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41. 发明授权

US06901564B2 System and method for product yield prediction 失效
标题翻译：产品产量预测的系统和方法
公开(公告)号：US06901564B2
公开(公告)日：2005-05-31
申请号：US10200045
申请日：2002-07-18
申请人： Brian E. Stine , Christopher Hess , John Kibarian , Kimon Michaels , Joseph C. Davis , Purnendu K. Mozumder , Sherry F. Lee , Larg H. Weiland , Dennis J. Ciplickas , David M. Stashower
发明人： Brian E. Stine , Christopher Hess , John Kibarian , Kimon Michaels , Joseph C. Davis , Purnendu K. Mozumder , Sherry F. Lee , Larg H. Weiland , Dennis J. Ciplickas , David M. Stashower
IPC分类号： H01L21/00 , G01R31/26 , G05B15/02 , H01L21/02 , H01L21/66 , H01L23/544 , G06F17/50 , G06F19/00
CPC分类号： G06F17/5081 , G05B15/02 , H01L22/20 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： A yield for an integrated circuit is predicted by processing a wafer to have a portion fabricated with at least one layout attribute of the integrated circuit. The portion of the wafer is analyzed to determine an actual yield associated with the at least one layout attribute. A systematic yield associated with the at least one layout attribute is determined based on the actual yield and a predicted yield associated with the at least one layout attribute. The predicted yield assumes that random defects are the only yield loss mechanism. A yield of an actual or proprosed product layout is predicted for the integrated circuit based on the systematic yield.
摘要翻译：通过处理晶片以使具有集成电路的至少一个布局属性制造的部分来预测集成电路的产量。分析晶片的部分以确定与至少一个布局属性相关联的实际屈服。基于实际产量和与至少一个布局属性相关联的预测收益来确定与所述至少一个布局属性相关联的系统收益。预测产量假设随机缺陷是唯一的产量损失机制。基于系统产量预测集成电路的实际或推动产品布局的产量。

42. 发明申请

US20050070889A1 Endoscopic mucosal resection device with conductive tissue stop 有权
标题翻译：内窥镜粘膜切除装置与导电组织停止
公开(公告)号：US20050070889A1
公开(公告)日：2005-03-31
申请号：US10673953
申请日：2003-09-29
申请人： Rudolph Nobis , Michael Clem , Christopher Hess
发明人： Rudolph Nobis , Michael Clem , Christopher Hess
IPC分类号： A61B10/02 , A61B1/00 , A61B17/22 , A61B17/30 , A61B17/32 , A61B17/34 , A61B18/12 , A61B18/14 , A61B19/00 , A61B18/18
CPC分类号： A61B17/3478 , A61B17/320016 , A61B17/320783 , A61B18/14 , A61B90/37 , A61B2017/306 , A61B2017/32004 , A61B2018/00291 , A61B2018/00494 , A61B2018/144 , A61B2090/033
摘要： A medical apparatus and method useful for resecting tissue from the gastrointestinal tract are disclosed. The apparatus can include an RF tissue cutting device disposed inward of a side opening in the device. A tissue stop can be used to control the depth of tissue resected, and the tissue stop can include holes for communicating vacuum for drawing tissue into the side opening. The tissue stop can be electrically grounded with respect to the RF tissue cutting device, and the tissue stop can provide one pole of an RF electrical circuit.
摘要翻译：公开了一种用于从胃肠道切除组织的医疗装置和方法。该装置可以包括设置在装置中的侧开口内侧的RF组织切割装置。可以使用组织切割器来控制切除的组织的深度，并且组织停止件可以包括用于传递用于将组织拉入侧开口的真空的孔。组织止挡件可以相对于RF组织切割装置电接地，并且组织停止件可以提供RF电路的一极。

