01R29/12G01N27/24G01N27/60G01Q30/04G01Q30/12G03G21/00
    • G01N27/24B82Y35/00
    • A contactless process for detecting surface potential charge patterns in an electrophotographic imaging member including at least one photoconductive imaging layer having an imaging surface, providing a scanner including a capacitive probe having an outer shield electrode, maintaining the probe adjacent to and spaced from the imaging surface to form a parallel plate capacitor with a gas between the probe and the imaging surface, providing a probe amplifier optically coupled to the probe, establishing relative movement between the probe and the imaging surface, maintaining a substantially constant distance between the probe and the imaging surface, applying a constant voltage charge to the imaging surface prior to relative movement of the probe and the imaging surface past each other, synchronously biasing the probe to within about .+-.300 volts of the average surface potential of the imaging surface, measuring variations in surface potential with the probe, compensating the surface potential variations for variations in distance between the probe and the imaging surface, and comparing the compensated voltage values to a baseline voltage value to detect charge patterns in the electrophotographic imaging member. This process may be conducted with a contactless scanning system comprising a high resolution capacitive probe, a low spatial resolution electrostatic voltmeter coupled to a bias voltage amplifier, and an imaging member having an imaging surface capacitively coupled to and spaced from the probe and the voltmeter, the probe comprising an inner electrode surrounded by and insulated from a coaxial outer Faraday shield electrode, the inner electrode connected to an optocoupled amplifier, and the Faraday shield connected to the bias voltage amplifier.
    • 一种用于检测电子照相成像构件中的表面电荷电荷图案的非接触式方法,包括具有成像表面的至少一个光电导成像层,提供包括具有外部屏蔽电极的电容式探针的扫描器,将探针保持在邻近和与成像表面隔开的位置 以在探针和成像表面之间形成具有气体的平行平板电容器,提供光学耦合到探针的探针放大器,建立探头与成像表面之间的相对运动,保持探头与成像表面之间基本恒定的距离 在探针和成像表面相对移动彼此相对移动之前,将恒定电压电荷施加到成像表面,同步地将探针偏置在成像表面的平均表面电位的约+/- 300伏之内,测量成像表面的变化 表面电位与探头,补偿表面纸 探头和成像表面之间的距离变化的微小变化,以及将补偿的电压值与基线电压值进行比较,以检测电子照相成像构件中的电荷模式。 该过程可以使用包括高分辨率电容式探针,耦合到偏置电压放大器的低空间分辨率静电电压计和具有电容耦合到探针和电压计的成像表面的成像表面的非接触式扫描系统进行, 该探针包括被同轴的外部法拉第屏蔽电极包围并绝缘的内部电极,连接到光耦合放大器的内部电极和连接到偏置电压放大器的法拉第屏蔽。
    • 46. 发明授权
    • Method of treating preformed flexible imaging belts to form ripple-free
and dimensionally precise belts
    • 处理预成型柔性成像带以形成无波纹和尺寸精确的带的方法
    • US5885512A
    • 1999-03-23
    • US941914
    • 1997-10-01
    • Robert C. U. YuDonald C. VonHoeneAnthony M. HorganRichard L. PostSatchidanand MishraEdward F. GrabowskiBing R. Hsieh
    • Robert C. U. YuDonald C. VonHoeneAnthony M. HorganRichard L. PostSatchidanand MishraEdward F. GrabowskiBing R. Hsieh
    • G03G5/10B29C31/00B29C63/20B29C71/02B29C55/24B29C61/02
    • B29C71/02B29C31/002B29C63/20B29C2071/022B29L2009/00B29L2009/008B29L2031/709B29L2031/764
    • A method of treating a preformed flexible imaging belt including providing a rigid cylindrical support drum having a precisely predetermined outer circumference, a first end and a second end, providing a preformed flexible electrostatographic imaging belt, circumferentially expanding the belt with a flowing fluid under pressure until the circumference of the inner surface of the belt adjacent the first end of the drum is stretched to a new dimension of at least about 0.1 percent greater than the outer circumference of the rigid support drum while maintaining the belt below the elastic limit of the belt to smooth out physical defects, sliding the belt onto the drum from the first end toward the second end until substantially all of the belt encircles the outer surface of the drum, terminating the flow of the flowing fluid to allow the belt to contract onto the outer surface of the support drum, heating the belt to a treatment temperature of between about the glass transition temperature and about 10.degree. C. above the glass transition temperature of the substrate or the imaging layer, the treatment temperature being the higher of these two glass transition temperatures, until the belt relaxes onto the outer circumference of the rigid drum and is substantially free of any tendency to contract back to the original circumference of the inner exposed surface prior to circumferentially expanding the belt, cooling the belt to ambient room temperature, and removing the belt from the drum, the belt having a new inner circumference substantially identical to the precisely predetermined outer circumference of the rigid cylindrical support drum.