43. 发明申请

US20050070764A1 Handle for endoscopic device 有权
标题翻译：内窥镜装置处理
公开(公告)号：US20050070764A1
公开(公告)日：2005-03-31
申请号：US10674186
申请日：2003-09-29
申请人： Rudolph Nobis , Christopher Hess
发明人： Rudolph Nobis , Christopher Hess
IPC分类号： A61B17/02 , A61B1/00 , A61B1/005 , A61B10/00 , A61B10/02 , A61B10/06 , A61B17/221 , A61B17/28 , A61B17/32 , A61B18/14 , A61B17/00
CPC分类号： A61B17/2909 , A61B1/0052 , A61B1/0057 , A61B10/0233 , A61B10/06 , A61B2017/2905 , A61B2017/2911 , A61B2017/2913 , A61B2017/2923
摘要： An endoscopic accessory medical device is provided. The device can include a handle, a flexible shaft, and an end effector. The handle can include an actuator for operating the end effector through a wire or cable pulling member that extends through the flexible shaft. The handle and actuator can be operable with a single hand, such that the operation of the end effector can be accomplished with the same hand that is used to hold the handle and advance the end effector through an endoscope. The handle can include an actuation mechanism that is decoupled from operation of the end effector when the actuator is in a first open position, which becomes operatively coupled to the end effector when the actuator is moved to a second position, such as by squeezing the actuator, and which operates the end effector when the actuator is moved further to a third position.
摘要翻译：提供内窥镜附件医疗装置。该装置可以包括手柄，柔性轴和端部执行器。手柄可以包括致动器，用于通过延伸穿过柔性轴的电线或电缆牵引构件来操作端部执行器。手柄和致动器可以用单手操作，使得端部执行器的操作可以用用于保持手柄并使端部执行器通过内窥镜前进的相同的手来实现。手柄可以包括致动机构，当致动器处于第一打开位置时，致动机构与端部执行器的操作分离，当致动器移动到第二位置时，该致动机构可操作地联接到端部执行器，例如通过挤压致动器，并且当致动器进一步移动到第三位置时，其操作端部执行器。

44. 发明申请

US20050070763A1 Endoscopic mucosal resection device with overtube and method of use 有权
标题翻译：内窥镜粘膜切除装置及外套管及其使用方法
公开(公告)号：US20050070763A1
公开(公告)日：2005-03-31
申请号：US10673928
申请日：2003-09-29
申请人： Rudolph Nobis , Michael Clem , Christopher Hess
发明人： Rudolph Nobis , Michael Clem , Christopher Hess
IPC分类号： A61B10/02 , A61B1/00 , A61B17/00 , A61B17/22 , A61B17/30 , A61B17/32 , A61B17/34 , A61B18/12 , A61B18/14 , A61B19/00 , A61B1/012
CPC分类号： A61B17/320016 , A61B17/320783 , A61B17/3478 , A61B18/16 , A61B90/37 , A61B2017/00269 , A61B2017/00296 , A61B2017/306 , A61B2018/00291 , A61B2018/1407 , A61B2018/144 , A61B2018/1495 , A61B2090/034
摘要： A medical apparatus and method useful for resecting tissue from the gastrointestinal tract are disclosed. The apparatus can include an RF tissue cutting device disposed inward of a side opening in the device. A tissue stop can be used to control the depth of tissue resected, and the tissue stop can include holes for communicating vacuum for drawing tissue into the side opening. The tissue stop can be electrically grounded with respect to the RF tissue cutting device, and the tissue stop can provide one pole of an RF electrical circuit.
摘要翻译：公开了一种用于从胃肠道切除组织的医疗装置和方法。该装置可以包括设置在装置中的侧开口内侧的RF组织切割装置。可以使用组织切割器来控制切除的组织的深度，并且组织停止件可以包括用于传递用于将组织拉入侧开口的真空的孔。组织止挡件可以相对于RF组织切割装置电接地，并且组织停止件可以提供RF电路的一极。

45. 发明授权

US06787800B2 Test vehicle with zig-zag structures 有权
标题翻译：测试具有锯齿形结构的车辆
公开(公告)号：US06787800B2
公开(公告)日：2004-09-07
申请号：US10202278
申请日：2002-07-24
申请人： Larg H. Weiland , Christopher Hess
发明人： Larg H. Weiland , Christopher Hess
IPC分类号： H01L2910
CPC分类号： G01R1/073
摘要： A test vehicle has a plurality of the zig-zag structures which include: a first layer having a plurality of first elongated patterns oriented in a first direction; a second layer having a plurality of second elongated patterns oriented in a second direction substantially perpendicular to the first direction; and a plurality of vias or contacts conductively coupling ones of the first patterns to respective ones of the second patterns.
摘要翻译：测试车辆具有多个之字形结构，其包括：具有沿第一方向定向的多个第一细长图案的第一层; 第二层，具有在基本上垂直于第一方向的第二方向上定向的多个第二细长图案; 以及多个通孔或触点将第一图案之一导电地耦合到相应的第二图案。

46. 发明授权

US08178876B2 Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturing 有权
标题翻译：用于连接用于监控集成电路制造的测试结构或线阵列的方法和配置
公开(公告)号：US08178876B2
公开(公告)日：2012-05-15
申请号：US10595384
申请日：2004-04-30
申请人： Christopher Hess , David Goldman
发明人： Christopher Hess , David Goldman
IPC分类号： H01L23/58
CPC分类号： H01L22/34 , G01R31/2884 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： A test chip comprises at least one level having an array of regions. Each region is capable of including at least one test structure. At least some of the regions include respective test structures. The level has a plurality of driver lines that provide input signals to the test structures. The level has a plurality of receiver lines that receive output signals from the test structures. The level has a plurality of devices for controlling current flow. Each test structure is connected to at least one of the driver lines with a first one of the devices in between. Each test structure is connected to at least one of the receiver lines with a second one of the devices in between, so that each of the test structures can be individually addressed for testing using the driver lines and receiver lines.
摘要翻译：测试芯片包括具有区域阵列的至少一个级别。每个区域能够包括至少一个测试结构。至少一些区域包括相应的测试结构。电平具有多个驱动线，其向测试结构提供输入信号。电平具有接收来自测试结构的输出信号的多个接收线。该电平具有用于控制电流的多个装置。每个测试结构都与至少一个驱动器线连接，其中的第一个设备之间。每个测试结构与至少一个接收器线路连接，其间具有第二个设备，使得每个测试结构可以被单独寻址，以便使用驱动器线路和接收器线路进行测试。

47. 发明申请

US20090037131A1 METHOD AND CONFIGURATION FOR CONNECTING TEST STRUCTURES OR LINE ARRAYS FOR MONITORING INTEGRATED CIRCUIT MANUFACTURING 有权
标题翻译：用于连接测试结构或线阵列用于监控集成电路制造的方法和配置
公开(公告)号：US20090037131A1
公开(公告)日：2009-02-05
申请号：US10595384
申请日：2004-04-30
申请人： Christopher Hess , David Goldman
发明人： Christopher Hess , David Goldman
IPC分类号： G06F19/00
CPC分类号： H01L22/34 , G01R31/2884 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： A test chip comprises at least one level having an array of regions. Each region is capable of including at least one test structure. At least some of the regions include respective test structures. The level has a plurality of driver lines that provide input signals to the test structures. The level has a plurality of receiver lines that receive output signals from the test structures. The level has a plurality of devices for controlling current flow. Each test structure is connected to at least one of the driver lines with a first one of the devices in between. Each test structure is connected to at least one of the receiver lines with a second one of the devices in between, so that each of the test structures can be individually addressed for testing using the driver lines and receiver lines.
摘要翻译：测试芯片包括具有区域阵列的至少一个级别。每个区域能够包括至少一个测试结构。至少一些区域包括相应的测试结构。电平具有多个驱动线，其向测试结构提供输入信号。电平具有接收来自测试结构的输出信号的多个接收线。该电平具有用于控制电流的多个装置。每个测试结构都与至少一个驱动器线连接，其中的第一个设备之间。每个测试结构与至少一个接收器线路连接，其间具有第二个设备，使得每个测试结构可以被单独寻址，以便使用驱动器线路和接收器线路进行测试。