    • 一种处理预成型的柔性成像带的方法,包括提供具有精确预定的外周的刚性圆柱形支撑滚筒,第一端和第二端,提供预成型的柔性静电成像带,在压力下使流体流体周向地膨胀带直到 与滚筒的第一端相邻的带的内表面的圆周被拉伸到比刚性支撑滚筒的外圆周大至少约0.1%的新尺寸,同时将带保持在带的弹性极限以下 平滑物理缺陷,将带从第一端向第二端滑动到鼓上,直到基本上所有的带环绕滚筒的外表面,终止流动流体的流动,以使带收缩到外表面 的支撑鼓,将带加热到约玻璃化转变温度之间的处理温度 并且高于基底或成像层的玻璃化转变温度约10℃,处理温度高于这两个玻璃化转变温度,直到带松弛到刚性滚筒的外圆周上并且基本上没有任何 在带周向膨胀之前收缩到内部暴露表面的原始圆周的趋势,将带冷却到环境室温,并且将带从滚筒中移除,带具有与精确预定外部基本相同的新内周 刚性圆柱形支撑滚筒的周长。
    • 47. 发明授权
    • Differential increase in dark decay comparison
    • 黑暗衰变比较差异增大
    • US5697024A
    • 1997-12-09
    • US586472
    • 1996-01-11
    • Satchidanand Mishra
    • Satchidanand Mishra
    • G01N21/88G01N21/93G03G15/00G03G15/02G03G21/00
    • G03G15/75
    • A process for ascertaining the microdefect levels of an electrophotographic imaging member including establishing for a first electrophotographic imaging member, having a known differential increase in dark decay value and a measured crest value, a first reference datum for dark decay crest value at an initial applied field; establishing with the crest value a second reference datum for dark decay crest value at a final applied field; determining the differential increase in dark decay between the first reference datum and the second reference datum for the first electrophotographic imaging member; repeatedly subjecting a virgin electrophotographic imaging member, having a measured crest value, to aforesaid cycles until the amount of dark decay reaches the crest value for the virgin electrophotographic imaging which remains substantially constant; establishing with virgin electrophotographic imaging member, having a measured crest value, a third reference datum for dark decay crest value; establishing for the virgin electrophotographic imaging member a fourth reference datum for dark decay crest value; determining the differential increase in dark decay between the third reference datum and the fourth reference datum to establish a differential increase in dark decay value for the virgin electrophotographic imaging member; and comparing the differential increase in dark decay value of the virgin electrophotographic imaging member with the known differential increase in dark decay value.
    • 一种用于确定电子照相成像构件的微缺陷水平的方法,包括建立用于第一电子照相成像构件的,具有已知的暗衰变值的差分增加和测量的峰值,用于初始施加场的暗衰变峰值的第一参考数据 ; 在顶点值建立最终施加场的暗衰变峰值的第二参考基准; 确定第一电摄影成像构件的第一参考基准和第二参考基准之间的暗衰减的差异增加; 将具有测量峰值的原始电子照相成像构件反复进行上述循环,直到暗衰减量达到保持基本恒定的原始电子照相成像的波峰值; 建立具有测量峰值的处理电子照相成像构件,用于暗衰变峰值的第三参考基准; 为原始电子照相成像构件建立暗衰变峰值的第四参考基准; 确定第三参考基准和第四参考基准之间的暗衰减的差异增加,以建立原始电子照相成像构件的暗衰减值的差异增加; 并将原始电子照相成像构件的暗衰减值的差异增加与暗衰变值的已知差分增加进行比较。
    • 50. 发明授权
    • Motionless scanner
    • US5132627A
    • 1992-07-21
    • US636045
    • 1990-12-28
    • Zoran D. PopovicDamodar M. PaiMerlin E. ScharfeSatchidanand MishraEdward A. Domm
    • Zoran D. PopovicDamodar M. PaiMerlin E. ScharfeSatchidanand MishraEdward A. Domm
    • G01R29/00G01R29/12G03G5/00G03G15/00G03G21/00
    • G03G15/75
    • A process is disclosed for ascertaining electrical discharge properties of an electrophotographic imaging member including the steps of (a) providing at least one electrophotographic imaging member comprising an electrically conductive layer and at least one photoconductive layer, (b) contacting the surface of the electrophotographic imaging member with a substantially transparent electrode and applying an electric potential or an electric current to form an electric field across the photoconductive layer, (c) terminating the applying of the electric potential or the electric current, (d) exposing the photoconductive layer to activating radiation to discharge the electrophotographic imaging member, (e) repeating steps (b), (c) and (d), and (f) measuring the potential across the photoconductive layer during steps (b), (c) and (d) as a function of time by means of an electrostatic meter coupled to the electrode. Also, disclosed is apparatus for ascertaining electrical discharge properties of an electrophotographic imaging member including (a) means to support an electrophotographic imaging member comprising an electrically conductive layer and at least one photoconductive layer, (b) means for applying an electric potential or electric current to a substantially transparent electrode on the electrophotographic imaging member to form an electric field across the photoconductive layer, (c) means for terminating the applying of the electric potential or the electric current, (d) an electrostatic voltmeter probe coupled to the means for applying an electric current to the electrode, (e) means for exposing the photoconductive layer through the substantially transparent electrode to activating radiation to discharge the electrophotographic imaging member to a predetermined level, and (f) means for exposing the photoconductive layer to activating radiation to fully discharge the electrophotographic imaging member.