48. 发明申请

US20070136235A1 Methods and apparatus to determine a software application data file and usage 有权
标题翻译：确定软件应用程序数据文件和用法的方法和设备
公开(公告)号：US20070136235A1
公开(公告)日：2007-06-14
申请号：US11304527
申请日：2005-12-14
申请人： Christopher Hess
发明人： Christopher Hess
IPC分类号： G06F17/30
CPC分类号： G06F17/30997 , Y10S707/99936 , Y10S707/99945 , Y10S707/99948
摘要： Systems and methods are provided to monitor usage of software applications and services. According to some embodiments, it may be determined that an application event has occurred. At least a portion of a file name may be accessed and compared to one or more actual file identifiers. An actual file identifier may then be selected based on the comparison.
摘要翻译：提供系统和方法来监控软件应用程序和服务的使用情况。根据一些实施例，可以确定已经发生了应用事件。文件名的至少一部分可以被访问并与一个或多个实际文件标识符进行比较。然后可以基于比较来选择实际的文件标识符。

49. 发明申请

US20070075718A1 Layout for DUT arrays used in semiconductor wafer testing 失效
标题翻译：用于半导体晶圆测试的DUT阵列布局
公开(公告)号：US20070075718A1
公开(公告)日：2007-04-05
申请号：US11243016
申请日：2005-10-03
申请人： Christopher Hess , Angelo Rossoni , Stefano Tonello , Michele Squicciarini , Michele Quarantelli
发明人： Christopher Hess , Angelo Rossoni , Stefano Tonello , Michele Squicciarini , Michele Quarantelli
IPC分类号： G01R31/26
CPC分类号： H01L22/34 , G01R31/2884 , H01L2924/0002 , H01L2924/00
摘要： A layout for devices under test formed on a semiconductor wafer for use in wafer testing includes a first array of devices under test and a first pad set formed adjacent to the first array. The first pad set includes a gate force pad, a source pad, and a drain pad. Each of the devices under test in the first array is connected to the gate pad of the first pad set. Each of the devices under test in the first array is connected to the source pad of the first pad set. Each of the devices under test in the first array is connected to the drain pad of the first pad set.
摘要翻译：在用于晶片测试的半导体晶片上形成的被测器件的布局包括被测试器件的第一阵列和与第一阵列相邻形成的第一焊盘组。第一焊盘组包括栅极力焊盘，源极焊盘和漏极焊盘。第一阵列中被测试的每个器件连接到第一焊盘组的栅极焊盘。第一阵列中被测试的每个设备连接到第一焊盘组的源焊盘。第一阵列中被测试的每个器件连接到第一焊盘组的漏极焊盘。

50. 发明申请

US20060105475A1 Fast localization of electrical failures on an integrated circuit system and method 有权
公开(公告)号：US20060105475A1
公开(公告)日：2006-05-18
申请号：US10538538
申请日：2003-12-11
申请人： Dennis Ciplickas , Christopher Hess , Sherry Lee , Larg Weiland
发明人： Dennis Ciplickas , Christopher Hess , Sherry Lee , Larg Weiland
IPC分类号： H01L21/66 , G01R31/26
CPC分类号： H01L22/20 , G01R31/2884 , G01R31/2894 , G01R31/307 , H01L22/34 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： Fast localization of electrically measured defects of integrated circuits includes providing information for fabricating a test chip having test structures configured for parallel electrical testing. The test structures on the test chip are electrically tested employing a parallel electrical tester. The results of the electrical testing are analyzed to localize defects on the test chip.

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